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  • IdHAL : luigi-dilillo

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    257

    Publications of Luigi Dilillo


    Journal articles50 documents

    • Rudy Ferraro, Salvatore Danzeca, Chiara Cangialosi, Ruben Garcia Alia, Francesco Cerutti, et al.. Study of the impact of the LHC radiation environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2019, 66 (7), pp.1548-1556. ⟨10.1109/TNS.2019.2902441⟩. ⟨lirmm-02016480⟩
    • Emna Farjallah, Jean-Marc Armani, Valentin Gherman, Luigi Dilillo. Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh. Microelectronics Reliability, Elsevier, 2019, 96, pp.37-45. ⟨10.1016/j.microrel.2019.01.014⟩. ⟨lirmm-02008002⟩
    • Leonardo Kessler Slongo, João Reis, Daniel Gaiki, Pedro von Hohendorff Seger, Sara Vega Martinez, et al.. Pre-flight qualification test procedure for nanosatellites using sounding rockets. Acta Astronautica, Elsevier, 2019, 159, pp.564-577. ⟨10.1016/j.actaastro.2019.01.035⟩. ⟨lirmm-02008287⟩
    • Alexandre Louis Bosser, Viyas Gupta, Arto Javanainen, Georgios Tsiligiannis, Stephen Lalumondiere, et al.. Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩. ⟨lirmm-02007922⟩
    • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Jérôme Boch, et al.. A calculation method to estimate single event upset cross section. Microelectronics Reliability, Elsevier, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩. ⟨hal-01636059⟩
    • Rudy Ferraro, Salvatore Danzeca, Matteo Brucoli, Alessandro Masi, Markus Brugger, et al.. Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters. Journal of Instrumentation, IOP Publishing, 2017, 12 (4), pp.#C04007. ⟨http://iopscience.iop.org/article/10.1088/1748-0221/12/04/C04007⟩. ⟨10.1088/1748-0221/12/04/C04007⟩. ⟨lirmm-01513884⟩
    • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Eric Lorfèvre, et al.. The Power Law Shape of Heavy Ions Experimental Cross Section. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩. ⟨lirmm-01382480⟩
    • Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Christopher Frost, Ali Mohammad Zadeh, et al.. Methodologies for the Statistical Analysis of Memory Response to Radiation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩. ⟨lirmm-01382508⟩
    • Viyas Gupta, Alexandre Louis Bosser, Georgios Tsiligiannis, Ali Mohammad Zadeh, Arto Javanainen, et al.. Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩. ⟨lirmm-01382552⟩
    • Axel Rodriguez, Frédéric Wrobel, Anne Samaras, Francoise Bezerra, Benjamin Vandevelde, et al.. Proton-Induced Single-Event Degradation in SDRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩. ⟨lirmm-01382563⟩
    • Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. Design for Test and Diagnosis of Power Switches. Journal of Circuits, Systems, and Computers, World Scientific Publishing, 2016, 25 (3), pp.1640013. ⟨10.1142/S0218126616400132⟩. ⟨lirmm-01272986⟩
    • Luigi Dilillo, Georgios Tsiligiannis, Viyas Gupta, Alexandre Louis Bosser, Frédéric Saigné, et al.. Soft errors in commercial off-the-shelf static random access memories. Semiconductor Science and Technology, IOP Publishing, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨http://iopscience.iop.org/article/10.1088/1361-6641/32/1/013006/meta⟩. ⟨10.1088/1361-6641/32/1/013006⟩. ⟨lirmm-01434747⟩
    • Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6), pp.2620-2626. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2015.2496874⟩. ⟨lirmm-01254157⟩
    • Viyas Gupta, Alexandre Louis Bosser, Georgios Tsiligiannis, Mathias Rousselet, Ali Mohammadzadeh, et al.. SEE on Different Layers of Stacked-SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩. ⟨lirmm-01254148⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3380-3388. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2014.2365038⟩. ⟨lirmm-01234455⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Dynamic Test Methods for COTS SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3095-3102. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2014.2363123⟩. ⟨lirmm-01234463⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Multiple Cell Upset Classification in Commercial SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1747-1754. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2014.2313742⟩. ⟨lirmm-01234446⟩
    • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Robert Ecoffet, et al.. Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (6), pp.3564-3571. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2014.2368613⟩. ⟨lirmm-01234461⟩
    • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Vincent Pouget, Frédéric Saigné. Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1813-1818. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2014.2299762⟩. ⟨lirmm-01234429⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. An SRAM Based Monitor for Mixed-Field Radiation Environments. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2014.2299733⟩. ⟨lirmm-01234441⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (11), pp.2326-2335. ⟨10.1109/TVLSI.2013.2294080⟩. ⟨lirmm-01248578⟩
    • Aida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, et al.. Globally Constrained Locally Optimized 3-D Power Delivery Networks. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (10), pp.2131-2144. ⟨10.1109/TVLSI.2013.2283800⟩. ⟨lirmm-01255754⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction. IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2014, 61 (11), pp.3877-3882. ⟨10.1109/TED.2014.2355418⟩. ⟨lirmm-01272978⟩
    • Lionel Foro, Antoine Touboul, Alain Michez, Frédéric Wrobel, Paolo Rech, et al.. Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1739-1746. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2014.2332813⟩. ⟨lirmm-01237646⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology. Journal of Instrumentation, IOP Publishing, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩. ⟨lirmm-01234448⟩
    • Ahn Duc Tran, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems. Journal of Electronic Testing, Springer Verlag, 2014, 30 (4), pp.401-413. ⟨10.1007/s10836-014-5459-3⟩. ⟨lirmm-01272958⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. On the Test and Mitigation of Malfunctions in Low-Power SRAMs. Journal of Electronic Testing, Springer Verlag, 2014, 30 (5), pp.611-627. ⟨http://link.springer.com/article/10.1007%2Fs10836-014-5479-z⟩. ⟨10.1007/s10836-014-5479-z⟩. ⟨lirmm-01238443⟩
    • Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Intra-Cell Defects Diagnosis. Journal of Electronic Testing, Springer Verlag, 2014, 30 (5), pp.541-555. ⟨10.1007/s10836-014-5481-5⟩. ⟨lirmm-01272964⟩
    • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (5), pp.3603-3608. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2013.2264957⟩. ⟨lirmm-01234419⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩. ⟨lirmm-00805005⟩
    • Frédéric Wrobel, Antoine Touboul, Luigi Dilillo, Frédéric Saigné. Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩. ⟨lirmm-00805001⟩
    • Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2013, 21 (5), pp.958-970. ⟨10.1109/TVLSI.2012.2197427⟩. ⟨lirmm-00806774⟩
    • Aida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, et al.. A Study of Tapered 3-D TSVs for Power and Thermal Integrity. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2013, 21 (2), pp.306-319. ⟨10.1109/TVLSI.2012.2187081⟩. ⟨lirmm-00806776⟩
    • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2386-2391. ⟨http://ieeexplore.ieee.org/Xplore/home.jsp⟩. ⟨10.1109/TNS.2013.2257847⟩. ⟨lirmm-01234425⟩
    • Paolo Bernardi, Mauricio de Carvalho, Ernesto Sanchez, Matteo Sonza Reorda, Alberto Bosio, et al.. Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption. Journal of Low Power Electronics, American Scientific Publishers, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩. ⟨lirmm-00934937⟩
    • Alessio Griffoni, Jeroen van Duivenbode, Dimitri Linten, Eddy Simoen, Paolo Rech, et al.. Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩. ⟨lirmm-00805039⟩
    • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Jérôme Boch, et al.. Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩. ⟨lirmm-00805031⟩
    • Denis Pantel, Jean-Roch Vaillé, Frédéric Wrobel, Luigi Dilillo, Jean-Marc Galliere, et al.. Embedded silicon detector to investigate the natural radiative environment. Journal of Instrumentation, IOP Publishing, 2012, 7 (5), pp.1-11. ⟨http://iopscience.iop.org/1748-0221/7/05/P05007⟩. ⟨10.1088/1748-0221/7/05/P05007⟩. ⟨lirmm-00805011⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories. Journal of Electronic Testing, Springer Verlag, 2012, 28 (2), pp.215-228. ⟨lirmm-00806773⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. Journal of Electronic Testing, Springer Verlag, 2012, 28 (3), pp.317-329. ⟨http://link.springer.com/article/10.1007%2Fs10836-012-5291-6⟩. ⟨10.1007/s10836-012-5291-6⟩. ⟨lirmm-00805017⟩
    • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩. ⟨lirmm-00805046⟩
    • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Paolo Rech, et al.. Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩. ⟨lirmm-00805045⟩
    • Julien Vial, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. SoC Yield Improvement - Using TMR Architectures for Manufacturing Defect Tolerance in Logic Cores. International Journal On Advances in Systems and Measurements, IARIA, 2010, 3 (1/2), pp.1-10. ⟨lirmm-00553567⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes. Journal of Low Power Electronics, American Scientific Publishers, 2010, 6 (2), pp.359-374. ⟨lirmm-00553548⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories. Journal of Integrated Circuits and Systems, Brazilian Microelectronics Society, 2008, 3 (1), pp.7-12. ⟨lirmm-00341793⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. Journal of Electronic Testing, Springer Verlag, 2007, 23 (3), pp.435-444. ⟨lirmm-00194254⟩
    • Patrick Girard, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan, et al.. ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. Journal of Electronic Testing, Springer Verlag, 2006, 22 (3), pp.287-296. ⟨10.1007/s10836-006-7761-1⟩. ⟨lirmm-00134769⟩
    • Luigi Dilillo, Paul Rosinger, Bashir Al-Hashimi, Patrick Girard. Reducing Power Dissipation in SRAM During Test. Journal of Low Power Electronics, American Scientific Publishers, 2006, 2 (2), pp.271-280. ⟨lirmm-00137590⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. Journal of Electronic Testing, Springer Verlag, 2005, 21 (5), pp.551-561. ⟨10.1007/s10836-005-1169-1⟩. ⟨lirmm-00105314⟩
    • Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. Journal of Electronic Testing, Springer Verlag, 2005, 21 (2), pp.169-179. ⟨10.1007/s10836-005-6146-1⟩. ⟨lirmm-00105313⟩

    Conference papers181 documents

    • Douglas Rossi de Melo, Cesar Zeferino, Luigi Dilillo, Eduardo Augusto Bezerra. Analyzing the Error Propagation in a Parameterizable Network-on-Chip Router. LATS: Latin-American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704580⟩. ⟨lirmm-02008414⟩
    • Cézar Rigo, Lucas Matana Luza, Elder Dominghini Tramontin, Victor Martins, Sara Vega Martinez, et al.. A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites. LATS: Latin-American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩. ⟨lirmm-02008436⟩
    • Rudy Ferraro, Salvatore Danzeca, Luigi Dilillo, Chiara Cangialosi, Ruben Garcia Alia, et al.. Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components. RADECS: Radiation Effects on Components and Systems, Sep 2018, Göteborg, Sweden. ⟨lirmm-02008384⟩
    • Lucas Matana Luza, Cézar Rigo, Elder Dominghini Tramontin, Victor Martins, Sara Vega Martinez, et al.. Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies. IAA-LACW: Latin American CubeSat Workshop, Dec 2018, Ubatuba, Brazil. ⟨lirmm-02008460⟩
    • Douglas Rossi de Melo, Cesar Zeferino, Luigi Dilillo, Eduardo Augusto Bezerra. Implementation of fault tolerance techniques for integrated network interfaces. IAA-LACW: Latin American CubeSat Workshop, Dec 2018, Ubatuba, Brazil. ⟨lirmm-02008453⟩
    • Emna Farjallah, Valentin Gherman, Jean-Marc Armani, Luigi Dilillo. Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells. DTIS: Design & Technology of Integrated Systems In Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩. ⟨lirmm-02008214⟩
    • Valentin Gherman, Emna Farjallah, Jean-Marc Armani, Marcelino Seif, Luigi Dilillo. Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics. ITC: International Test Conference, Oct 2017, Fort Worth, United States. ⟨10.1109/TEST.2017.8242066⟩. ⟨lirmm-01582185⟩
    • Alexandre Louis Bosser, Viyas Gupta, Arto Javanainen, Georgios Tsiligiannis, Stephen Lalumondiere, et al.. Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory. RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland. ⟨hal-01929267⟩
    • Marcelino Seif, Emna Farjallah, Franck Badets, Christophe Layer, Jean-Marc Armani, et al.. Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps. ETS: European Test Symposium, May 2017, Limassol, Cyprus. pp.1-6, ⟨10.1109/ETS.2017.7968233⟩. ⟨lirmm-01687675⟩
    • Frédéric Wrobel, Antoine Touboul, V. Pouget, Luigi Dilillo, J. Boch, et al.. A calculation method to estimate single event upset cross section. ESREF: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2017, Bordeaux, France. ⟨hal-01929212⟩
    • Rudy Ferraro, Salvatore Danzeca, Matteo Brucoli, Alessandro Masi, Markus Brugger, et al.. Design of a Radiation Tolerant System for Total Ionizing Dose Monitoring Using Floating Gate and RadFET Dosimeters. TWEPP: Topical Workshop on Electronics for Particle Physics, Sep 2016, Karlsruhe, Germany. ⟨lirmm-01382578⟩
    • Viyas Gupta, Alexandre Louis Bosser, Frédéric Wrobel, Frédéric Saigné, Laurent Dusseau, et al.. MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction. 4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta. ⟨lirmm-01298423⟩
    • Luigi Dilillo. Muon effects on SRAMs. RADSOL: Electronique et rayonnements naturels au niveau du sol, CNRS - GDR ERRATA, Jun 2016, Paris, France. ⟨lirmm-01382532⟩
    • Alexandre Louis Bosser, Viyas Gupta, Arto Javanainen, Georgios Tsiligiannis, Helmut Puchner, et al.. Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM. RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany. ⟨lirmm-01337405⟩
    • Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Leonardo B. Zordan. An effective BIST architecture for power-gating mechanisms in low-power SRAMs. ISQED: International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.185-191, ⟨10.1109/ISQED.2016.7479198⟩. ⟨lirmm-01457424⟩
    • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Eric Lorfèvre, et al.. The Power Law Shape of Heavy Ions Experimental Cross Section. NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States. ⟨lirmm-01298421⟩
    • Luigi Dilillo. Methods for radiation test of memories. RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS), Jun 2015, Paris, France. ⟨lirmm-01238437⟩
    • Viyas Gupta, Alexandre Louis Bosser, Georgios Tsiligiannis, Ali Mohammadzadeh, Arto Javanainen, et al.. Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩. ⟨lirmm-01238392⟩
    • Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Rudy Ferraro, Christopher Frost, et al.. A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩. ⟨lirmm-01238397⟩
    • Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. Design-for-Diagnosis Architecture for Power Switches. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩. ⟨lirmm-01272684⟩
    • Viyas Gupta, Alexandre Louis Bosser, Georgios Tsiligiannis, Ali Mohammadzadeh, Arto Javanainen, et al.. Impact of Stacked-Layer Structure on SEE Rate of SRAMs. NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States. ⟨lirmm-01238384⟩
    • Luigi Dilillo, Alexandre Louis Bosser, Viyas Gupta, Frédéric Wrobel, Frédéric Saigné. Real-Time SRAM Based Particle Detector. IWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩. ⟨lirmm-01238435⟩
    • Anu Asokan, Alberto Bosio, Arnaud Virazel, Luigi Dilillo, Patrick Girard, et al.. An ATPG Flow to Generate Crosstalk-Aware Path Delay Pattern. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.515-520, ⟨10.1109/ISVLSI.2015.99⟩. ⟨lirmm-01272933⟩
    • Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard. An effective hybrid fault-tolerant architecture for pipelined cores. ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138733⟩. ⟨lirmm-01272730⟩
    • Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩. ⟨hal-01932433⟩
    • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Robert Ecoffet, et al.. Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code. NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States. ⟨lirmm-01238388⟩
    • Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, et al.. An effective ATPG flow for Gate Delay Faults. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩. ⟨lirmm-01272719⟩
    • Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. Scan-chain intra-cell defects grading. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩. ⟨lirmm-01272696⟩
    • Axel Rodriguez, Frédéric Wrobel, Anne Samaras, Francoise Bezerra, Benjamin Vandevelde, et al.. Proton-Induced SDRAM Cell Degradation. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩. ⟨lirmm-01238408⟩
    • Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. Exploring the impact of functional test programs re-used for power-aware testing. DATE: Design, Automation and Test in Europe, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩. ⟨lirmm-01272937⟩
    • Viyas Gupta, Luigi Dilillo, Frédéric Wrobel, Ali Mohammadzadeh, Georgios Tsiligiannis, et al.. Presentation of the MTCube CubeSat Project. 4S: Small Satellites Systems and Services Symposium, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain. ⟨lirmm-01272951⟩
    • Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩. ⟨lirmm-01248592⟩
    • Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. TSV aware timing analysis and diagnosis in paths with multiple TSVs. VTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818772⟩. ⟨lirmm-01248594⟩
    • Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, ⟨10.1109/DDECS.2014.6868791⟩. ⟨lirmm-01248599⟩
    • Helmut Puchner, Georgios Tsiligiannis, Luigi Dilillo. Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications. SEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States. ⟨lirmm-01297441⟩
    • Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Timing-aware ATPG for critical paths with multiple TSVs. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩. ⟨lirmm-01248600⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. ⟨lirmm-01237660⟩
    • Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩. ⟨lirmm-01248598⟩
    • Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. A Comprehensive Evaluation of Functional Programs for Power-Aware Test. NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩. ⟨lirmm-01248597⟩
    • Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Stefano Bernabovi, et al.. An intra-cell defect grading tool. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩. ⟨lirmm-01248591⟩
    • Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, et al.. Test and diagnosis of power switches. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩. ⟨lirmm-01248590⟩
    • Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, et al.. iBoX — Jitter based Power Supply Noise sensor. ETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩. ⟨lirmm-01248601⟩
    • Frédéric Wrobel, Antoine Touboul, Vincent Pouget, Luigi Dilillo, Frédéric Saigné. Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. ⟨lirmm-01237668⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. ⟨lirmm-01237709⟩
    • Tarek Saad Saoud, Soilihi Moindjie, Jean-Luc Autran, Daniela Munteanu, Frédéric Wrobel, et al.. Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. ⟨lirmm-01237717⟩
    • Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration. ASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, ⟨10.1109/ASPDAC.2014.6742948⟩. ⟨lirmm-01248596⟩
    • Annelise Touboul, Antoine Touboul, Frédéric Wrobel, V. Pouget, Luigi Dilillo, et al.. SEU Cross Section Calculation Based on Experimental Data of Another kind of Particle. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. ⟨hal-01934616⟩
    • Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. On the Generation of Diagnostic Test Set for Intra-cell Defects. ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩. ⟨lirmm-01272539⟩
    • Alexandre Louis Bosser, Luigi Dilillo, Viyas Gupta, Arto Javanainen, Heikki Kettunen, et al.. Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components. Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland. ⟨lirmm-01238439⟩
    • Luigi Dilillo. Test of 90nm SRAMs at Concordia Station in Antarctica. RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS); Institut Carnot STAR (Marseille), Jun 2014, Paris, France. ⟨lirmm-01238438⟩
    • Frédéric Wrobel, Jean-Roch Vaillé, Antoine Touboul, Luigi Dilillo, Frédéric Saigné. An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere. iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France. ⟨lirmm-01238432⟩
    • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Frédéric Saigné. Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩. ⟨lirmm-01237599⟩
    • Lionel Foro, Antoine Touboul, Frédéric Wrobel, Paolo Rech, Luigi Dilillo, et al.. Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩. ⟨lirmm-01237617⟩
    • Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock Domains. NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩. ⟨lirmm-00839042⟩
    • Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor Level. SDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States. ⟨lirmm-00806872⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩. ⟨lirmm-00839062⟩
    • João Azevedo, Arnaud Virazel, Yuanqing Cheng, Alberto Bosio, Luigi Dilillo, et al.. Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive Defects. VALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44. ⟨lirmm-01433308⟩
    • Ioana Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩. ⟨lirmm-01248603⟩
    • Ioana Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.109-114, ⟨10.1109/ATS.2013.30⟩. ⟨lirmm-01248609⟩
    • Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A novel method to mitigate TSV electromigration for 3D ICs. ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩. ⟨lirmm-01248617⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Test Solution for Data Retention Faults in Low-Power SRAMs. DATE: Design, Automation and Test in Europe, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩. ⟨lirmm-00805140⟩
    • Georgios Tsiligiannis, Ioana Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations. IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩. ⟨lirmm-00818955⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Temperature Impact on the Neutron SER of a Commercial 90nm SRAM. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4. ⟨lirmm-00805291⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMs. ITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2013.6651927⟩. ⟨lirmm-00818977⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs. VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548894⟩. ⟨lirmm-00805366⟩
    • Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery Networks. EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩. ⟨lirmm-00839043⟩
    • Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Computing Detection Probability of Delay Defects in Signal Line TSVs. ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569349⟩. ⟨lirmm-00839044⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments. IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩. ⟨lirmm-00839046⟩
    • Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Mitigate TSV Electromigration for 3D ICs - From the Architecture Perspective. International Symposium on VLSI, Natale, Brazil. pp.6. ⟨lirmm-00839052⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩. ⟨lirmm-00839085⟩
    • Ioana Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩. ⟨lirmm-01921630⟩
    • Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Effect-Cause Intra-Cell Diagnosis at Transistor Level. ISQED: International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩. ⟨lirmm-00817224⟩
    • Ioana Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩. ⟨lirmm-01238413⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Evaluating An SEU Monitor For Mixed-Field Radiation Environments. iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France. ⟨lirmm-01238433⟩
    • Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits. GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France. 2011. 〈lirmm-00679513〉
    • Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture. JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France. 2011. 〈lirmm-00679509〉
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling. GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France. 2011. 〈lirmm-00679522〉
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Test and Reliability of Magnetic Random Access Memories. GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France. 2011. 〈lirmm-00679516〉
    • Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Advanced Test Methods for SRAMs. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.300-301, ⟨10.1109/VTS.2012.6231070⟩. ⟨lirmm-00805049⟩
    • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Dynamic-Stress Neutrons Test of Commercial SRAMs. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4. ⟨lirmm-00805349⟩
    • Luigi Dilillo. An Error Resilient Platform for Data Transfer and Power Management for a Distributed SRAM-based Neutron Detection Test Bench. RADSOL: Electronique et rayonnements naturels au niveau du sol, Jun 2012, Paris, France. ⟨lirmm-00805398⟩
    • Paolo Bernardi, Mauricio de Carvalho, Ernesto Sanchez, Matteo Sonza Reorda, Alberto Bosio, et al.. Peak Power Estimation: A Case Study on CPU Cores. IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩. ⟨lirmm-00805389⟩
    • Frédéric Wrobel, Jean-Roch Vaillé, Denis Pantel, Luigi Dilillo, Jean-Marc Galliere, et al.. Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4. ⟨lirmm-00805150⟩
    • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Jean-Roch Vaillé, Frédéric Saigné. Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4. ⟨lirmm-00805275⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation. IOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩. ⟨lirmm-00805373⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4. ⟨lirmm-00805165⟩
    • Frédéric Wrobel, Luigi Dilillo, Antoine Touboul, Frédéric Saigné. Alpha particle-induced transient currents in 65 nm and 40 nm technologies. SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1. ⟨lirmm-00805378⟩
    • Denis Pantel, Jean-Roch Vaillé, Frédéric Wrobel, Luigi Dilillo, Jean-Marc Galliere, et al.. A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude. IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩. ⟨lirmm-00805169⟩
    • Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806859⟩
    • Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806841⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs. Colloque GDR SoC-SiP, 2012, Paris, France. ⟨lirmm-00806842⟩
    • Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Electro-Thermal Analysis of 3D Power Delivery Networks. DAC: Design Automation Conference, 2012, San Francisco, United States. ⟨lirmm-00806836⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures. JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France. ⟨lirmm-00806827⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩. ⟨lirmm-00806809⟩
    • Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defect Analysis for Through-Silicon-Vias. DCIS: Design of Circuits and Integrated Systems, 2012, Avignon, France. ⟨lirmm-00806803⟩
    • Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures. VTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. pp.50-55, ⟨10.1109/VTS.2012.6231079⟩. ⟨lirmm-00806778⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Analysis in Power Mode Control Logic of Low-Power SRAMs. ETS: European Test symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩. ⟨lirmm-00805374⟩
    • Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Power Supply Noise Sensor Based on Timing Uncertainty Measurements. ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩. ⟨lirmm-00806890⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Radiation Induced Effects on Electronic Systems and ICs. SETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy. ⟨lirmm-00807055⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Dynamic Mode Testing of SRAMS under Neutron Radiation. Sixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France. ⟨lirmm-00807053⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions. ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2012.6401578⟩. ⟨lirmm-00805143⟩
    • Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Through-Silicon-Via Resistive-Open Defect Analysis. ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233037⟩. ⟨lirmm-00806848⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation. RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France. ⟨hal-01935785⟩
    • Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault Localization Improvement through an Intra-Cell Diagnosis Approach. 38th International Symposium for Testing and Failure Analysis, Nov 2012, United States. pp.509-519. ⟨lirmm-00806863⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4. ⟨lirmm-00805163⟩
    • Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel. Why and How Controlling Power Consumption During Test: A Survey. ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp. 221-226, ⟨10.1109/ATS.2012.30⟩. ⟨lirmm-00818984⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. SRAM testing under Neutron Radiation for the evaluation of different algorithms stress. 15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France. ⟨lirmm-00807054⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM Architectures. DATE: Design, Automation and Test in Europe, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩. ⟨lirmm-00689024⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. On Using Address Scrambling to Implement Defect Tolerance in SRAMs. ITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A. ⟨lirmm-00647773⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash Technology. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨lirmm-00647750⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨10.1109/DTIS.2011.5941434⟩. ⟨lirmm-00647760⟩
    • Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A Functional Power Evaluation Flow for Defining Test Power Limits During At-Speed Delay Testing. ETS: European Test Symposium, May 2011, Trondheim, Norway. pp.153-158. ⟨lirmm-00647822⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway. ⟨lirmm-00651905⟩
    • Jean-Marc Galliere, Luigi Dilillo. Versatile March Test Generator for Hands-on Memory Testing Laboratory. MSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩. ⟨lirmm-00805300⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. On Using a SPICE-Like TSTAC eFlash Model for Design and Test. DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.359-370. ⟨lirmm-00592203⟩
    • Luigi Dilillo, Alberto Bosio, Miroslav Valka, Patrick Girard, Serge Pravossoudovitch, et al.. Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector. DFT'11: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Vancouver, Canada. pp.N/A. ⟨lirmm-00651226⟩
    • Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test Bench. Workshop on Dependability Issues in Deep-Submicron Technologies, Trondheim, Norway. ⟨lirmm-00651796⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Variability Analysis of an SRAM Test Chip. ETS: European Test Symposium, May 2011, Trondheim, Norway. ⟨lirmm-00651791⟩
    • Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits Parity Prediction Synthesis for Nano-Electronic Gate Designs. ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.136-141. ⟨lirmm-00651238⟩
    • Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, et al.. Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. ATS: Asian Test Symposium, 2011, New Delhi, India. pp.21-23. ⟨lirmm-00651247⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling. DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358. ⟨lirmm-00592182⟩
    • Alessio Griffoni, Jeroen Van Duivenbode, Dimitri Linten, Eddy Simoen, Paolo Rech, et al.. Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices. RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩. ⟨lirmm-00805339⟩
    • Luigi Dilillo, Alberto Bosio, Paolo Rech, Patrick Girard, Frédéric Wrobel, et al.. Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor. IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩. ⟨lirmm-00805394⟩
    • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Alessio Griffoni, Frédéric Wrobel, et al.. Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩. ⟨lirmm-00805314⟩
    • Luigi Dilillo, Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, et al.. Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench. IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6. ⟨lirmm-00805120⟩
    • Kohei Miyase, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme. WRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A. ⟨lirmm-00566869⟩
    • Luigi Dilillo. Impact of Atmospheric Neutrons on SRAMs through a Modular Test Bench. RADSOL - Electronique et rayonnements naturels au niveau du sol, Jun 2011, Paris, France. ⟨lirmm-00805407⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. On Using Address Scrambling for Defect Tolerance in SRAMs. International test Conference, Sep 2011, Anaheim, CA, United States. pp.1-8, ⟨10.1109/TEST.2011.6139149⟩. ⟨lirmm-00805334⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analyse et modélisation des défauts résistifs affectant les mémoires Flash. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France. ⟨lirmm-00553947⟩
    • Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Tolérance aux fautes et rendement de fabrication. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France. ⟨lirmm-00553995⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France. ⟨lirmm-00553989⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Detecting NBTI Induced Failures in SRAM Core-Cells. VTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80. ⟨lirmm-00553612⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270. ⟨lirmm-00553592⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories. JNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France. ⟨lirmm-00553935⟩
    • Leonardo Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Failure Analysis and Test Solutions for Low-Power SRAMs. ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.459-460, ⟨10.1109/ATS.2011.97⟩. ⟨lirmm-00805123⟩
    • Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay Testing. NEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩. ⟨lirmm-00647815⟩
    • Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Simultaneous Power and Thermal Integrity Analysis for 3D Integrated Systems. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway. ⟨lirmm-00651802⟩
    • Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, et al.. Power-Aware Test Pattern Generation for At-Speed LOS Testing. ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510. ⟨lirmm-00651917⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis of Resistive-Open Defects in TAS-MRAM Array. ITC: International Test Conference, Sep 2011, Anaheim, CA, United States. ⟨lirmm-00679524⟩
    • Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩. ⟨lirmm-00592000⟩
    • Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, et al.. A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. ATS: Asian Test Symposium, 2010, Shanghai, China. 19th IEEE Asian Test Symposium, pp.100-105, 2010. 〈lirmm-00545102〉
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Setting Test Conditions for Improving SRAM Reliability. ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.257-262. ⟨lirmm-00492741⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. A Statistical Simulation Method for Reliability Analysis of SRAM Core-Cells. DAC: Design Automation Conference, Jun 2010, Anaheim, United States. pp.853-856. ⟨lirmm-00553619⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down to 40nm Technology Nodes. ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.132-137. ⟨lirmm-00493236⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior Prediction. ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86. ⟨lirmm-00493204⟩
    • Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, et al.. Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts. IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩. ⟨lirmm-00559034⟩
    • Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A Comprehensive System-on-Chip Logic Diagnosis. ATS: Asian Test Symposium, 2010, Shanghai, China. 19th IEEE Asian Test Symposium, pp.237-242, 2010. 〈lirmm-00545131〉
    • Paolo Rech, Jean-Marc Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria. ⟨lirmm-00566847⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing. LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic. ⟨lirmm-00553930⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells. VARI: Workshop on CMOS Variability, 2010, Montpellier, France. ⟨lirmm-00553626⟩
    • Wu Fangmei, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes. DDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381. ⟨lirmm-00475734⟩
    • Luigi Dilillo, Frédéric Wrobel, Jean-Marc Galliere, F. Saigné. Use of BOBST for the Detection of Neutrons Induced Errors in SRAM. IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. ⟨hal-01957246⟩
    • Luigi Dilillo, Frédéric Wrobel, Jean-Marc Galliere, Frédéric Saigné. Neutron Detection through an SRAM-Based Test Bench. IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩. ⟨lirmm-00438842⟩
    • Youssef Benabboud, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, et al.. A Fault-Simulation-Based Approach for Logic Diagnosis. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221. ⟨lirmm-00371377⟩
    • Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, et al.. Comprehensive Bridging Fault Diagnosis based on the SLAT Paradigm. DDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269. ⟨lirmm-00371198⟩
    • Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Delay Fault Diagnosis in Sequential Circuits. ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360. ⟨lirmm-00406968⟩
    • Julien Vial, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Using TMR Architectures for SoC Yield Improvement. VALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160. ⟨lirmm-00406967⟩
    • Jean-Marc Galliere, Florence Azaïs, Michel Renovell, Luigi Dilillo. Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229. ⟨lirmm-00370798⟩
    • Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, et al.. A New Design-for-Test Technique for SRAM Core-Cell Stability Faults. DATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩. ⟨lirmm-00371374⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Trade-off Between Power Dissipation and Delay Fault Coverage For LOS and LOC Testing Schemes. Impact of Low-Power Design on Test and Reliability, Spain. ⟨lirmm-00435005⟩
    • Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMs. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2008, Tunis, Tunisia. pp.001-006, ⟨10.1109/DTIS.2008.4540243⟩. ⟨lirmm-00324143⟩
    • Luigi Dilillo, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, et al.. Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs. VLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336. ⟨lirmm-00324151⟩
    • Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2008.4700555⟩. ⟨lirmm-00341798⟩
    • Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A History-Based Technique for Faults Diagnosis in SRAMs. Colloque GDR SoC-SiP, France. ⟨lirmm-00341821⟩
    • Luigi Dilillo, Bashir M. Al Hashimi. March CRF: an Efficient Test for Complex Read Faults in SRAM Memories. DDECS: Design and Diagnostics of Electronic Circuits and Systems, IEEE, Apr 2007, Cracovie, Poland. ⟨10.1109/DDECS.2007.4295276⟩. ⟨lirmm-01239052⟩
    • Luigi Dilillo, Patrick Girard, Magali Bastian Hage-Hassan, Serge Pravossoudovitch, Arnaud Virazel. March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261. ⟨lirmm-00134776⟩
    • Luigi Dilillo, Paul Rosinger, Patrick Girard, Bashir Al-Hashimi. Minimizing Test Power in SRAM through Pre-charge Activity Reduction. DATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1159-1165, ⟨10.1109/DATE.2006.244016⟩. ⟨lirmm-00137598⟩
    • Luigi Dilillo, Bashir Al-Hashimi, Paul Rosinger, Patrick Girard. Leakage Read Fault in Nanoscale SRAM: Analysis, Test and Diagnosis. IDT'06: IEEE International Design and Test Workshop, Nov 2006, Dubai, United Arab Emirates. pp.110-115. ⟨lirmm-00137603⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Incidence des Défauts Résistifs dans les Circuits de Précharge des Mémoires SRAM. JNRDM'05 : 8ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2005, Paris, France. ⟨lirmm-00106529⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mehdi Hage Hassan. Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.183-188. ⟨lirmm-00105995⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and Characterization. ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.116-121, ⟨10.1109/ETS.2005.33⟩. ⟨lirmm-00106010⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13μm and 90nm Technologies. DAC: Design Automation Conference, May 2005, Anaheim, CA, United States. pp.857-862, ⟨10.1145/1065579.1065804⟩. ⟨lirmm-00106558⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies. DAC: Design Automation Conference, Jun 2005, Anaheim, CA, United States. pp.857-862. ⟨lirmm-00136906⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Efficient Test of Dynamic Read Destructive Faults in SRAM Memories. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.40-45. ⟨lirmm-00106515⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36. ⟨lirmm-00108642⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. Test March pour la Détection des Fautes Dynamiques dans les Décodeurs de Mémoires SRAM. JNRDM'04 : 7ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2004, Marseille, France. pp.495-497. ⟨lirmm-00108644⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test Solution. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.140-145. ⟨lirmm-00108795⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. ATS: Asian Test Symposium, Nov 2004, Kenting, Taiwan. pp.266-271. ⟨lirmm-00108800⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri. March iC-: An Improved Version of March C- for ADOFs Detection. VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.129-134, ⟨10.1109/VTEST.2004.1299236⟩. ⟨lirmm-00108772⟩
    • Luigi Dilillo, Vincent Beroulle, Norbert Dumas, Laurent Latorre, Pascal Nouet. An A/D Interface for Resonant Piezoresistive MEMS Sensor. ISIE'04: IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio (France), pp.83-88. ⟨lirmm-00108896⟩
    • Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, et al.. Comparison of open and resistive-open defect test conditions in SRAM address decoders. ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.250-255, ⟨10.1109/ATS.2003.1250818⟩. ⟨lirmm-01238821⟩

    Poster communications16 documents

    • Douglas Rossi de Melo, Cesar Zeferino, Luigi Dilillo, Eduardo Augusto Bezerra. Interconnection Architecture for Dependable Multicore Systems. PhD Forum - 26th IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2018, Torino, Italy. 2018. ⟨lirmm-02008476⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Performance Evaluation of Capacitive defects on TAS-MRAMs. Colloque GDR SoC-SiP, 2013, Lyon, France. 2013. ⟨lirmm-00839093⟩
    • Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis. Colloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013. ⟨lirmm-00839113⟩
    • Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Investigating Multiple-Cell-Upsets on a 90mn SRAM. Colloque GDR SoC-SiP, 2013, Lyon, France. 2013. ⟨lirmm-00839108⟩
    • Carolina Momo Metzler, Aida Todri-Sanial, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, et al.. Resistive Open Defect Analysis for Through-Silicon-Vias. ETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012. ⟨lirmm-00806795⟩
    • João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Coupling-Based Resistive-Open Defects in TAS-MRAM Architectures. ETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩. ⟨lirmm-00806793⟩
    • Jean-Marc Galliere, Paolo Rech, Patrick Girard, Luigi Dilillo. A Roaming Memory Test Bench for Detecting Particle Induced SEUs. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010. ⟨lirmm-00537879⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Is Test Power Reduction Through X-Filling Good Enough?. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010. ⟨lirmm-00537926⟩
    • Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Parity Prediction Synthesis for Nano-Electronic Gate Designs. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010. ⟨lirmm-00537938⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. NAND Flash Testing: A Preliminary Study on Actual Defects. ITC'2009: International Test Conference, Nov 2009, Austin, Texas, United States. pp.13, 2009. ⟨lirmm-00433765⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Analysis of Resistive-Bridging Defects in SRAM Core-Cell: Impact within the Core-Cell and in the Memory Array. ETS: European Test Symposium, May 2009, Sevilla, Spain. 14th IEEE European Test Symposium, 2009. ⟨lirmm-00433796⟩
    • Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Test des Mémoires FLASH NAND. Colloque GDR SoC-SiP, France. 2009. ⟨lirmm-00433770⟩
    • Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A Logic Diagnosis Approach for Sequential Circuits. IEEE European Test Symposium'09, Ph. D. Forum, Spain. 2009. ⟨lirmm-00433792⟩
    • Julien Vial, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. SoC Yield Improvement for Future Nanoscale Technologies. European Test Symposium. PhD Forum, Spain. 2009. ⟨lirmm-00433798⟩
    • Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. SRAM Core-cell Quality Metrics. GDR SOC SIP, France. 2009. ⟨lirmm-00434962⟩
    • Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes. GDR SOC SIP, France. 2009. ⟨lirmm-00434959⟩

    Books1 document

    • Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Springer, 171 p., 2009, 978-1-4419-0937-4. ⟨lirmm-00371359⟩

    Book sections2 documents

    • Luigi Dilillo, Alexandre Louis Bosser, Arto Javanainen, Ari Virtanen. Space Radiation Effects in Electronics. Rad-hard Semiconductor Memories, River Publishers, pp.1-56, 2018, 9788770220200. ⟨lirmm-02007913⟩
    • Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Electromigration Alleviation Techniques for 3D Integrated Circuits. Chao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996. ⟨lirmm-01800220⟩

    Other publications6 documents

    • Luigi Dilillo. Effect of space radiation on COTS memories: the MTCUBE project. 2019. ⟨lirmm-02008210⟩
    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. 〈lirmm-00679018〉
    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. 〈lirmm-00679022〉
    • Patrick Girard, Florence Azaïs, Serge Bernard, Alberto Bosio, Luigi Dilillo, et al.. TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année. 2010. ⟨lirmm-00461745⟩
    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire). 2010. ⟨lirmm-00504873⟩
    • Patrick Girard, Serge Bernard, Alberto Bosio, Luigi Dilillo, Marie-Lise Flottes, et al.. Rapport Technique de fin de Contrat NanoTEST 2A702, Programme CEE MEDEA+. 2009. ⟨lirmm-00406974⟩

    Habilitation à diriger des recherches1 document

    • Luigi Dilillo. Test and Reliability of Electronic Circuits in Natural and Radiative Environment. Electronics. Université de Montpellier, 2015. ⟨tel-01259002⟩