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Philippe Maurine

13

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Identifiants chercheurs

philippe-maurine
Google Scholar : https://scholar.google.fr/citations?hl=fr&user=VduRIsgAAAAJ&view_op=list_works&sortby=pubdate
IdRef : 144880717
0000-0002-9706-5710
Google Scholar : https://scholar.google.fr/citations?user=VduRIsgAAAAJ&hl=fr

Présentation

Publications

jean-max-dutertre

	Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-Injection Raphael Andreoni Camponogara-Viera , Philippe Maurine , Jean-Max Dutertre , Rodrigo Possamai Bastos IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020, 39 (6), pp.1231-1244. ⟨10.1109/TCAD.2019.2928972⟩ Article dans une revue hal-02299068v1
	Method for evaluation of transient-fault detection techniques Raphael Viera , Rodrigo Possamai Bastos , Jean-Max Dutertre , Philippe Maurine , Rodrigo Iga Jadue Microelectronics Reliability, 2017, 76-77, pp.68-74. ⟨10.1016/j.microrel.2017.07.007⟩ Article dans une revue lirmm-01690185v1

	Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits Raphael Andreoni Camponogara-Viera , Jean-Max Dutertre , Philippe Maurine , Rodrigo Possamai Bastos ISPD 2018 - International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167, ⟨10.1145/3177540.3178243⟩ Communication dans un congrès lirmm-01743368v1
	Method for evaluation of transient-fault detection techniques Raphael Andreoni Camponogara-Viera , Rodrigo Possamai Bastos , Jean-Max Dutertre , Philippe Maurine ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France Communication dans un congrès hal-01721081v1
	Importance of IR Drops on the Modeling of Laser-Induced Transient Faults Raphael Viera , Philippe Maurine , Jean-Max Dutertre , Rodrigo Possamai Bastos SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jun 2017, Giardini Naxos, Italy. ⟨10.1109/SMACD.2017.7981593⟩ Communication dans un congrès hal-01721087v1
	Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation Raphael Andreoni Camponogara-Viera , Jean-Max Dutertre , Rodrigo Possamai Bastos , Philippe Maurine DSD 2017 - Euromicro Symposium on Digital System Design, Aug 2017, Vienna, Austria. pp.252-259, ⟨10.1109/DSD.2017.43⟩ Communication dans un congrès lirmm-01699776v1
	Body Biasing Injection Attacks in Practice Noemie Beringuier-Boher , Marc Lacruche , David El-Baze , Jean-Max Dutertre , Jean-Baptiste Rigaud CS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54, ⟨10.1145/2858930.2858940⟩ Communication dans un congrès lirmm-01434143v1
	Evidence of a larger EM-induced fault model Sébastien Ordas , Ludovic Guillaume-Sage , Karim Tobich , Jean-Max Dutertre , Philippe Maurine CARDIS: Smart Card Research and Advanced Applications, Nov 2014, Paris, France. pp.245-259, ⟨10.1007/978-3-319-16763-3_15⟩ Communication dans un congrès emse-01099037v1
	ElectroMagnetic Analysis and Fault Injection onto Secure Circuits Paolo Maistri , Régis Leveugle , Lilian Bossuet , Alain Aubert , Viktor Fischer VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Mexico, Mexico. ⟨10.1109/VLSI-SoC.2014.7004182⟩ Communication dans un congrès emse-01099025v1
	Efficiency of a glitch detector against electromagnetic fault injection Loic Zussa , Amine Dehbaoui , Karim Tobich , Jean-Max Dutertre , Philippe Maurine DATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE.2014.216⟩ Communication dans un congrès lirmm-01096047v1
	On the use of the EM medium as a fault injection means Philippe Maurine , Amine Dehbaoui , François Poucheret , Jean-Max Dutertre , Bruno Robisson CryptArchi: Cryptographic Architectures, Jun 2012, St-Etienne, France Communication dans un congrès emse-00742707v1
	Countermeasures against EM Analysis Paolo Maistri , Sébastien Tiran , Amine Dehbaoui , Philippe Maurine , Jean-Max Dutertre 10th CryptArchi Workshop - St-Etienne Goutelas 2012, Jun 2012, Saint-Etienne, France Communication dans un congrès emse-01130646v1

	Injection of transient faults using electromagnetic pulses Practical results on a cryptographic system Amine Dehbaoui , Jean-Max Dutertre , Bruno Robisson , P. Orsatelli , Philippe Maurine ACR Cryptology ePrint Archive (2012), 2012 Autre publication scientifique emse-00742850v1