Serge Bernard
39
Documents
Présentation
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
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**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
**RESEARCH**
============
Analog and Mixed-Signal Testing
===============================
- Design-for-Testability (DfT),
- 'Built-In-Self-Test (BIST),
- Analog-to-Digital Converter Testing,
- System-in-Package (SiP) Testing.
- Built-in-Self Repair (BISR)
Integrated Circuit Design for Medical Applications
==================================================
- Neural Stimulator for Functional Electrical Stimulation (FES),
- Physiological Signal Recording (ElectroNeuroGram: ENG).
- Medical devices development in the field of ophtalmology and vision based equipments.
Dependability
=============
- Dependability at system level
- Dependability for Analog and mixed signal circuits
Professional Status
===================
- 2014-... : Head of the micorlectronic department - LIRMM
- 2010-2014 : Deputy Head of the micorlectronic department - LIRMM
- 2006-… : Head & Scientific Co-director of [ISyTest](http://www.lirmm.fr/isytest): Institute for System Testing (joint institute [LIRMM](http://www.lirmm.fr/)/[NXP](http://www.nxp.com/))
- 2001-... : CNRS Researcher in the Microelectronics department of LIRMM.
Education
=========
- 2010 – HDR “Habilitation à Diriger les Recherches”. in Microelectronics, University of Montpellier, France.
- 2001 - Ph.D. in Microelectronics, University of Montpellier, France.
- 1999 - Master in Microelectronics, University of Montpellier, France.
- 1998 - “Agrégation de Génie Electrique” high-level competitive examination for recruiting teachers
- 1997 - M.S. in Electrical Engineering, University of Paris VI(Orsay), France.
-
**ACTIVITIES**
--------------
-
**General chair**
-----------------
- Design of Circuits and Integrated System (DCIS’2012), à Avignon.
**Program chair**
-----------------
- IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (DTIS’11), Athènes, Grèce, 4-7 avril 2011.
**Organization of Special sessions**
------------------------------------
- “biomedical circuits and systems”, basée sur des papiers invités, à IEEE International Symposium of Electronic Design, Test & Applications, (DELTA’10), Ho Chi Minh City, Vietnam, 13-15 janvier 2010.
**Local Chair**
---------------
- IEEE International Workshop on Silicon Debug and Diagnosis, (SDD’04) Ajaccio, France, 26-27 mai 2004.
**Organization commitee**
-------------------------
- IEEE International Mixed-Signal, Sensor and System Test Workshop (IMS3TW’10), La Grande Motte, France, juin 2010,
- IEEE European Test Symposium (ETS’04), Ajaccio, France, 23-26 mai 2004,
- IEEE International Workshop on Silicon Debug and Diagnosis (SDD’04) Ajaccio, France, 26-27 mai 2004,
- International Conference on Field Programmable Logic and Application (FPL’02), Montpellier (La Grande-Motte), France 2-4 septembre 2002,
- IFIP International Conference on Very Large Scale Integration The Global System on Chip Design & CAD Conference (VLSI-SOC’01), Montpellier, France, 3-5 décembre 2001,
- IEEE International Mixed-Signal Test Workshop (IMSTW’00), Montpellier (La Grande- Motte), France, 15-17 juin 2000.
-
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LH-BIST for Digital Correction of ADC OffsetDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Communication dans un congrès
lirmm-00375659v1
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Low-Noise Averaging Amplifier Dedicated to ENG Recording with Hexagonal Cuff ElectrodeNEWCAS-TAISA 2008 - 2008 Joint 6th International IEEE Northeast Workshop on Circuits and Systems and TAISA Conference, Jun 2008, Montreal, Quebec, Canada. pp.161-164, ⟨10.1109/NEWCAS.2008.4606346⟩
Communication dans un congrès
lirmm-00336369v1
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European Network for Test EducationDELTA'02: 1st International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.230-239
Communication dans un congrès
lirmm-00268490v1
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Considerations on Improving the Design of Cuff Electrode for ENG Recording - Geometrical Approach, Dedicated IC, Sensitivity and Noise RejectionBIODEVICES: Biomedical Electronics and Devices, Jan 2008, Funchal, Madeira, Portugal. pp.180-185
Communication dans un congrès
lirmm-00334769v1
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Low-Noise ASIC and New Layout of Multipolar Electrode for Both High ENG Selectivity and Parasitic Signal RejectionICECS'07: International Conference on Electronics, Circuits and Systems, Dec 2007, Marrakech, Morocco, Morocco. pp.A4L-A
Communication dans un congrès
lirmm-00195231v1
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A New Configuration of Multipolar Cuff Electrode and Dedicated IC for Afferent Signal Recording3rd International IEEE/EMBS Conference on Neural Engineering, Hawai, United States. pp.578-581
Communication dans un congrès
lirmm-00195236v1
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A Cuff Electrode Dedicated to ENG Recording with Multipolar Configuration for Both Efficient Sensitivity and High Rejection of EMG Parasitic Signals9th Vienna International Workshop on Functional Electrical Stimulation, Oct 2007, Krems, Austria, pp.78-81
Communication dans un congrès
lirmm-00176528v1
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Fast and Fully-Efficient Test Flow for ADCsIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Communication dans un congrès
lirmm-00106523v1
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Electrical Performances of a New Multipolar Micro-StimulatorIFESS: International Functional Electrical Stimulation Society, Jul 2005, Montréal, Canada. pp.232-234
Communication dans un congrès
lirmm-00106475v1
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Test Digital, Test de Mémoires, Test Mixte : 5 Centres de Compétence pour la Formation en EuropeCNFM'04 : 8ème Journées Pédagogiques du Comité National de Formation en Microélectronique, 2004, Saint Malo, France. p. 242
Communication dans un congrès
lirmm-00108671v1
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An Implantable Asic for Neural StimulationBiomedical Circuits and Systems, Dec 2004, Singapore, pp.S1.7.INV-5-8
Communication dans un congrès
lirmm-00108827v1
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New Implantable Stimulator for the FES of Paralyzed MusclesESSCIRC: European Solid-State Circuits Conference, Sep 2004, Leuven, Belgium. pp.455-458, ⟨10.1109/ESSCIR.2004.1356716⟩
Communication dans un congrès
lirmm-00108820v1
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An Automatic Tool for Generation of ADC BIST ArchitectureIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Communication dans un congrès
lirmm-00269580v1
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Automatic Generation of LH-BIST Architecture for ADC TestingIWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Communication dans un congrès
lirmm-00269683v1
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High Voltage Circuit Design for Medical ApplicationSETS: South European Test Seminar, Feb 2003, Pitztal, Austria
Communication dans un congrès
lirmm-00269713v1
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On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static ErrorsLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Communication dans un congrès
lirmm-00269498v1
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Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCsIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Communication dans un congrès
lirmm-00269583v1
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A New Methodology for ADC Test Flow OptimizationITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩
Communication dans un congrès
lirmm-00269527v1
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A high accuracy triangle-wave signal generator for on-chip ADC testingETW 2002 - 7th IEEE European Test Workshop, May 2002, Corfu, Greece. pp.89-94, ⟨10.1109/ETW.2002.1029644⟩
Communication dans un congrès
lirmm-00268483v1
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On the Evaluation of ADC Static Parameters Through Dynamic TestingADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Communication dans un congrès
lirmm-00269338v1
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A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students32nd Annual Frontiers in Education (FIE), Nov 2002, Boston, MA, United States. pp.T2E-24, ⟨10.1109/FIE.2002.1157943⟩
Communication dans un congrès
lirmm-00269423v1
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Estimating Static Parameters of A-to-D Converters from Spectral AnalysisLATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Communication dans un congrès
lirmm-00269320v1
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Evaluation of ADC Static Parameters via Frequency DomainIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Communication dans un congrès
lirmm-00269347v1
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Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse SpectraleColloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Communication dans un congrès
lirmm-00269325v1
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EuNICE-Test Project: A remote Access to Engineering Test for European UniversitiesEWME: European Workshop on Microelectronics Education, 2002, Vigo, Spain. pp.133-136
Communication dans un congrès
lirmm-00268489v1
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Test de Circuits et de Systèmes IntégrésCollection EGEM, Ed.Hermès, 2004, 2-7462-0864-4
Ouvrages
lirmm-00109158v1
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Multipolar Electrode and Preamplifier Design for ENG-Signal AcquisitionAna Fred; Joaquim Filipe; Hugo Gamboa. Biomedical Engineering Systems and Technologies, 25, Springer, pp.148-159, 2008, Communications in Computer and Information Science, 978-3-540-92218-6. ⟨10.1007/978-3-540-92219-3_11⟩
Chapitre d'ouvrage
lirmm-00345755v1
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On-Chip Generator of a Saw-Tooth Test Stimulus for ADC BISTSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.425-436, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_36⟩
Chapitre d'ouvrage
lirmm-00268477v1
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Device for Distributing Power between Cathodes of a Multipolar Electrode, in Particular of an ImplantFrance, Patent n° : WO2006027473 A1. 2006, pp.1-70
Brevet
lirmm-00389558v1
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Dispositif de répartition de courant entre des cathodes d'une électrode multipolaire, notamment d'un implantFrance, N° de brevet: N°04 09351. 2004
Brevet
lirmm-00108588v1
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Advanced Solutions for Innovative SOC Testing in Europe2002
Autre publication scientifique
lirmm-00268586v1
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Project Management and Trainer Education Deliverable: Management Report, Attendees and Training Contents, Training Evaluation2002
Autre publication scientifique
lirmm-00268593v1
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Mixed-Signal BISR2002
Autre publication scientifique
lirmm-00268607v1
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