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Nikolay Cherkashin

10

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Identifiants chercheurs

nikolay-cherkashin
0000-0002-0322-0864
IdRef : 183426924

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florent-houdellier

	Dynamical effects in strain measurements by dark-field electron holography Elsa Javon , Axel Lubk , Robin Cours , Shay Reboh , Nikolay Cherkashin Ultramicroscopy, 2014, 147, pp.70-85. ⟨10.1016/j.ultramic.2014.06.005⟩ Article dans une revue hal-01721158v1
	Strain mapping in layers and devices by electron holography Martin Hÿtch , Nikolay Cherkashin , Shay Reboh , Florent Houdellier , Alain Claverie physica status solidi (a), 2011, 208 (3), pp.580-583. ⟨10.1002/pssa.201000281⟩ Article dans une revue hal-01736038v1
	On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates Nikolay Cherkashin , Martin Hÿtch , Florent Houdellier , Florian Hüe , Vincent Paillard Applied Physics Letters, 2009, 94 (14), pp.141910. ⟨10.1063/1.3116648⟩ Article dans une revue hal-00417300v1
	End of range defects in Ge S. Koffel , Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Gérard Benassayag Journal of Applied Physics, 2009, 105, pp.126110. ⟨10.1063/1.3153985⟩ Article dans une revue hal-01736054v1

	Time-Resolved Cathodoluminescence in a Transmission Electron Microscope Sophie Meuret , Nikolay Cherkashin , L. H. G. Tizei , Yves Auad , Sébastien J. Weber 11th International Conference on Metamaterials, Photonic Crystals and Plasmonics (META 2021), Jul 2021, Warsaw, Poland Communication dans un congrès hal-04449931v1
	Measurement of crystalline lattice strain by transmission electron microscopy” Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Maxim Korytov 14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France Communication dans un congrès hal-01763051v1
	Strain Mapping of Layers and Devices Using Electron Holography Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩ Communication dans un congrès hal-01736051v1
	Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate Nikolay Cherkashin , Adrien Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch ECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩ Communication dans un congrès hal-01736065v1
	Determination of strain within Si1-yCy layers grown by CVD on a Si substrate Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩ Communication dans un congrès hal-01736057v1

	Dark-Field Electron Holography for Strain Mapping Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩ Chapitre d'ouvrage hal-01736026v1