Documentation
Français (FR)

Anglais (EN)

LD

Luigi Dilillo

18

Documents

Identifiants chercheurs

luigi-dilillo
IdRef : 18891885X
0000-0002-1295-2688

Présentation

Publications

775790

	Neutron-Induced Effects on a Self-Refresh DRAM Lucas Matana Luza , Daniel Söderström , Helmut Puchner , Rubén García Alía , Manon Letiche Microelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩ Article dans une revue lirmm-03435635v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩ Article dans une revue lirmm-02007922v1
	Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩ Article dans une revue lirmm-01382552v1
	Methodologies for the Statistical Analysis of Memory Response to Radiation Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩ Article dans une revue lirmm-01382508v1
	Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩ Article dans une revue lirmm-01254157v1
	SEE on Different Layers of Stacked-SRAMs Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩ Article dans une revue lirmm-01254148v1
	Dynamic Test Methods for COTS SRAMs Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩ Article dans une revue lirmm-01234463v1
	Multiple Cell Upset Classification in Commercial SRAMs Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩ Article dans une revue lirmm-01234446v1

	Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems Lucas Matana Luza , Daniel Soderstrom , Georgios Tsiligiannis , Helmut Puchner , Carlo Cazzaniga DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩ Communication dans un congrès lirmm-03025736v1
	Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM Lucas Matana Luza , Daniel Soderstrom , Helmut Puchner , Ruben Garcia Alia , Manon Letiche DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩ Communication dans un congrès lirmm-03025721v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland Communication dans un congrès hal-01929267v1
	Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Helmut Puchner RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany Communication dans un congrès lirmm-01337405v1
	A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Rudy Ferraro , Christopher Frost RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩ Communication dans un congrès lirmm-01238397v1
	Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩ Communication dans un congrès hal-01932433v1
	Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩ Communication dans un congrès lirmm-01238392v1
	Impact of Stacked-Layer Structure on SEE Rate of SRAMs Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States Communication dans un congrès lirmm-01238384v1
	Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès lirmm-01237660v1
	Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications Helmut Puchner , Georgios Tsiligiannis , Luigi Dilillo SEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States Communication dans un congrès lirmm-01297441v1