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    63

    Publications de Mariane Comte


    Article dans une revue12 documents

    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102. <10.1016/j.mejo.2015.09.014>. <lirmm-01232890>
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect Measurements. Microelectronics Journal, Elsevier, 2014, 45 (3), pp.336-344. <10.1016/j.mejo.2013.12.006>. <lirmm-00936443>
    • Jean-Marc Galliere, Florence Azaïs, Mariane Comte, Michel Renovell. Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm. Information Technology, Oldenbourg Verlag, 2014, 56 (4), pp.173-181. <http://www.degruyter.com/view/j/itit>. <10.1515/itit-2013-1040>. <hal-01167054>
    • Vincent Kerzérho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, et al.. A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectronics Journal, Elsevier, 2013, 44 (9), pp.840-843. <http://www.sciencedirect.com/science/article/pii/S0026269213001468>. <10.1016/j.mejo.2013.06.009>. <lirmm-00875985>
    • Vincent Kerzérho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, et al.. Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. Journal of Electronic Testing, Springer Verlag, 2011, 27 (3), pp.335-350. <10.1007/s10836-011-5194-y>. <lirmm-00609243>
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design, Hindawi Publishing Corporation, 2008, 2008 (Article ID 482159), pp.8. <10.1155/2008/482159>. <lirmm-00346722>
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. Fully Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC. IET Computers & Digital Techniques, Institution of Engineering and Technology, 2007, 1 (3), pp.146-153. <lirmm-00195172>
    • Serge Bernard, Vincent Kerzérho, Philippe Cauvet, Florence Azaïs, Mariane Comte, et al.. A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP. IEEE Design & Test of Computers, Institute of Electrical and Electronics Engineers, 2006, 23 (3), pp.237-243. <lirmm-00115131>
    • Florence Azaïs, Serge Bernard, Mariane Comte, Yves Bertrand, Michel Renovell. Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. Journal of Electronic Testing, Springer Verlag, 2005, 21 (3), pp.291-298. <lirmm-00105322>
    • Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. Journal of Electronic Testing, Springer Verlag, 2004, Vol. 20 n°3, pp. 257-267. <hal-00004514>
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. Journal of Electronic Testing, Springer Verlag, 2004, 20 (4), pp.375-387. <lirmm-00108545>
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. A-to-D Converter Static Error Detection from Dynamic Parameter Measurements. Microelectronics Journal, Elsevier, 2003, 34 (10), pp. 945-953. <lirmm-00269601>

    Communication dans un congrès47 documents

    • Achraf Lamlih, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Mariane Comte, et al.. Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems. IWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany. Session: Bioimpedance Spectroscopy II (N012). <https://www.tu-chemnitz.de/etit/messtech/iwis/openconf/modules/request.php?module=oc_program&action=program.php>. <lirmm-01457544>
    • Karel Amit, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. 17th IEEE Latin-American Test Symposium, pp.129-134, 2016, <10.1109/LATW.2016.7483352>. <lirmm-01374300>
    • Karel Amit, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations. ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2016, Pittsburgh, United States. Proc. IEEE Computer Society Annual Symposium on VLSI (ISVLSI’16), 2016, <http://www.eng.ucy.ac.cy/theocharides/isvlsi16/cfp.html>. <10.1109/ISVLSI.2016.102>. <lirmm-01374292>
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A framework for efficient implementation of analog/RF alternate test with model redundancy. ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. IEEE, Proc. IEEE Computer Society Annual Symposium on VLSI (ISVLSI’15), pp.621-626, 2015, <10.1109/ISVLSI.2015.30>. <lirmm-01233104>
    • Vincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, et al.. Toward adaptation of ADCs to operating conditions through on-chip correction. ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. Proc. IEEE Computer Society Annual Symposium on VLSI (ISVLSI’15), pp.634-639, 2015, <10.1109/ISVLSI.2015.62>. <lirmm-01233117>
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A generic methodology for building efficient prediction models in the context of alternate testing. IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. IEEE, 2015, Mixed-Signal Testing Workshop (IMSTW), 2015 20th International. <10.1109/IMS3TW.2015.7177873>. <lirmm-01233150>
    • Vincent Kerzérho, Florence Azaïs, Mouhamadou Dieng, Mariane Comte, Serge Bernard, et al.. Self-Adaptive NFC Systems. IOLTS'14: 20th International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. IEEE, 2014, Special Session 4 – Solutions for the self-adaptation of communicating systems in operation. <lirmm-01084355>
    • Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, et al.. Solutions for the self-adaptation of communicating systems in operation. IOLTS: International International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. IEEE Computer Society, 20th International International On-line Test Symposium, pp.234-239, 2014, <10.1109/IOLTS.2014.6873705>. <hal-01118068>
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. 2014, <http://www.date-conference.com/>. <10.7873/DATE2014.144>. <lirmm-00994714>
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Syhem Larguech, et al.. Investigations on alternate analog/RF test with model redundancy. STEM'14: 1st Workshop on Statistical Test Methods, 2014, Paderborn, Germany. <lirmm-01119374>
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. 15th IEEE Latin American Test Workshop, pp.1-6, 2014, <10.1109/LATW.2014.6841930>. <lirmm-01119361>
    • Mouhamadou Dieng, Florence Azaïs, Mariane Comte, Serge Bernard, Vincent Kerzérho, et al.. Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module. IMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. IEEE, pp.1-6, <10.1109/IMS3TW.2014.6997401>. <lirmm-01119365>
    • Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, et al.. MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. 22nd Asian Test Symposium, pp.177-182, 2013, <10.1109/ATS.2013.41>. <lirmm-00932357>
    • Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, et al.. Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced Delays. LATW: Latin American Test Workshop, Apr 2013, Cordoba, Argentina. 14th Latin American Test Workshop, 2013, <http://tima.imag.fr/conferences/latw2013/>. <10.1109/LATW.2013.6562657>. <lirmm-00820067>
    • Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzérho, Florence Azaïs, et al.. Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications. NEWCAS: International New Circuits and Systems Conference, Jun 2013, Paris, France. IEEE, 11th International NEWCAS Conference (NEWCAS), pp.137-141, 2013, <http://newcas2013.org/>. <lirmm-00839190>
    • Marina Aparicio, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell, et al.. An IR-Drop Simulation Principle Oriented to Delay Testing. DCIS'12: 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409, 2012, <http://www.lirmm.fr/dcis2012/index.php>. <lirmm-00804254>
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Making predictive analog/RF alternate test strategy independent of training set size. ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. IEEE, pp.9, 2012, <10.1109/TEST.2012.6401560>. <lirmm-00803564>
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, et al.. Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. IEEE, pp.19-24, 2012, <10.1109/VTS.2012.6231074>. <lirmm-00803453>
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. On the use of redundancy to reduce prediction error in alternate analog/RF test. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. 18th Annual IEEE International Mixed-Signals, Sensors, and Systems Test Workshop, pp.34-39, 2012, <10.1109/IMS3TW.2012.17>. <lirmm-00803556>
    • Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Vincent Kerzérho, et al.. Adaptive LUT-Based System for In Situ ADC Auto-correction. IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A, 2010. <lirmm-00494424>
    • Vincent Kerzérho, Florence Azaïs, Mariane Comte, Philippe Cauvet, Serge Bernard, et al.. ANC-Based Method for Testing Converters with Random-Phase Harmonics. IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A, 2010. <lirmm-00494578>
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation. ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. IEEE, pp.747-750, 2009, New Trends in A/D Converters Design & Testing. <http://ecctd09.dogus.edu.tr/>. <lirmm-00448863>
    • Nicolas Houarche, Alejandro Czutro, Mariane Comte, Piet Engelke, Ilia Polian, et al.. Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A, 2009. <lirmm-00367708>
    • Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, et al.. An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. IEEE, pp.21-26, 2009, <http://www.tttc-vts.org/public_html/new/2009/index.php>. <10.1109/VTS.2009.57>. <lirmm-00374941>
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. LH-BIST for Digital Correction of ADC Offset. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. 4th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, pp.199-203, 2009. <lirmm-00375659>
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. An Automatic Tool for Generation of ADC BIST Architecture. IMSTW'03: 9th IEEE International Mixed-Signal Testing Workshop, Sevilla (Spain), France. pp. 79-84, 2003. <lirmm-00269580>
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, et al.. Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW'02: 3rd IEEE Latin American Test Workshop, Montevideo (Uruguay), France. pp. 174-179, 2002. <lirmm-00269320>
    • Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, et al.. A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS: European Test Symposium, May 2008, Verbania, Italy. 13th IEEE European Test Symposium, pp.113-118, 2008. <lirmm-00285886>
    • Michel Renovell, Mariane Comte, Nicolas Houarche, Ilia Polian, Piet Engelke, et al.. A Model for Resistive Open Recursivity in CMOS Random Logic. EWDTS'08: IEEE East-West Design & Test Symposium, Oct 2008, Ukraine. pp.21-24, 2008, <http://ewdtest.com/conf/>. <lirmm-00381465>
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs. IMSTW'03: 9th IEEE International Mixed-Signal Testing Workshop, Sevilla (Spain), France. pp. 185-190, 2003. <lirmm-00269583>
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale. Colloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 47-50, 2002. <lirmm-00269325>
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Evaluation of ADC Static Parameters Through Dynamic Testing. ADDA&EWADC'02: Advanced A/D and D/A Conversion Techniques and Their Applications & ADC Modelling and Testing, Czech Technical University in Prague (Czech Republic), France. pp. 95-98, 2002. <lirmm-00269338>
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators. IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201, 2007. <lirmm-00161708>
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.211-216, 2007, <10.1109/ETS.2007.1>. <lirmm-00158527>
    • Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. “Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2006, Southampton, United Kingdom. 11th IEEE European Test Symposium, pp.159-164, 2006. <lirmm-00115676>
    • Michel Renovell, Mariane Comte, Ilia Polian, Piet Engelke, Bernd Becker. Analysing the Memory Effect of Resistive Open in CMOS Random Logic. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on, pp.251-256, 2006. <lirmm-00093383>
    • Michel Renovell, Mariane Comte, Ilia Polian, Piet Engelke, Bernd Becker. A Specific ATPG Technique for Resistive Open with Sequence Recursive Dependency. ATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. 15th IEEE Asian Test Symposium, pp.273-278, 2006, <10.1109/ATS.2006.261031>. <lirmm-00117022>
    • Serge Bernard, Florence Azaïs, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC. IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88, 2006. <lirmm-00119266>
    • Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell. Electrical Behavior of GOS Fault Affected Domino Logic Cell. DELTA'06: IEEE International Workshop on Electronics DesignTest & Applications, Jan 2006, Kuala Lumpur, Malaysia, IEEE, pp.183-189, 2006. <lirmm-00102703>
    • Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell. Electrical Behavior of GOS Faults in Domino Logic. DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, IEEE, pp.210-215, 2005. <lirmm-00105991>
    • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Fast and Fully-Efficient Test Flow for ADCs. IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249, 2005. <lirmm-00106523>
    • Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell. Electrical Analysis of a Domino Logic Cell with GOS Faults. DBT'05: International Workshop on Current & Defect Based Testing, May 2005, Palm Springs, CA, United States. 2005, <http://www.cs.colostate.edu/~malaiya/dbt05.html>. <lirmm-00374937>
    • Mariane Comte, Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test Flow Optimization. ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, 2003, <10.1109/TEST.2003.1270841>. <lirmm-00269527>
    • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test FLow Optimization. ITC'03: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, 2003. <lirmm-00269610>
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. 4th IEEE Latin American Test Workshop, pp.198-203, 2003. <lirmm-00269498>
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. Automatic Generation of LH-BIST Architecture for ADC Testing. IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12, 2003. <lirmm-00269683>
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Evaluation of ADC Static Parameters via Frequency Domain. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169, 2002. <lirmm-00269347>

    Poster1 document

    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Implementing model redundancy in predictive alternate test to improve test confidence. ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, <10.1109/ETS.2013.6569386>. <lirmm-00820077>

    Direction d'ouvrage, Proceedings1 document

    • Aida Todri-Sanial, Giorgio Di Natale, Patrick Girard, Marc Belleville, Saraju P. Mohanty, et al.. Proceedings of IEEE Computer Society Annual Symposium on VLSI (ISVLSI - 2015). Jul 2015, Montpellier, France. IEEE, 2015, 978-1-4799-8718-4. <www.isvlsi.org>. <lirmm-01433587>

    Autre publication1 document

    • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing. 3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits (TVHSAC 2013.. 2013. <lirmm-00985422>

    Thèse1 document

    • Mariane Comte. Etude des Corrélations entre Paramètres Statiques et Dynamiques des CAN en vue d'optimiser leur Flot de Test. Micro et nanotechnologies/Microélectronique. Université Montpellier II - Sciences et Techniques du Languedoc, 2003. Français. <tel-00003666>