Nikolay Cherkashin

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martin-hytch

"largeau-l"

	Nanoscale concentration and strain distribution in pseudomorphic films Si1−xGex/Si processed by pulsed laser induced epitaxy L. Vincent , F. Fossard , T. Kociniewski , L. Largeau , Nikolay Cherkashin Applied Surface Science, 2012, 258 (23), pp.9208-9212. ⟨10.1016/j.apsusc.2011.07.074⟩ Article dans une revue hal-01736031v1