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Frédéric Houzé

Denis Mencaraglia   

Journal articles2 documents

  • Aymeric Vecchiola, Pascal Chrétien, Sophie Delprat, Karim Bouzehouane, Olivier Schneegans, et al.. Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode. Applied Physics Letters, American Institute of Physics, 2016, 108, pp.243101. ⟨10.1063/1.4953870⟩. ⟨cea-01331971⟩
  • C. Guedj, J. Boulmer, D. Bouchier, C. Clerc, G. Calvarin, et al.. Bulk and surface structural properties of Si$_{1-x-y}$Ge$_x$C$_y$ layers processed on Si(001) by pulsed laser induced epitaxy. Applied Surface Science, Elsevier, 1996, 102, pp.28-32. ⟨in2p3-00000499⟩