CV Accueil - Archive ouverte HAL

Publications

	Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs Luigi Dilillo , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel VLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336 Communication dans un congrès lirmm-00324151v1

	SoC Yield Improvement for Future Nanoscale Technologies Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard ETS 2009 - 14th IEEE European Test Symposium \| PhD Forum, May 2009, Sevilla, Spain. 2009 Poster de conférence lirmm-00433798v1