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Noelle Gogneau
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Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating SemiconductorsJournal of Physical Chemistry C, 2021, 125 (31), pp.17078-17087. ⟨10.1021/acs.jpcc.1c04778⟩
Article dans une revue
hal-03448318v1
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Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe TomographyJournal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩
Article dans une revue
hal-01928844v1
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Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological ProblemMicroscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩
Article dans une revue
hal-01954232v1
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