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Mariane Comte
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An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short DefectsVTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Communication dans un congrès
lirmm-00374941v1
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