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FC
Frédéric CAYREL
5
Documents
Identifiants chercheurs
- frederic-cayrel
- IdRef : 094927898
Présentation
Page en construction / Page under construction
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Optimization of VLS Growth Process for 4H-SiC P/N JunctionsMaterials Science Forum, 2016, 858, pp.205-208. ⟨10.4028/www.scientific.net/MSF.858.205⟩
Article dans une revue
hal-01388031v1
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TiAl Ohmic Contact on GaN, in Situ High or Low Doped or Si Implanted, Epitaxially Grown on Sapphire or Siliconphysica status solidi (a), 2012, 209 (6), pp.1059-1066. ⟨10.1002/pssa.201127564⟩
Article dans une revue
hal-01810914v1
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Low temperature (down to 450° C) annealed TiAl contacts on N-type gallium nitride characterized by differential scanning calorimetryphysica status solidi (c), 2011, 8 (2), pp.447--449
Article dans une revue
hal-00763471v1
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Investigations on the origin of the ohmic behavior for Ti/Al based contacts on n-type GaNHeteroSiC & WASMPE 2011, Jun 2011, Tours, France. pp.208-212, ⟨10.4028/www.scientific.net/MSF.711.208⟩
Communication dans un congrès
hal-00747672v1
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Active Devices for Power Electronics: SiC vs III-N Compounds – The Case of Schottky Rectifiers13th International Conference on Silicon Carbide and Related Materials, Oct 2009, Nürnberg, Germany. pp.879-884, ⟨10.4028/www.scientific.net/MSF.645-648.879⟩
Communication dans un congrès
hal-02864869v1
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