Serge Bernard
21
Documents
Présentation
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
--------------
-
**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
--------------
-
**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
Publications
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LH-BIST for Digital Correction of ADC OffsetDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Communication dans un congrès
lirmm-00375659v1
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Fast and Fully-Efficient Test Flow for ADCsIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Communication dans un congrès
lirmm-00106523v1
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On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static ErrorsLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Communication dans un congrès
lirmm-00269498v1
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A New Methodology for ADC Test Flow OptimizationITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩
Communication dans un congrès
lirmm-00269527v1
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Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCsIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Communication dans un congrès
lirmm-00269583v1
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An Automatic Tool for Generation of ADC BIST ArchitectureIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Communication dans un congrès
lirmm-00269580v1
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Automatic Generation of LH-BIST Architecture for ADC TestingIWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Communication dans un congrès
lirmm-00269683v1
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A high accuracy triangle-wave signal generator for on-chip ADC testingETW 2002 - 7th IEEE European Test Workshop, May 2002, Corfu, Greece. pp.89-94, ⟨10.1109/ETW.2002.1029644⟩
Communication dans un congrès
lirmm-00268483v1
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Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse SpectraleColloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Communication dans un congrès
lirmm-00269325v1
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Evaluation of ADC Static Parameters via Frequency DomainIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Communication dans un congrès
lirmm-00269347v1
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Estimating Static Parameters of A-to-D Converters from Spectral AnalysisLATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Communication dans un congrès
lirmm-00269320v1
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On the Evaluation of ADC Static Parameters Through Dynamic TestingADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Communication dans un congrès
lirmm-00269338v1
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Test de Circuits et de Systèmes IntégrésCollection EGEM, Ed.Hermès, 2004, 2-7462-0864-4
Ouvrages
lirmm-00109158v1
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On-Chip Generator of a Saw-Tooth Test Stimulus for ADC BISTSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.425-436, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_36⟩
Chapitre d'ouvrage
lirmm-00268477v1
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Advanced Solutions for Innovative SOC Testing in Europe2002
Autre publication scientifique
lirmm-00268586v1
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Mixed-Signal BISR2002
Autre publication scientifique
lirmm-00268607v1
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