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	Porosity and Thickness Characterization of Porous Si and Oxidized Porous Si layers – an ultraviolet-visible-mid Infrared Ellipsometry Study Balint Fodor , Emil Agocs , Benjamin Bardet , Thomas Defforge , Frederic Cayrel Microporous and Mesoporous Materials, 2016, 227, pp.112-120. ⟨10.1016/j.micromeso.2016.02.039⟩ Article dans une revue hal-01784759v1
	Systematic Study of Anodic Etching of Highly Doped N-Type 4H-SiC in Various HF Based Electrolytes Gaël Gautier , Jérôme Biscarrat , Damien Valente , Thomas Defforge , A. Gary Journal of The Electrochemical Society, 2013, 160 (9), pp.D372-D379. ⟨10.1149/2.082309jes⟩ Article dans une revue hal-01810897v1
	Room light anodic etching of highly doped n-type 4 H-SiC in high-concentration HF electrolytes: Difference between C and Si crystalline faces Gaël Gautier , Frédéric Cayrel , Marie Capelle , Jérôme Billoue , Xi Song Nanoscale Research Letters, 2012, 7 (1), pp.367-373. ⟨10.1186/1556-276X-7-367⟩ Article dans une revue hal-01810904v1
	RF Planar Inductor Electrical Performances on N-Type Porous 4H Silicon Carbide Gaël Gautier , Marie Capelle , Jérôme Billoue , Frédéric Cayrel , Patrick Poveda IEEE Electron Device Letters, 2012, 33 (4), pp.477-479. ⟨10.1109/LED.2012.2185478⟩ Article dans une revue hal-01810907v1

Frédéric CAYREL