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    111

    Publications of Michel Renovell


    Florence Azaïs   

    Journal articles28 documents

    • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell. Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. Journal of Electronic Testing, Springer Verlag, 2019, 35 (1), pp.59-75. ⟨10.1007/s10836-019-05776-1⟩. ⟨lirmm-02075690⟩
    • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies. Journal of Electronic Testing, Springer Verlag, 2017, 33 (4), pp.515-527. ⟨10.1007/s10836-017-5674-9⟩. ⟨hal-01709587⟩
    • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology. IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2017, 16 (3), pp.417-430. ⟨10.1109/TNANO.2017.2664895⟩. ⟨hal-01709588⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102. ⟨10.1016/j.mejo.2015.09.014⟩. ⟨lirmm-01232890⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect Measurements. Microelectronics Journal, Elsevier, 2014, 45 (3), pp.336-344. ⟨10.1016/j.mejo.2013.12.006⟩. ⟨lirmm-00936443⟩
    • Jean-Marc Galliere, Florence Azaïs, Mariane Comte, Michel Renovell. Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm. Information Technology, Oldenbourg Verlag, 2014, 56 (4), pp.173-181. ⟨10.1515/itit-2013-1040⟩. ⟨hal-01167054⟩
    • Vincent Kerzérho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, et al.. A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectronics Journal, Elsevier, 2013, 44 (9), pp.840-843. ⟨10.1016/j.mejo.2013.06.009⟩. ⟨lirmm-00875985⟩
    • Vincent Kerzérho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, et al.. Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. Journal of Electronic Testing, Springer Verlag, 2011, 27 (3), pp.335-350. ⟨10.1007/s10836-011-5194-y⟩. ⟨lirmm-00609243⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design, Hindawi Publishing Corporation, 2008, 2008 (Article ID 482159), pp.8. ⟨10.1155/2008/482159⟩. ⟨lirmm-00346722⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. Fully Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC. IET Computers & Digital Techniques, Institution of Engineering and Technology, 2007, 1 (3), pp.146-153. ⟨lirmm-00195172⟩
    • Serge Bernard, Vincent Kerzérho, Philippe Cauvet, Florence Azaïs, Mariane Comte, et al.. A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP. IEEE Design & Test, IEEE, 2006, 23 (3), pp.237-243. ⟨lirmm-00115131⟩
    • Antonio Andrade, Gustavo Vieira, Tiago Balen, Marcelo Lubaszewski, Florence Azaïs, et al.. Built-In Self-Test of Global Interconnects of Field Programmable Analog Arrays. Microelectronics Journal, Elsevier, 2005, 36 (12), pp.1112-1123. ⟨lirmm-00367974⟩
    • Jean-Marc Galliere, Michel Renovell, Florence Azaïs, Yves Bertrand. Delay Testing Viability of Gate Oxide Short Defect. Journal of Computer Science and Technology, Iberoamerican Science & Technology Education Consortium, 2005, 20 (2), pp.195-200. ⟨10.1007/s11390-005-0195-x⟩. ⟨lirmm-00105323⟩
    • Jean-Marc Galliere, Michel Renovell, Florence Azaïs, Yves Bertrand. Viability of a Delay Testing of Gate Oxide Short Transistors. Journal of Computer Science and Technology, Iberoamerican Science & Technology Education Consortium, 2005, 20 (2), pp.6. ⟨lirmm-00370370⟩
    • Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell. Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. Journal of Electronic Testing, Springer Verlag, 2005, 21 (2), pp.135-146. ⟨10.1007/s10836-005-6143-4⟩. ⟨lirmm-00105334⟩
    • Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell. A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. Journal of Electronic Testing, Springer Verlag, 2005, 21 (1), pp.9-16. ⟨lirmm-00105328⟩
    • Florence Azaïs, Serge Bernard, Mariane Comte, Yves Bertrand, Michel Renovell. Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. Journal of Electronic Testing, Springer Verlag, 2005, 21 (3), pp.291-298. ⟨lirmm-00105322⟩
    • Rachid Bouchakour, Jean-Michel Portal, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand, et al.. A Compact DC Model of Gate Oxide Short Defect. Microelectronic Engineering, Elsevier, 2004, 72 (1-4), pp.140-148. ⟨10.1016/j.mee.2003.12.051⟩. ⟨lirmm-00108564⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. Journal of Electronic Testing, Springer Verlag, 2004, 20 (4), pp.375-387. ⟨lirmm-00108545⟩
    • Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. Journal of Electronic Testing, Springer Verlag, 2004, Vol. 20 n°3, pp. 257-267. ⟨hal-00004514⟩
    • Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test, IEEE, 2003, 20 (1), pp.60-67. ⟨lirmm-00269822⟩
    • Uroš Kač, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell. Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test. IEEE Design & Test, IEEE, 2003, 20 (2), pp.32-39. ⟨10.1109/MDT.2003.1188260⟩. ⟨lirmm-00269600⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. A-to-D Converter Static Error Detection from Dynamic Parameter Measurements. Microelectronics Journal, Elsevier, 2003, 34 (10), pp. 945-953. ⟨lirmm-00269601⟩
    • Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp. 469-479. ⟨lirmm-00269602⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp. 377-386. ⟨lirmm-00269754⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp.10. ⟨lirmm-00370365⟩
    • Michel Renovell, Florence Azaïs, Yves Bertrand. Improving Defect Detection in Static-Voltage Testing. IEEE Design & Test, IEEE, 2002, 17 (6), pp.83-89. ⟨lirmm-00268605⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Analog Built-In Saw-Tooth Generator for ADC Histogram Test. Microelectronics Journal, Elsevier, 2002, 33 (10), pp.781-789. ⟨lirmm-00268587⟩

    Conference papers70 documents

    • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell. Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. LATS: Latin-American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩. ⟨lirmm-02064921⟩
    • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell, et al.. Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩. ⟨hal-01709614⟩
    • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell, et al.. Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩. ⟨hal-01709615⟩
    • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩. ⟨lirmm-01374292⟩
    • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩. ⟨lirmm-01374300⟩
    • Vincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, et al.. Toward adaptation of ADCs to operating conditions through on-chip correction. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩. ⟨lirmm-01233117⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A framework for efficient implementation of analog/RF alternate test with model redundancy. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩. ⟨lirmm-01233104⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A generic methodology for building efficient prediction models in the context of alternate testing. IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩. ⟨lirmm-01233150⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩. ⟨lirmm-01119361⟩
    • Mouhamadou Dieng, Florence Azaïs, Mariane Comte, Serge Bernard, Vincent Kerzérho, et al.. Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩. ⟨lirmm-01119365⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Syhem Larguech, et al.. Investigations on alternate analog/RF test with model redundancy. STEM Workshop, May 2014, Paderborn, Germany. ⟨lirmm-01119374⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩. ⟨lirmm-00994714⟩
    • Vincent Kerzérho, Florence Azaïs, Mouhamadou Dieng, Mariane Comte, Serge Bernard, et al.. Self-Adaptive NFC Systems. IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. ⟨lirmm-01084355⟩
    • Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, et al.. Solutions for the self-adaptation of communicating systems in operation. IOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩. ⟨hal-01118068⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing. 3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States. ⟨lirmm-00985422⟩
    • Jie Jiang, Marina Aparicio Rodriguez, Mariane Comte, Florence Azaïs, Michel Renovell, et al.. MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.177-182, ⟨10.1109/ATS.2013.41⟩. ⟨lirmm-00932357⟩
    • Marina Aparicio Rodriguez, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, et al.. Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced Delays. LATW: Latin American Test Workshop, Apr 2013, Cordoba, Argentina. ⟨10.1109/LATW.2013.6562657⟩. ⟨lirmm-00820067⟩
    • Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzérho, Florence Azaïs, et al.. Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications. NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩. ⟨lirmm-00839190⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. On the use of redundancy to reduce prediction error in alternate analog/RF test. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩. ⟨lirmm-00803556⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Making predictive analog/RF alternate test strategy independent of training set size. ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩. ⟨lirmm-00803564⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, et al.. Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩. ⟨lirmm-00803453⟩
    • Marina Aparicio Rodriguez, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell, et al.. An IR-Drop Simulation Principle Oriented to Delay Testing. DCIS'12: 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409. ⟨lirmm-00804254⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Vincent Kerzérho, et al.. Adaptive LUT-Based System for In Situ ADC Auto-correction. IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494424⟩
    • Vincent Kerzérho, Florence Azaïs, Mariane Comte, Philippe Cauvet, Serge Bernard, et al.. ANC-Based Method for Testing Converters with Random-Phase Harmonics. IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494578⟩
    • Florence Azaïs, Yves Bertrand, Michel Renovell. Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367718⟩
    • Florence Azaïs, Yves Bertrand, Michel Renovell. An Analysis of the Timing Behavior of CMOS Digital Blocks under Simultaneous Switching Noise Conditions. DDECS'09: IEEE Design and Diagnostics of Electronic Circuits and Systems, Apr 2009, Liberec, Czech Republic. pp.158-163. ⟨lirmm-00386906⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. LH-BIST for Digital Correction of ADC Offset. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203. ⟨lirmm-00375659⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation. ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750. ⟨lirmm-00448863⟩
    • Jean-Marc Galliere, Florence Azaïs, Michel Renovell, Luigi Dilillo. Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229. ⟨lirmm-00370798⟩
    • Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell. On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise. LATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16. ⟨lirmm-00260194⟩
    • Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell. On the Detection of SSN-Induced Logic Errors Through On-Chip Monitoring. IOLTS: International On-Line Testing Symposium, Jul 2008, Rhodes, Greece. pp.233-238, ⟨10.1109/IOLTS.2008.19⟩. ⟨lirmm-00294767⟩
    • Florence Azaïs, Laurent Larguier, Michel Renovell. Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching Noise. LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru. ⟨lirmm-00199261⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators. IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201. ⟨lirmm-00161708⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩. ⟨lirmm-00158527⟩
    • Florence Azaïs, Laurent Larguier, Michel Renovell. Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits. ATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.239-244. ⟨lirmm-00179262⟩
    • Serge Bernard, Florence Azaïs, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC. IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88. ⟨lirmm-00119266⟩
    • Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. “Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164. ⟨lirmm-00115676⟩
    • Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, et al.. Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS: VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.389-400, ⟨10.1109/VTS.2005.85⟩. ⟨lirmm-00105998⟩
    • Antonio Zenteno, Víctor Champac, Michel Renovell, Florence Azaïs. Analysis and Attenuation Proposal in Ground Bounce: II. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.34-39. ⟨lirmm-00106514⟩
    • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Fast and Fully-Efficient Test Flow for ADCs. IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249. ⟨lirmm-00106523⟩
    • Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell. Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC: International Test Conference, Oct 2004, Charlotte, United States. pp.893-902. ⟨lirmm-00108897⟩
    • Antonio Andrade Jr, Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, et al.. Testing Global Interconnects of Field Programmable Analog Arrays . IMSTW'04: 10th International Mixed-Signal Testing Workshop, Jun 2004, Portland, Oregon, United States. ⟨lirmm-00108657⟩
    • Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell. An Approach to the Built-in-Self of Field Programmable Analog Arrays. VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.383-388. ⟨lirmm-00108908⟩
    • Antonio Zenteno, Víctor Champac, Michel Renovell, Florence Azaïs. Analysis and Attenuation Proposal in Ground Bounce. ATS: Asian Test Symposium, Nov 2004, Kenting Taiwan. pp.460-463, ⟨10.1109/ATS.2004.25⟩. ⟨lirmm-00108931⟩
    • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test Flow Optimization. ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩. ⟨lirmm-00269527⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. An Automatic Tool for Generation of ADC BIST Architecture. IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84. ⟨lirmm-00269580⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs. IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190. ⟨lirmm-00269583⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand, Jean-Michel Portal, et al.. GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. ⟨lirmm-00269604⟩
    • Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell. On the Synthesis of Analog Cascaded Filters with Optimal Test Point Insertion. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216. ⟨lirmm-00269499⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203. ⟨lirmm-00269498⟩
    • Michel Renovell, Tiago R. Balen, M. Schreiber, Florence Azaïs, Marcelo Lubaszewski. OBIST Applied to FPAAs: A Case Study. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.238-243. ⟨lirmm-00269501⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Delay Testing of MOS Transistor with Gate Oxide Short. ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173. ⟨lirmm-00269641⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. Automatic Generation of LH-BIST Architecture for ADC Testing. IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12. ⟨lirmm-00269683⟩
    • Uroš Kač, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell. Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test Chip. BTW: Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2. ⟨lirmm-00269342⟩
    • Uroš Kač, Franc Novak, Jozef Stefan, Florence Azaïs, Pascal Nouet, et al.. Experimental test infrastructure supporting IEEE 11494 Standard. ETW: European Test Workshop, 2002, Corfou, Greece. ⟨lirmm-00268606⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. A Non-Split Model for Realistic Gate Oxide Short in CMOS Technology. DCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204. ⟨lirmm-00268432⟩
    • Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. A High Accuracy Triangle-Wave Signal Generator for On-Chip ADC Testing. ETW: European Test Workshop, 2002, Corfu, Greece. pp.89-94. ⟨lirmm-00268483⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Low Voltage Testing of Gate Oxide Short in CMOS Technology. DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174. ⟨lirmm-00268526⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On-Chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SoC: Very Large Scale Integration of Systems-on-Chips, 2002, Montpellier, France. pp.425-436. ⟨lirmm-00268477⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale. Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50. ⟨lirmm-00269325⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, et al.. Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179. ⟨lirmm-00269320⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short. DBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16. ⟨lirmm-00269333⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Evaluation of ADC Static Parameters Through Dynamic Testing. ADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98. ⟨lirmm-00269338⟩
    • Florence Azaïs, Yves Bertrand, Jose Vicente Calvano, Marcelo Lubaszewski, Pascal Nouet, et al.. Designing Testable Analog Filters with Optimal DFT Insertion. IMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203. ⟨lirmm-00269341⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Evaluation of ADC Static Parameters via Frequency Domain. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169. ⟨lirmm-00269347⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Modeling Gate Oxide Short Defects in CMOS Minimum Transistors. ETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20. ⟨lirmm-00268527⟩
    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Boolean and Current Detection of MOS Transistor with Gate Oxide Short. IEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10. ⟨lirmm-00370400⟩
    • Marcelo Lubaszewski, Michel Renovell, Florence Azaïs, Yves Bertrand. A multi-mode stimuli generator for analogue and mixed-signal built-in-self-test. IMSTW: International Mixed Signal Testing Workshop, Jun 1998, The Hague, Pays-Bas. pp.100-106. ⟨hal-01384740⟩
    • Marcelo Lubaszewski, Michel Renovell, S. Mir, Florence Azaïs, Yves Bertrand. A built-in multi-mode stimuli generator for analogue and mixed-signal testing. Brazilian Symposium on Integrated Circuit Design, 1998, Rio de Janeiro, Brazil. pp.175-178, ⟨10.1109/SBCCI.1998.715435⟩. ⟨hal-00005876⟩
    • Michel Renovell, Marcelo Lubaszewski, S. Mir, Florence Azaïs, Yves Bertrand. A multi-mode signature analyzer for analog and mixed circuits. VLSI: Integrated Systems on Silicon, Aug 1997, Gramado, Brazil. pp.65-76, ⟨10.1007/978-0-387-35311-1_6⟩. ⟨hal-01399998⟩

    Poster communications2 documents

    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Implementing model redundancy in predictive alternate test to improve test confidence. ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩. ⟨lirmm-00820077⟩
    • Florence Azaïs, Laurent Larguier, Michel Renovell. Logic Errors in CMOS Circuits due to Simultaneous Switching Noise. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.59-64, 2007. ⟨lirmm-00154744⟩

    Books1 document

    • Florence Azaïs, Serge Bernard, Yves Bertrand, Marie-Lise Flottes, Patrick Girard, et al.. Test de Circuits et de Systèmes Intégrés. Collection EGEM, Ed.Hermès, 2004, 2-7462-0864-4. ⟨lirmm-00109158⟩

    Book sections1 document

    • Michel Renovell, Florence Azaïs, Joan Figueras, Rosa Rodríguez-Montañés, Daniel Arumi. Models for Bridging Defects. Models in Hardware Testing, 43, Springer Netherlands, pp.33-70, 2010, Frontiers in Electronic Testing, 978-90-481-3281-2. ⟨lirmm-00371365⟩

    Other publications8 documents

    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. ⟨lirmm-00679018⟩
    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. ⟨lirmm-00679022⟩
    • Patrick Girard, Florence Azaïs, Serge Bernard, Alberto Bosio, Luigi Dilillo, et al.. TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année. 2010. ⟨lirmm-00461745⟩
    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire). 2010. ⟨lirmm-00504873⟩
    • Patrick Girard, Michel Renovell, Florence Azaïs, Yves Bertrand, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique Intermédiaire). 2003, pp.P nd. ⟨lirmm-00269720⟩
    • Patrick Girard, Michel Renovell, Florence Azaïs, Serge Bernard, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique de Fin d'Année). 2003, pp.P nd. ⟨lirmm-00269749⟩
    • Patrick Girard, Florence Azaïs, Serge Bernard, Yves Bertrand, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe. 2002. ⟨lirmm-00268586⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Mixed-Signal BISR. 2002. ⟨lirmm-00268607⟩

    Reports1 document

    • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand, Jean-Michel Portal. A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect. [Research Report] 04080, Lirmm, University of Montpellier. 2004. ⟨lirmm-00109221⟩