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Number of documents

10

Frédéric Houzé


J Alvarez   

Journal articles3 documents

  • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy. Diamond and Related Materials, Elsevier, 2007, 16, pp.1074-1077. ⟨hal-00320360⟩
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond and Related Materials, Elsevier, 2006, 15, pp.618-621. ⟨hal-00320285⟩
  • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy. Superlattices and Microstructures, Elsevier, 2006, 40, pp.343-349. ⟨hal-00320288⟩

Conference papers7 documents

  • José Alvarez, Frédéric Houzé, Pascal Chrétien, Jean-Paul Kleider, C. Bazin, et al.. Local photoconductivity on Schottky diamond photodetectors measured by conducting probe atomic force microscopy. Diamond' 2006 (17th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2006, Portugal. ⟨hal-00320301⟩
  • José Alvarez, Jean-Paul Kleider, Frédéric Houzé, Pascal Chrétien, M. Liao, et al.. Mesures locales de photoconductivité par AFM à pointe conductrice sur des dispositifs métal-semiconducteur-métal à base de diamant. Réunion Annuelle VEECO des Utilisateurs d'AFM, 2006, France. ⟨hal-00320320⟩
  • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy. E-MRS 2006, 2006, France. ⟨hal-00320298⟩
  • José Alvarez, Jean-Paul Kleider, Frédéric Houzé, M. Liao, Y. Koide. Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured byconducting probe atomic force microscopy. 17th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, Nitrides & Silicon Carbide, Diamond 2006, 2006, Portugal. ⟨hal-00321918⟩
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond 2005, 2005, France. ⟨hal-00321568⟩
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond 2005, 2005, France. ⟨hal-00321705⟩
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond' 2005 (16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2005, France. ⟨hal-00320238⟩