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Quantitative impedance characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscopeNanotechnology, 2014, 25 (40), pp.405703. ⟨10.1088/0957-4484/25/40/405704⟩
Article dans une revue
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[Invited] SMM characterization of Au nanodots and FcC11SH moleculesXX Annual Linz Winter Workshop, Advances in Single-Molecule Research for Biology & Nanoscience, Feb 2018, Linz, Austria
Communication dans un congrès
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Sub-10 nm-scale capacitors and tunnel junctions measurements by SMM coupled to RF interferometry45th European Microwave Conference EuMC 2015, Sep 2015, Paris, France. ⟨10.1109/EuMC.2015.7345849⟩
Communication dans un congrès
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Caractérisation quantitative des capacités sous échelle de 10 nm avec un interférométrique scanning-microwave-microscopy17èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2014, 2014, Villeneuve d'Ascq, France. 3 p
Communication dans un congrès
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Characterization of sub-10nm-scale capacitors and tunnel junctions by SMM coupled to RF interferometryEuropean Conference on Electrical Measurements at the Nanoscale Using AFM, Jun 2014, Cambridge, United Kingdom
Communication dans un congrès
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Nanoscale capacitors study with an interferometric scanning microwave microscopeMaterials Research Society Fall Meeting, MRS Fall 2013, Symposium LL : Advances in Scanning Probe Microscopy, 2013, Boston, MA, United States
Communication dans un congrès
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Interferometric scanning microwave microscope for nanotechnology applicationAmerican Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States
Communication dans un congrès
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