Luigi Dilillo

Documents

Identifiants chercheurs

luigi-dilillo
IdRef : 18891885X
0000-0002-1295-2688

Présentation

Publications

938500

	On the evaluation of FPGA radiation benchmarks Gaetan Bricas , Georgios Tsiligiannis , Antoine Touboul , Jérôme Boch , Maria Kastriotou Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩ Article dans une revue lirmm-03382368v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩ Article dans une revue lirmm-02007922v1
	Methodologies for the Statistical Analysis of Memory Response to Radiation Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩ Article dans une revue lirmm-01382508v1
	Soft errors in commercial off-the-shelf static random access memories Luigi Dilillo , Georgios Tsiligiannis , Viyas Gupta , Alexandre Louis Bosser , Frédéric Saigné Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩ Article dans une revue lirmm-01434747v1
	Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩ Article dans une revue lirmm-01382552v1
	SEE on Different Layers of Stacked-SRAMs Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩ Article dans une revue lirmm-01254148v1
	Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩ Article dans une revue lirmm-01254157v1
	Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩ Article dans une revue lirmm-01234448v1
	An SRAM Based Monitor for Mixed-Field Radiation Environments Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩ Article dans une revue lirmm-01234441v1
	90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩ Article dans une revue hal-04056468v1
	Multiple Cell Upset Classification in Commercial SRAMs Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩ Article dans une revue lirmm-01234446v1
	Dynamic Test Methods for COTS SRAMs Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩ Article dans une revue lirmm-01234463v1
	Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩ Article dans une revue lirmm-00805005v1

	Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems Lucas Matana Luza , Daniel Soderstrom , Georgios Tsiligiannis , Helmut Puchner , Carlo Cazzaniga DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩ Communication dans un congrès lirmm-03025736v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland Communication dans un congrès hal-01929267v1
	Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Helmut Puchner RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany Communication dans un congrès lirmm-01337405v1
	A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Rudy Ferraro , Christopher Frost RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩ Communication dans un congrès lirmm-01238397v1
	Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩ Communication dans un congrès hal-01932433v1
	Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩ Communication dans un congrès lirmm-01238392v1
	Impact of Stacked-Layer Structure on SEE Rate of SRAMs Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States Communication dans un congrès lirmm-01238384v1
	Presentation of the MTCube CubeSat Project Viyas Gupta , Luigi Dilillo , Frédéric Wrobel , Ali Mohammad Zadeh , Muriel Bernard 4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain Communication dans un congrès lirmm-01272951v1
	Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components Alexandre Louis Bosser , Luigi Dilillo , Viyas Gupta , Arto Javanainen , Heikki Kettunen Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland Communication dans un congrès lirmm-01238439v1
	Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications Helmut Puchner , Georgios Tsiligiannis , Luigi Dilillo SEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States Communication dans un congrès lirmm-01297441v1
	Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès lirmm-01237709v1
	Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès lirmm-01237660v1
	Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩ Communication dans un congrès lirmm-00839046v1
	Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩ Communication dans un congrès lirmm-00839062v1
	Temperature Impact on the Neutron SER of a Commercial 90nm SRAM Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4 Communication dans un congrès lirmm-00805291v1
	SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations Georgios Tsiligiannis , Elena Ioana Vatajelu , Luigi Dilillo , Alberto Bosio , Patrick Girard IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩ Communication dans un congrès lirmm-00818955v1
	On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩ Communication dans un congrès lirmm-01238413v1
	SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩ Communication dans un congrès lirmm-00839085v1
	Evaluating An SEU Monitor For Mixed-Field Radiation Environments Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France Communication dans un congrès lirmm-01238433v1
	Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France Communication dans un congrès hal-01935785v1
	A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 Communication dans un congrès lirmm-00805163v1
	Dynamic Mode Testing of SRAMS under Neutron Radiation Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial Sixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France Communication dans un congrès lirmm-00807053v1
	Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 Communication dans un congrès lirmm-00805165v1
	Radiation Induced Effects on Electronic Systems and ICs Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch SETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy Communication dans un congrès lirmm-00807055v1
	Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial IOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩ Communication dans un congrès lirmm-00805373v1
	SRAM testing under Neutron Radiation for the evaluation of different algorithms stress Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial 15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France Communication dans un congrès lirmm-00807054v1

	Investigating Multiple-Cell-Upsets on a 90mn SRAM Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch Colloque GDR SoC-SiP, 2013, Lyon, France. 2013 Poster de conférence lirmm-00839108v1

Luigi Dilillo

Présentation

Publications

On the evaluation of FPGA radiation benchmarks

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Methodologies for the Statistical Analysis of Memory Response to Radiation

Soft errors in commercial off-the-shelf static random access memories

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

SEE on Different Layers of Stacked-SRAMs

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

An SRAM Based Monitor for Mixed-Field Radiation Environments

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Multiple Cell Upset Classification in Commercial SRAMs

Dynamic Test Methods for COTS SRAMs

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory

Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions

Impact of Stacked-Layer Structure on SEE Rate of SRAMs

Presentation of the MTCube CubeSat Project

Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation

Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments

Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode

Temperature Impact on the Neutron SER of a Commercial 90nm SRAM

SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators

Evaluating An SEU Monitor For Mixed-Field Radiation Environments

Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation

A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons

Dynamic Mode Testing of SRAMS under Neutron Radiation

Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation

Radiation Induced Effects on Electronic Systems and ICs

Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation

SRAM testing under Neutron Radiation for the evaluation of different algorithms stress

Investigating Multiple-Cell-Upsets on a 90mn SRAM