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Frédéric Houzé

10

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jose-alvarez

	Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy José Alvarez , Frédéric Houzé , Jean-Paul Kleider , M. Liao , Y. Koide Diamond and Related Materials, 2007, 16, pp.1074-1077 Article dans une revue hal-00320360v1
	Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy Frédéric Houzé , José Alvarez , Jean-Paul Kleider , P. Bergonzo , E. Snidero Diamond and Related Materials, 2006, 15, pp.618-621 Article dans une revue hal-00320285v1
	Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy José Alvarez , Frédéric Houzé , Jean-Paul Kleider , M. Liao , Y. Koide Superlattices and Microstructures, 2006, 40, pp.343-349 Article dans une revue hal-00320288v1

	Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy José Alvarez , Frédéric Houzé , Jean-Paul Kleider , M. Liao , Y. Koide E-MRS 2006, 2006, France Communication dans un congrès hal-00320298v1
	Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured byconducting probe atomic force microscopy José Alvarez , Jean-Paul Kleider , Frédéric Houzé , M. Liao , Y. Koide 17th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, Nitrides & Silicon Carbide, Diamond 2006, 2006, Portugal Communication dans un congrès hal-00321918v1
	Mesures locales de photoconductivité par AFM à pointe conductrice sur des dispositifs métal-semiconducteur-métal à base de diamant José Alvarez , Jean-Paul Kleider , Frédéric Houzé , Pascal Chrétien , M. Liao Réunion Annuelle VEECO des Utilisateurs d'AFM, 2006, France Communication dans un congrès hal-00320320v1
	Local photoconductivity on Schottky diamond photodetectors measured by conducting probe atomic force microscopy José Alvarez , Frédéric Houzé , Pascal Chrétien , Jean-Paul Kleider , C. Bazin Diamond' 2006 (17th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2006, Portugal Communication dans un congrès hal-00320301v1
	Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy Frédéric Houzé , José Alvarez , Jean-Paul Kleider , P. Bergonzo , E. Snidero Diamond 2005, 2005, France Communication dans un congrès hal-00321568v1
	Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy Frédéric Houzé , José Alvarez , Jean-Paul Kleider , P. Bergonzo , E. Snidero Diamond' 2005 (16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2005, France Communication dans un congrès hal-00320238v1
	Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy Frédéric Houzé , José Alvarez , Jean-Paul Kleider , P. Bergonzo , E. Snidero Diamond 2005, 2005, France Communication dans un congrès hal-00321705v1