michel renovell

Documents

Identifiants chercheurs

Présentation

jean-marc-galliere

sandrine-bernardini

	Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror S. Bernardini , P. Masson , Jean-Michel Portal , Jean-Marc J.-M. Galliere , Michel Renovell LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17 Communication dans un congrès lirmm-00108659v1