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Luigi Dilillo

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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , André Martins Pio de Mattos , Lucas Matana Luza , Carlo Cazzaniga , Maria Kastriotou
DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Communication dans un congrès lirmm-03833983v1