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Bernard Legrand

18

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"didier-theron"

	Multi-MHz micro-electro-mechanical sensors for atomic force microscopy Bernard Legrand , Jean-Paul Salvetat , Benjamin Walter , Marc Faucher , Didier Theron Ultramicroscopy, 2017, 175, pp.46 - 57. ⟨10.1016/j.ultramic.2017.01.005⟩ Article dans une revue hal-01765180v1
	Quantitative impedance characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope Fei Wang , Nicolas Clément , Damien Ducatteau , David Troadec , Hassan Tanbakuchi Nanotechnology, 2014, 25 (40), pp.405703. ⟨10.1088/0957-4484/25/40/405704⟩ Article dans une revue hal-01960609v1
	Detecting response of microelectromechanical resonators by microwave reflectometry Bernard Legrand , D. Ducatteau , D. Theron , B. Walter , H. Tanbakuchi Applied Physics Letters, 2013, 103, pp.053124-1-5. ⟨10.1063/1.4817411⟩ Article dans une revue hal-00871931v1
	An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements Thomas Dargent , Kamel Haddadi , T. Lasri , N. Clément , D. Ducatteau Review of Scientific Instruments, 2013, 84 (12), pp.123705. ⟨10.1063/1.4848995⟩ Article dans une revue hal-00922585v1

	Optomechanics: a key towards next-generation experiments in atomic force microscopy? Lucien Schwab , Pierre Allain , Didier Theron , Marc Faucher , Benjamin Walter International Conference on Quantum Metrology and Sensing, Dec 2019, Paris, France Communication dans un congrès hal-02407634v1
	[Invited] SMM characterization of Au nanodots and FcC11SH molecules Didier Theron , Fei Wang , Thomas Dargent , Damien Ducatteau , Charlene Brillard XX Annual Linz Winter Workshop, Advances in Single-Molecule Research for Biology & Nanoscience, Feb 2018, Linz, Austria Communication dans un congrès hal-01962187v1
	[Invited] MEMS-based atomic force microscopy probes: from electromechanical to optomechanical vibrating sensors Bernard Legrand , Lucien Schwab , Pierre Allain , Ivan Favero , Marc Faucher AVS 65th International Symposium & Exhibition, American Vacuum Society, Oct 2018, Long Beach, United States Communication dans un congrès hal-01908666v1
	When capacitive transduction meets the thermomechanical limit: Towards femto-newton force sensors at very high frequency S. Houmadi , Bernard Legrand , J.P. Salvetat , B. Walter , E. Mairiaux 28th IEEE Conference on Micro Electro Mechanical Systems, MEMS 2015, Jan 2015, Estoril, Portugal. ⟨10.1109/MEMSYS.2015.7050908⟩ Communication dans un congrès hal-01962374v1
	Sub-10 nm-scale capacitors and tunnel junctions measurements by SMM coupled to RF interferometry F. Wang , Thomas Dargent , D. Ducatteau , Gilles Dambrine , Kamel Haddadi 45th European Microwave Conference EuMC 2015, Sep 2015, Paris, France. ⟨10.1109/EuMC.2015.7345849⟩ Communication dans un congrès hal-01962399v1
	Caractérisation quantitative des capacités sous échelle de 10 nm avec un interférométrique scanning-microwave-microscopy Fei Wang , Nicolas Clément , Damien Ducatteau , David Troadec , Bernard Legrand 17èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2014, 2014, Villeneuve d'Ascq, France. 3 p Communication dans un congrès hal-01018379v1
	Near-field microscopy: Is there an alternative to micro and nano resonating cantilevers? Lionel Buchaillot , Estelle Mairiaux , Benjamin Walter , Zhuang Xiong , Marc Faucher IEEE International Frequency Control Symposium, May 2014, Taipei, Taiwan. ⟨10.1109/FCS.2014.6859928⟩ Communication dans un congrès hal-01962163v1
	Characterization of sub-10nm-scale capacitors and tunnel junctions by SMM coupled to RF interferometry Fei Wang , Damien Ducatteau , David Troadec , Hassan Tanbakuchi , Bernard Legrand European Conference on Electrical Measurements at the Nanoscale Using AFM, Jun 2014, Cambridge, United Kingdom Communication dans un congrès hal-01962209v1
	Interferometric scanning microwave microscope for nanotechnology application N. Clement , Thomas Dargent , H. Tanbakuchi , K. Nishiguchi , R. Sivakumarasamy American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States Communication dans un congrès hal-00811777v1
	Microwave reflectometry : a high-resolution technique for measuring vibration of capacitive microresonators Bernard Legrand , D. Ducatteau , D. Theron , B. Walter , H. Tanbakuchi 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2013, 2013, Barcelona, Spain. paper M3P.140, 566-569, Outstanding poster presentation award nomination, ⟨10.1109/Transducers.2013.6626829⟩ Communication dans un congrès hal-00877759v1
	Nanoscale capacitors study with an interferometric scanning microwave microscope Fei Wang , Nicolas Clément , David Troadec , Bernard Legrand , Gilles Dambrine Materials Research Society Fall Meeting, MRS Fall 2013, Symposium LL : Advances in Scanning Probe Microscopy, 2013, Boston, MA, United States Communication dans un congrès hal-00944017v1
	SOL-like calibrated RF measurements at the nanoscale on a modified scanning microwave microscope Thomas Dargent , D. Ducatteau , Bernard Legrand , H. Tanbakuchi , D. Theron 2nd Nano Measure Scientific Symposium, Nano Measure 2012, 2012, Stanford, CA, United States Communication dans un congrès hal-00797722v1
	[Invité] Micro et nanorésonateurs électromécaniques radio-fréquences. Principes et applications Marc Faucher , Bernard Legrand , Benjamin Walter , Emmanuelle Algre , A. Ben-Amar TELECOM'2011 & 7èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, 2011, Tanger, Maroc. CDROM, papier 554, 1-6 Communication dans un congrès hal-00806730v1

	Système pour détecter des réponses d'un dispositif résonateur micro-électromécanique (MEMS) H. Tanbakuchi , Bernard Legrand , D. Theron , D. Ducatteau N° de brevet: FR2985251 (A1). 2013 Brevet hal-00846338v1