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Luigi Dilillo
9
Documents
Identifiants chercheurs
- luigi-dilillo
- IdRef : 18891885X
- 0000-0002-1295-2688
Présentation
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On the evaluation of FPGA radiation benchmarksMicroelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩
Article dans une revue
lirmm-03382368v1
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Methodologies for the Statistical Analysis of Memory Response to RadiationIEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩
Article dans une revue
lirmm-01382508v1
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Multiple Cell Upset Classification in Commercial SRAMsIEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩
Article dans une revue
lirmm-01234446v1
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Dynamic Test Methods for COTS SRAMsIEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩
Article dans une revue
lirmm-01234463v1
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Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBTIEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩
Article dans une revue
lirmm-01237646v1
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A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and SlicingRADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩
Communication dans un congrès
lirmm-01238397v1
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Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBTRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩
Communication dans un congrès
lirmm-01237617v1
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Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic ModeRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩
Communication dans un congrès
lirmm-00839062v1
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Temperature Impact on the Neutron SER of a Commercial 90nm SRAMNSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4
Communication dans un congrès
lirmm-00805291v1
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