Jean-Marc Galliere

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Présentation

"sandrine-bernardini"

	Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror S. Bernardini , P. Masson , Jean-Michel Portal , Jean-Marc J.-M. Galliere , Michel Renovell LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17 Communication dans un congrès lirmm-00108659v1