CV Accueil - Archive ouverte HAL

	A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits Arnaud Virazel , Imran Wali , Bastien Deveautour , Alberto Bosio , Patrick Girard Journal of Electronic Testing: : Theory and Applications, 2017, 33 (1), pp.25-36. ⟨10.1007/s10836-017-5640-6⟩ Article dans une revue lirmm-01718568v1
	A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing Cores Imran Wali , Arnaud Virazel , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch Journal of Electronic Testing: : Theory and Applications, 2016, 32 (2), pp.147-161. ⟨10.1007/s10836-016-5578-0⟩ Article dans une revue lirmm-01354746v1

	A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits Imran Wali , Bastien Deveautour , Arnaud Virazel , Alberto Bosio , Patrick Girard ETS: European Test Symposium, May 2016, Amsterdam, Netherlands. ⟨10.1109/ETS.2016.7519296⟩ Communication dans un congrès hal-01444734v1
	Design space exploration and optimization of a Hybrid Fault-Tolerant Architecture Imran Wali , Arnaud Virazel , Alberto Bosio , Patrick Girard , Matteo Sonza Reorda IOLTS: International On-Line Testing Symposium, Jul 2015, Halkidiki, Greece. pp.89-94, ⟨10.1109/IOLTS.2015.7229838⟩ Communication dans un congrès lirmm-01272735v1

Patrick Girard