Co-auteurs

Nombre de documents

95

Frédéric Houzé


Article dans une revue27 documents

  • Nicolas Jamond, Pascal Chrétien, Lina Gatilova, Elisabeth Galopin, Laurent Travers, et al.. Energy harvesting efficiency in GaN nanowire-based nanogenerators: the critical influence of the Schottky nanocontact. Nanoscale, Royal Society of Chemistry, 2017, 9 (13), pp.4610 - 4619. 〈10.1039/c7nr00647k〉. 〈hal-01501840〉
  • Noëlle Gogneau, Nicolas Jamond, Pascal Chrétien, Frédéric Houzé, Elie Lefeuvre, et al.. From single III-nitride nanowires to piezoelectric generators: New route for powering nomad electronics. Semiconductor Science and Technology, IOP Publishing, 2016, 31, pp.103002. 〈10.1088/0268-1242/31/10/103002〉. 〈hal-01390955〉
  • Aymeric Vecchiola, Pascal Chrétien, Sophie Delprat, Karim Bouzehouane, Olivier Schneegans, et al.. Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode. Applied Physics Letters, American Institute of Physics, 2016, 108, pp.243101. 〈http://scitation.aip.org/content/aip/journal/apl/108/24/10.1063/1.4953870〉. 〈10.1063/1.4953870〉. 〈cea-01331971〉
  • N Jamond, P Chrétien, F Houzé, Lu Lu, L Largeau, et al.. Piezo-generator integrating a vertical array of GaN nanowires. Nanotechnology, Institute of Physics, 2016, 27, pp.325403. 〈10.1088/0957-4484/27/32/325403〉. 〈hal-01390969〉
  • Alexis Peschot, Maxime Vincent, Christophe Poulain, Denis Mariolle, Frédéric Houzé, et al.. Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches. Sensing and Imaging: An International Journal, Springer Verlag, 2015, 16, pp.21. 〈10.1007/s11220-015-0124-1〉. 〈hal-01235862〉
  • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects. Applied Physics Letters, American Institute of Physics, 2014, 104 (8), pp.083108. 〈10.1063/1.4866607〉. 〈hal-01093500〉
  • Noelle Gogneau, Pascal Chrétien, Elisabeth Galopin, Stephane Guilet, Laurent Travers, et al.. Impact of the GaN nanowire polarity on energy harvesting. Applied Physics Letters, American Institute of Physics, 2014, 104 (21), pp.213105. 〈10.1063/1.4880101〉. 〈hal-01096617〉
  • Noelle Gogneau, Pascal Chrétien, Elisabeth Galopin, Stephane Guilet, Laurent Travers, et al.. GaN nanowires for piezoelectric generators. physica status solidi (RRL) - Rapid Research Letters, Wiley-VCH Verlag, 2014, 8 (5), pp.414-419. 〈10.1002/pssr.201409105〉. 〈hal-01093504〉
  • Fanny Hauquier, David Alamarguy, Pascal Viel, Sophie Noël, Arianna Filoramo, et al.. Conductive-probe AFM characterisation of graphene sheets bonded to gold surfaces. Applied Surface Science, Elsevier, 2012, 258, pp.2920- 2926. 〈10.1016/j.apsusc.2011.10.152〉. 〈cea-00960581〉
  • Fanny Hauquier, David Alamarguy, Sophie Noël, Frédéric Houzé, P. Viel, et al.. Conductive-probe AFM characterization of graphene sheets bonded to gold surfaces. Applied Surface Science, Elsevier, 2012, 258 (7), pp.2920-2926. 〈10.1016/j.apsusc.2011.10.152〉. 〈hal-00777865〉
  • A. Mdarhri, D. Alamarguy, F. Houzé, S. Noël, S. Volz, et al.. Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotubes materials. Composites Part B: Engineering, Elsevier, 2011, 42, pp.2098-2104. 〈10.1016/j.compositesb.2011.05.003〉. 〈hal-00626568〉
  • Maguy Dominiczak, Larissa Otubo, David Alamarguy, Frédéric Houzé, Sebastian Volz, et al.. Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy. Nanoscale Research Letters, SpringerOpen, 2011, 6, pp.335-347. 〈10.1186/1556-276X-6-335〉. 〈halshs-00587572〉
  • M. Vincent, S. W. Rowe, C. Poulain, L. Chiesi, Frédéric Houzé, et al.. Field emission and material transfer in microswitches electrical contacts. Applied Physics Letters, American Institute of Physics, 2010, 97 (26), pp.263503. 〈10.1063/1.3529474〉. 〈hal-00554768〉
  • Erwan Tranvouez, E. Boer-Duchemin, A.J. Mayne, T. Vanderbruggen, M. Scheele, et al.. Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy. Journal of Applied Physics, American Institute of Physics, 2009, 106 (5), pp. 054301-1 054301-7. 〈hal-00444497〉
  • E. Moyen, M. Macé, G. Agnus, A. Fleurence, T. Maroutian, et al.. Metal-rich Au-silicide nanoparticles for use in nanotechnology. Applied Physics Letters, American Institute of Physics, 2009, 94, pp.233101. 〈hal-00413540〉
  • Sophie Noël, David Alamarguy, Frédéric Houzé, A. Benedetto, P. Viel, et al.. Nanocomposite thin films for surface protection in electrical contact applications. IEEE Transactions on Components and Packaging Technologies, Institute of Electrical and Electronics Engineers, 2009, 32 (2), pp. 358-364. 〈hal-00444495〉
  • Sophie Noël, David Alamarguy, Frédéric Houzé, Alessandro Benedetto, Pascal Viel, et al.. Nanocomposite thin films for surface protection in electrical contact applications. IEEE Transactions on Components and Packaging Technologies, Institute of Electrical and Electronics Engineers, 2009, 32, pp.358-364. 〈10.1109/TCAPT.2008.2011915〉. 〈cea-01022834〉
  • David Alamarguy, Alessandro Benedetto, Mirela Balog, Sophie Noël, Pascal Viel, et al.. Tribological and electrical study of Fluorinated Diazonium Films as dry lubricants for electrical contacts. Surface and Interface Analysis, Wiley-Blackwell, 2008, 40, pp.802-805. 〈10.1002/sia.2775〉. 〈cea-01056595〉
  • David Alamarguy, Alessandro Benedetto, M. Balog, P. Viel, F. Le Derf, et al.. Tribological and electrical study of Fluorinated Diazonium Films as dry lubricants for electrical contacts. Surface and Interface Analysis, Wiley-Blackwell, 2008, 40, pp.802. 〈hal-00351337〉
  • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy. Diamond and Related Materials, Elsevier, 2007, 16, pp.1074-1077. 〈hal-00320360〉
  • Olivier Schneegans, Frédéric Houzé, Pascal Chrétien, René Meyer. Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy. Applied Physics Letters, American Institute of Physics, 2007, 90, pp.043116. 〈hal-00320357〉
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond and Related Materials, Elsevier, 2006, 15, pp.618-621. 〈hal-00320285〉
  • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy. Superlattices and Microstructures, Elsevier, 2006, 40, pp.343-349. 〈hal-00320288〉
  • Frédéric Houzé, Pascal Chrétien, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode. Applied Physics Letters, American Institute of Physics, 2005, 86, pp.123103. 〈hal-00320223〉
  • Olivier Schneegans, Lionel Boyer, Frédéric Houzé, René Meyer, Pascal Chrétien. “ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy. Journal of Vacuum Science and Technology B, 2002, 20, pp.1929. 〈hal-00098202〉
  • C. Guedj, J. Boulmer, D. Bouchier, C. Clerc, G. Calvarin, et al.. Bulk and surface structural properties of Si$_{1-x-y}$Ge$_x$C$_y$ layers processed on Si(001) by pulsed laser induced epitaxy. Applied Surface Science, Elsevier, 1996, 102, pp.28-32. 〈in2p3-00000499〉
  • Pascal Newton, Frédéric Houzé, Sophie Noël, Lionel Boyer, Pascal Viel, et al.. Élaboration et caractérisation chimique, topographique, tribologique et électrique de films de polyacrylonitrile post-traités en vue d'applications en connectique. Journal de Physique III, EDP Sciences, 1995, 5 (6), pp.661-675. 〈10.1051/jp3:1995153〉. 〈jpa-00249338〉

Communication dans un congrès54 documents

  • L. Lu, N. Jamond, E. Lefeuvre, P. Chrétien, F. Houzé, et al.. High Sensitivity Piezogenerator Based on GaN Nanowires. Eurosensors 2017, Sep 2017, Paris, France. 1 (4), pp.587, MDPI Proceedings 2017. 〈10.3390/proceedings1040587〉. 〈hal-01591362〉
  • Nicoletta Jegenyes, Martina Morassi, Pascal Chrétien, Laurent Travers, L Lu, et al.. Piezoelectric conversion with InGaN/GaN nanowire heterostructures. 12th International Conference on Nitride Semiconductors - ICNS 12, Jul 2017, Strasbourg, France. 〈hal-01591417〉
  • Romaric Landfried, Frédéric Houzé, Thierry Leblanc, Philippe Teste. Power flux brought by an electric arc on AgSnO2 electrodes. 63rd IEEE Holm Conference on Electrical Contacts, Sep 2017, Denver, United States. pp.204-207, Proceedings of the 63rd IEEE Holm Conference on Electrical Contacts. 〈hal-01591486〉
  • Florent Loete, Guy-Leon Kaza, Philippe Testé, Romaric Landfried, Frédéric Houzé, et al.. Étude expérimentale du contact électrique roue/rail. XIIIème Colloque sur les Arcs Electriques et Workshop Arcs et Contacts Electriques (CAE XIII ACE 2017), Mar 2017, Nancy, France. 〈hal-01481567〉
  • Philippe Testé, Romaric Landfried, Frédéric Houzé, Aurélien Fouque, Georges Cailletaud, et al.. Détermination des caractéristiques du flux de puissance apporté à des électrodes en AgSnO2 par un arc non stationnaire dans l’air. XIIIème Colloque sur les Arcs Electriques et Workshop Arcs et Contacts Electriques (CAE XIII ACE 2017), Mar 2017, Nancy, France. 〈hal-01481584〉
  • Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Imagerie de résistance électrique locale sur matériaux fragiles par microscopie à force atomique à pointe conductrice en mode contact intermittent. 19e Forum des Microscopies à Sonde Locale, Mar 2016, Sochaux-Montbéliard, France. Actes du 19e Forum des Microscopies à Sonde Locale. 〈hal-01317747〉
  • Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126, NANOTECH FRANCE 2016 - International Nanotechnology Conference. 〈hal-01320255〉
  • Noëlle Gogneau, Nicolas Jamond, Laurent Travers, Jean-Christophe Harmand, Frank Glas, et al.. “Piezo-Generator Integrating Vertical Array of GaN Nanowires: A new alternative energy source for nomad electronics”. WTE 2016, Oct 2016, Paris-Saclay, France. 〈hal-01631168〉
  • Noelle Gogneau, Nicolas Jamond, Pascal Chrétien, Frédéric Houzé, Elisabeth Galopin, et al.. GaN nanowires for piezoelectric energy harvesting : Towards wireless sensors. Energy Materials Nanotechnology (EMN) Spring Meeting 2016, Mar 2016, Taipei, Taiwan. 〈hal-01315747〉
  • Pascal Chrétien, Sophie Noël, Alexandre Jaffré, Frédéric Houzé, David Brunel, et al.. Electrical and structural mapping of friction induced defects in graphene layers. 62nd IEEE Holm Conference on Electrical Contacts, Oct 2016, Clearwater Beach, United States. Proceedings of the 62nd IEEE Holm Conference on Electrical Contacts. 〈hal-01332589〉
  • Kevin Dalla-Francesca, Sophie Noël, David Brunel, Frédéric Houzé, Pascal Chrétien, et al.. Soft ultrasonic exfoliation of multilayer graphene for an application to electrical contacts. 28th International Conference on Electric Contacts (ICEC2016), Jun 2016, Edinburgh, United Kingdom. pp.225-230, Proceedings of the 28th International Conference on Electric Contacts (ICEC2016). 〈hal-01332540〉
  • L. Lu, N. Jamond, Pascal Chrétien, F. Houzé, L. Travers, et al.. Nitride Nanowires: From Rigid to Flexible Piezo-generators. PowerMEMS 2016, Dec 2016, Paris, France. Journal of Physics: Conference Series, 773, 2016, 16th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2016) 6–9 December 2016, Paris, France. 〈10.1088/1742-6596/773/1/012010〉. 〈hal-01653358〉
  • Vladislav Yastrebov, Georges Cailletaud, Sophie Noël, Frederick Sorel Mballa Mballa, Henry Proudhon, et al.. Three-level multi-scale modeling of electrical contacts - sensitivity study and experimental validation. 61st IEEE Holm Conference on Electrical Contacts, Oct 2015, San Diego, United States. IEEE, pp.414-422, 2015, Proceedings of the 61st IEEE Holm Conference on Electrical Contacts. 〈10.1109/HOLM.2015.7355130〉. 〈hal-01218663〉
  • Nicolas Jamond, Laurent Travers, Franck Glas, Noelle Gogneau, Pascal Chrétien, et al.. GaN nanowires based piezogenerator - Investigation of the GaN nanowires potentiality for the development of piezogenerators . Cinquièmes Journées Nationales sur la Récupération et le Stockage d'Energie , May 2015, Orsay, France. pp.21-22, JNRSE'2015. 〈hal-01258276〉
  • N. Jamond, Pascal Chrétien, E. Galopin, L. Travers, J.C. Harmand, et al.. Piezoelectric Potential of GaN Nanowires: Towards Efficient Output Piezo-generators. Atelier Nucléation Croissance et Surfaces Hétérogènes du GDR PULSE (Processus ULtimes en épitaxie de SEmiconducteurs), Apr 2014, Valbonne, France. Actes de l'Atelier Nucléation Croissance et Surfaces Hétérogènes du GDR PULSE. 〈hal-01099228〉
  • Kevin Dalla-Francesca, Sophie Noël, Aymeric Vecchiola, Frédéric Houzé, Pascal Chrétien, et al.. Electrical characterization of graphene-like films at microscopic and macroscopic scale. IEEE Holm 2014, Oct 2014, New Orleans, United States. Proceedings of 60th IEEE Holm Conference on Electrical Contacts, pp.116-123. 〈hal-01099230〉
  • Aymeric Vecchiola, Frédéric Houzé, Pascal Chrétien, Olivier Schneegans. Avancées récentes sur les mesures de résistance électrique locale par AFM à pointe conductrice en contact intermittent. 17e Forum des Microscopies à Sonde Locale, Mar 2014, Montauban, France. Actes du 17e Forum des Microscopies à Sonde Locale, pp.114 - 115. 〈hal-01093608〉
  • Vladislav Yastrebov, G. Anciaux, Frederick Mballa Mballa, Georges Cailletaud, Jean-François Molinari, et al.. Multi-physical contact between elastic and elasto-plastic solids with fractal surfaces. MMM 2014, Oct 2014, Berkeley, United States. Proceedings of the 7th International Conference on Multiscale Materials Modeling, pp.284. 〈hal-01099232〉
  • Frederick Mballa Mballa, Vladislav Yastrebov, Frédéric Houzé, Georges Cailletaud, Sophie Noël, et al.. Multiscale modeling of electrical contacts. MPMS 2014, Oct 2014, Palaiseau, France. Proceedings of the International colloquium of mechanics "Multi-physics modeling of solids". 〈hal-01099234〉
  • Aymeric Vecchiola, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé, Karim Bouzehouane, et al.. Mesures électriques locales par AFM en mode intermittent. Journées Nationales en Nanosciences et Nanotechnologies J3N 2013, Nov 2013, Marseille, France. 〈hal-00927020〉
  • Aymeric Vecchiola, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Imagerie de résistance électrique locale par AFM à pointe conductrice en mode contact intermittent. NANORGASOL 2013, Nov 2013, Mèze, France. pp.14, 2013. 〈hal-00927019〉
  • Aymeric Vecchiola, Olivier Schneegans, Pascal Chrétien, Frédéric Houzé. Développement d'une imagerie de résistance électrique locale par AFM à pointe conductrice en mode contact intermittent. Forum 2013 des Microscopies à Sonde Locale, Mar 2013, Spa, Belgique. pp.124-125, 2013. 〈hal-00927018〉
  • Pascal Chrétien, Aymeric Vecchiola, Olivier Schneegans, Frédéric Houzé, Karim Bouzehouane, et al.. Mesures électriques locales par AFM en mode intermittent. Journées Nationales en Nanosciences et Nanotechnologies- J3N2012, Nov 2012, Bordeaux, France. 〈hal-00778776〉
  • Frédéric Houzé, Philippe Testé, Florent Loete, Richard Andlauer, Hugues Chollet, et al.. Electrical behaviour of the wheel-rail contact. ICEC 2012, May 2012, Beijing, China. pp.67-72, 2012. 〈hal-00778767〉
  • Hugues Chollet, Frédéric Houzé, Philippe Testé, Florent Loete, Xavier Lorang, et al.. Observation of Branly's effect during shunting experiments on scaled wheel-rail contacts. 9th International Conference on Contact Mechanics and Wear of Rail/Wheel Systems, Aug 2012, Chengdu, China. pp.111-114, 2012. 〈hal-00778780〉
  • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Optimisation de la mesure de capacité électrique locale absolue par AFM à sonde conductrice. 14e Forum des Microscopies à Sonde Locale, Mar 2011, Ecully, France. pp.87, 2011. 〈hal-00710620〉
  • M Vincent, S. W. Row, C Poulain, L Chiesi, Frédéric Houzé, et al.. Apport du microscope à force atomique pour l\'étude de certains phénomènes relatifs aux micro-contacts électriques. Forum des Microscopies à Sonde Locale 2011, Mar 2011, Ecully, France. pp.88, 2011. 〈hal-00710617〉
  • Fanny Hauquier, David Alamarguy, Laurent Baraton, P Viel, Sophie Noël, et al.. Conductive-probe AFM characterization of graphene sheets chemically grafted on gold surfaces. GRAPHITA 2011, May 2011, Assergi-Ligano, Italy. pp.PB1, 2011. 〈hal-00710616〉
  • Sophie Noël, David Alamarguy, Fanny Hauquier, Frédéric Houzé, P. Viel, et al.. Electrical conduction properties of molecular ultra-thin layers in a nanocontact. 25th ICEC and 56th Holm Conference on Electrical Contacts, Oct 2010, Charleston, United States. pp.380-386, 2010. 〈hal-00554771〉
  • M. Vincent, L. Chiesi, P. Rousset, C. Lapierre, C. Poulain, et al.. An original apparatus for endurance testing of MEMS electrical contact materials. 55th Holm Conference on Electrical Contacts, Sep 2009, Vancouver, Canada. pp. 285-289, 2009. 〈hal-00445399〉
  • Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Avancées successives sur la mesure de résistance électrique locale par AFM à pointe conductrice. Forum 2009 des microscopies à sonde locale, Mar 2009, Hardelot, France. pp. 94-95, 2009. 〈hal-00445404〉
  • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Mesures de capacité absolue par AFM à pointe conductrice. Forum 2009 des microscopies à sonde locale, Mar 2009, Hardelot, France. pp. 56-57, 2009. 〈hal-00445402〉
  • J. Bai, Frédéric Houzé, Ahmed Mdarhri, David Alamarguy, Sophie Noël, et al.. Étude multi-échelle des mécanismes de transport dans des nanostructures à base de nanotubes de carbone. Colloque Carnot, Oct 2009, Paris, France. p. 9, 2009. 〈hal-00445401〉
  • Pascal Chrétien, Ivan Estevez, Olivier Schneegans, Frédéric Houzé. The Resiscope module for DC conductivity measurements by AFM : an overview of performances and some various applications. International SPM Usermeeting, May 2008, Barcelone, Spain. pp.CD-ROM Proceedings, 2008. 〈hal-00351356〉
  • M. Vincent, L. Chiesi, J.-C. Fourrier, A. Garnier, B. Grappe, et al.. Electrical contact reliability in a magnetic MEMS switch. 54th Holm Conference on Electrical Contacts, Oct 2008, Orlando, United States. pp.145, 2008. 〈hal-00351428〉
  • Alexis Poizat, Michèle Nsoumbi, Philippe Testé, Frédéric Houzé, Richard Andlauer, et al.. Contribution to the observation of the effective electrical contact area with the help of a space time resolved thermal camera. 24 th Int. Conf. on Elec. Contacts ICEC 2008, Jun 2008, St Malo, France. pp.CD-ROM Proceedings, 2008. 〈hal-00351387〉
  • Patrice Retho, Alexis Poizat, Richard Andlauer, J.-S. Lefrileux, Frédéric Houzé, et al.. Resistance and contact force measurements on a miniature multi-contact stacking connector. Journée 'La Connectique : état de l'art et perspectives' organisée par IMAPS-France, Oct 2008, La Défense, France. 2008. 〈hal-00351432〉
  • Ivan Estevez, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé. Mesures de capacité absolue par AFM à pointe conductrice: problématique et avancées récentes. Journées du GDR Micro Nano Systèmes, Dec 2008, Montpellier, France. 2008. 〈hal-00353331〉
  • David Alamarguy, Alessandro Benedetto, M. Balog, Sophie Noël, P. Viel, et al.. Tribological and electrical study of Fluorinated Diazonium Films as dry lubricants for electrical contacts. ECASIA 07, 12th European Conf. on Appl. Surf. and Interf. Anal., 2007, Belgium. 2007. 〈hal-00320386〉
  • Sophie Noël, David Alamarguy, Frédéric Houzé, Alessandro Benedetto, P. Viel, et al.. Nanocomposite thin films for surface protection in electrical contact applications. 53rd IEEE Holm Conference, 2007, United States. pp.160-166, 2007. 〈hal-00320371〉
  • Olivier Schneegans, Frédéric Houzé, Pascal Chrétien. Mesures de capacités plan/plan dans la gamme 1pF-1fF : mise en évidence des effets de bord, proposition d'un modèle et confrontation à des simulations numériques. Réunion Annuelle VEECO des Utilisateurs d'AFM, 2006, France. 2006. 〈hal-00320315〉
  • José Alvarez, Jean-Paul Kleider, Frédéric Houzé, Pascal Chrétien, M. Liao, et al.. Mesures locales de photoconductivité par AFM à pointe conductrice sur des dispositifs métal-semiconducteur-métal à base de diamant. Réunion Annuelle VEECO des Utilisateurs d'AFM, 2006, France. 2006. 〈hal-00320320〉
  • José Alvarez, Jean-Paul Kleider, Frédéric Houzé, M. Liao, Y. Koide. Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured byconducting probe atomic force microscopy. 17th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, Nitrides & Silicon Carbide, Diamond 2006, 2006, Portugal. 〈hal-00321918〉
  • José Alvarez, Frédéric Houzé, Jean-Paul Kleider, M. Liao, Y. Koide. Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy. E-MRS 2006, 2006, France. 2006. 〈hal-00320298〉
  • José Alvarez, Frédéric Houzé, Pascal Chrétien, Jean-Paul Kleider, C. Bazin, et al.. Local photoconductivity on Schottky diamond photodetectors measured by conducting probe atomic force microscopy. Diamond' 2006 (17th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2006, Portugal. 2006. 〈hal-00320301〉
  • Alessandro Benedetto, P. Viel, Sophie Noël, Frédéric Houzé, Serge Palacin. Carbon nanotubes/fluorinated polymers nanocomposite thin films for electrical contacts lubrication. ECOSS'24 (24th European Conference on Surface Science), 2006, France. 2006. 〈hal-00320312〉
  • Alessandro Benedetto, David Alamarguy, N. Izard, P. Chenevier, P. Viel, et al.. Films minces nanocomposites à base de nanotubes de carbone et polymères fluorés pour la lubrification des contacts électriques. Conférence Matériaux, 2006, France. 〈hal-00320332〉
  • Frédéric Houzé, D. Mariolle, F. Bertin, Pascal Chrétien, Olivier Schneegans. Caractérisation de profils de dopage par imagerie de résistance locale à faible force. 8ème Forum des Microscopies à Sonde Locale, 2005, France. 2005. 〈hal-00320231〉
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond 2005, 2005, France. 〈hal-00321568〉
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond 2005, 2005, France. 〈hal-00321705〉
  • J.C. Villégier, Annick Dégardin, B. Guillet, Frédéric Houzé, Alain Kreisler, et al.. Fabrication of high-Tc superconducting hot electron bolometers for terahertz mixer applications. SPIE Optoeletronics 2005, 2005, United States. 2005. 〈hal-00320229〉
  • Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond' 2005 (16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2005, France. 2005. 〈hal-00320238〉
  • Pascal Chrétien, Frédéric Houzé, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode. Xtip'05, 2005, France. 2005. 〈hal-00320256〉
  • Pascal Chrétien, Olivier Schneegans, Frédéric Houzé, René Meyer, Lionel Boyer. Simultaneous height, resistance and capacitance cartography of a SRAM test sample by conducting probe AFM. Seing at the Nanoscale II, 2004, France. 2004. 〈hal-00320180〉

Poster7 documents

  • Aymeric Vecchiola, Pascal Chrétien, Noelle Gogneau, Karim Bouzehouane, Olivier Schneegans, et al.. Formation de matière sur des surfaces imagées par AFM en mode intermittent : un artefact inattendu. 19e Forum des Microscopies à Sonde Locale, Mar 2016, Sochaux-Montbéliard, France. Actes du 19e Forum des Microscopies à Sonde Locale. 〈hal-01317764〉
  • Nicolas Jamond, Pascal Chrétien, Frédéric Houzé, Laurent Travers, Franck Glas, et al.. GaN nanowires based piezogenerator . Nanowires 2015, Oct 2015, Barcelone, Spain. pp.110, Nanowires 2015 - Book of Abstracts - Poster Sessions. 〈hal-01258198〉
  • Kevin Dalla-Francesca, Sophie Noël, Frédéric Houzé, David Alamarguy, Alexandre Jaffré. Caractérisations morphologique et électrique de graphène déposé par voie liquide. 17e Forum des Microscopies à Sonde Locale, Mar 2014, Montauban, France. Actes du 17e Forum des Microscopies à Sonde Locale, pp.140 - 141. 〈hal-01093610〉
  • Kevin Dalla-Francesca, Sophie Noël, Frédéric Houzé, David Alamarguy, Alexandre Jaffré. Morphological and electrical characterizations of graphene exfoliated by liquid way. Graphene Conference 2014, May 2014, Toulouse, France. Proceedings of the 4th edition of Graphene Conference. 〈hal-01099345〉
  • Nicolas Jamond, Pascal Chrétien, L Largeau, Olivia Mauguin, Elisabeth Galopin, et al.. Effect of the AlN interfacial layer on the piezoelectric properties of GaN nanowires. Réunion plénière des GDR PULSE (Processus ULtimes en épitaxie de SEmiconducteurs) et NNS (NanoFils, Nanotubes, Semiconducteurs), Oct 2014, Toulouse, France. 〈hal-01338879〉
  • Aymeric Vecchiola, Pascal Chrétien, Olivier Schneegans, Frédéric Houzé, Karim Bouzehouane, et al.. Mesures électriques locales par AFM en mode intermittent. Journées Nationales Nanosciences et Nanotechnologies (J3N 2014), Nov 2014, Lyon, France. 〈hal-01338861〉
  • Alexis Peschot, Maxime Vincent, Christophe Poulain, Denis Mariolle, Frédéric Houzé, et al.. Conducting probe atomic force microscope as a relevant tool for studying some phenomena in MEMS switches. GreenBAN 2014, Nov 2014, Paris, France. Proceedings of the International Workshop on Green Solutions for Body Area Networks, pp.63 - 66. 〈hal-01099238〉

Chapitre d'ouvrage2 documents

  • Brice Gautier, Pascal Chrétien, Khalifa Aguir, Frédéric Houzé, Olivier Schneegans, et al.. Techniques de mesure de grandeurs électriques adaptées aux nano-circuits. Techniques de l'Ingénieur, Mesures-Analyses / Mesures et tests électroniques pp.R1084 V1, 2016. 〈hal-01432552〉
  • C. Poulain, M. Vincent, L. Chiesi, J. Delamarre, Frédéric Houzé, et al.. Improvement of electrical contacts reliability in a magnetic MEMS switch. Failure analysis - A practical guide for manufacturers of electronic components and systems, John Wiley & Sons Ltd, pp.270-274, 2011. 〈hal-00715286〉

Brevet2 documents

  • Olivier Schneegans, Pascal Chrétien, Frédéric Houzé. Appareil de mesure de la résistance électrique locale d'une surface. N° de brevet: PCT/IB2011/051951. 2011. 〈hal-00715270〉
  • Olivier Schneegans, Pascal Chrétien, Frédéric Houzé. Appareil de mesure de la résistance électrique locale d'une surface. France, N° de brevet: FR 10 01940. 2010. 〈hal-00557019〉

Autre publication3 documents

  • Pascal Chrétien, Frédéric Houzé, Olivier Schneegans. Transfert de savoir-faire pour la mise en forme, la fabrication et la mise sur le marché du Résiscope. Licence de logiciel et de savoir-faire n° L06161 avec la Société CS Instruments. 2007. 〈hal-00320405〉
  • Pascal Chrétien, Frédéric Houzé, Olivier Schneegans, René Meyer, Lionel Boyer. Améliorations apportées au dispositif de mesure rapide de courant et de résistance électrique pouvant varier sur plusieurs décades. Enveloppe Soleau. 2006. 〈hal-00320345〉
  • René Meyer, Frédéric Houzé, Philippe Testé. Réduction de l'inductance propre d'une boucle conductrice, application à la réalisation de contacts pour interposeurs. Enveloppe Soleau. 2005. 〈hal-00320266〉