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Luigi Dilillo
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Documents
Identifiants chercheurs
- luigi-dilillo
- IdRef : 18891885X
- 0000-0002-1295-2688
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Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural NetworksIEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩
Article dans une revue
lirmm-03382380v1
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Neutron-Induced Effects on a Self-Refresh DRAMMicroelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
Article dans une revue
lirmm-03435635v1
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On the evaluation of FPGA radiation benchmarksMicroelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩
Article dans une revue
lirmm-03382368v1
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-ChipDFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Communication dans un congrès
lirmm-03833983v1
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Characterization of a RISC-V System-on-Chip under Neutron RadiationDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
Communication dans un congrès
lirmm-03357515v1
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