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Florent Houdellier

23

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Identifiants chercheurs

florent-houdellier
0000-0002-5272-7792
IdRef : 111155878

Présentation

**Research activities : new instrumental and methodological developments in Transmission Electron Microscopy (TEM)** Since 2022 : In charge of teaching "Advanced geometrical optics" in the 4th year and "Charged particle optics" in the 5th year of the physics department at INSA-Toulouse (70h) 2022 : Accreditation to Supervise Research (Habilitation à Diriger des Recherches-HDR) Since 2020 : CNRS Research Engineer (IRHC) at CEMES-CNRS. 2018-2023 : Director of the CNRS/Hitachi High-Technologies (HHT) Joint laboratory "HC-IUMi" (Hitachi-CNRS Infrastructure for Ultrafast Microscopy) located in CEMES-CNRS, which aims to develop the next generation of ultrafast coherent FE-TEM. 2016-2020 : CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Characterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM). 2007-2016 : CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service 2006 - 2007 : Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope. 2003 - 2006 : PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements 1998 - 2003 : Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics *Some developments, a selective choice :* - *Dark field Electron Holography :* <http://archives.cnrs.fr/inp/article/469> - *New high brightness carbon nanocone CFEG :* <http://archives.cnrs.fr/inp/article/454> - *I2TEM microscope in collaboration with Hitachi High-Technologies (HHT) :*<http://archives.cnrs.fr/inp/article/584>, <https://videotheque.cnrs.fr/visio=4086> - *Partnership between CEMES- CNRS and HHT :* <http://archives.cnrs.fr/inp/article/389> - *New high brightness ultrafast CFEG :* <https://inp.cnrs.fr/fr/cnrsinfo/nouvelle-source-delectrons-pour-la-microscopie-electronique> - *CNRS-HHT joint laboratory :* <http://archives.cnrs.fr/presse/article/5654>, <http://www.cnrs.fr/fr/un-nouveau-microscope-de-pointe-inaugure-au-cemes-cnrs> *Awards :* 2020: CNRS Cristal award 2019: Ernst Ruska prize of the German Microscopy Society (DGE) 2019: European Microscopy Society (EMS) 2018 outstanding paper award 2006: Pierre Favard Award of the French Microscopy Society (Sfmu)

Publications

etienne-snoeck

	Optimising electron microscopy experiment through electron optics simulation Y Kubo , Christophe Gatel , Etienne Snoeck , Florent Houdellier Ultramicroscopy, 2017, 175, pp.67--80. ⟨10.1016/j.ultramic.2017.01.007⟩ Article dans une revue hal-01706932v1
	Realization of a tilted reference wave for electron holography by means of a condenser biprism Falk Röder , Florent Houdellier , Thibaud Denneulin , Etienne Snoeck , Martin Hÿtch Ultramicroscopy, 2016, 161, pp.23 - 40. ⟨10.1016/j.ultramic.2015.11.004⟩ Article dans une revue hal-01404505v1
	Dynamical holographic Moirés in a TEM Christophe Gatel , Florent Houdellier , Etienne Snoeck Journal of Physics D: Applied Physics, 2016, 49 (32), pp.324001. ⟨10.1088/0022-3727/49/32/324001⟩ Article dans une revue hal-01707046v1
	Development of splitting convergent beam electron diffraction (SCBED) Florent Houdellier , Falk Röder , Etienne Snoeck Ultramicroscopy, 2015, 159 (P1), pp.59-66. ⟨10.1016/j.ultramic.2015.08.002⟩ Article dans une revue hal-01723741v1
	Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing Ludvig de Knoop , Christophe Gatel , Florent Houdellier , Marc Monthioux , Aurélien Masseboeuf Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩ Article dans une revue hal-01430586v2
	Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , S Mamishin Ultramicroscopy, 2015, 151, pp.107--115. ⟨10.1016/j.ultramic.2014.11.021⟩ Article dans une revue hal-01430585v1
	Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes Etienne Snoeck , Florent Houdellier , Yoshifumi Taniguch , Aurélien Masseboeuf , Christophe Gatel Microscopy and Microanalysis, 2014, 20 (S3), pp.932--933. ⟨10.1017/S1431927614006382⟩ Article dans une revue hal-01430589v1
	Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holography Luca Ortolani , Florent Houdellier , Marc Monthioux , Etienne Snoeck , Vittorio Morandi Carbon, 2011, 49 (4), pp.1423 - 1429. ⟨10.1016/j.carbon.2010.12.010⟩ Article dans une revue hal-01742045v1
	Dark-field electron holography for the measurement of geometric phase Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Ultramicroscopy, 2011, 111 (8), pp.1328 - 1337. ⟨10.1016/j.ultramic.2011.04.008⟩ Article dans une revue hal-01742047v1
	Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Journal of Physics: Conference Series, 2010, 241, pp.012027. ⟨10.1088/1742-6596/241/1/012027⟩ Article dans une revue hal-01742031v1
	Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique Bénédicte Warot-Fonrose , Florent Houdellier , Martin Hÿtch , Lionel Calmels , Virginie Serin Ultramicroscopy, 2008, 108 (5), pp.393 - 398. ⟨10.1016/j.ultramic.2007.05.013⟩ Article dans une revue hal-01707847v1
	Nanoscale holographic interferometry for strain measurements in electronic devices Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Nature, 2008, 453 (7198), pp.1086 - 1089. ⟨10.1038/nature07049⟩ Article dans une revue hal-01742001v1
	Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography Florian Hüe , Martin Hÿtch , Florent Houdellier , Etienne Snoeck , Alain Claverie Materials Science and Engineering: B, 2008, 154-155, pp.221 - 224. ⟨10.1016/j.mseb.2008.10.020⟩ Article dans une revue hal-01742010v1
	Experimental application of sum rules for electron energy loss magnetic chiral dichroism Lionel Calmels , Florent Houdellier , Bénédicte Warot-Fonrose , Christophe Gatel , Martin Hÿtch Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 76 (6), ⟨10.1103/PhysRevB.76.060409⟩ Article dans une revue hal-01741982v1
	High-resolution electron holography for the study of composition and strain in thin film semiconductors Florent Houdellier , Martin Hÿtch , Etienne Snoeck , Marie-José Casanove Materials Science and Engineering: B, 2006, 135 (3), pp.188 - 191. ⟨10.1016/j.mseb.2006.08.035⟩ Article dans une revue hal-01741978v1

	Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron Microscopy Christophe Gatel , Aurélien Masseboeuf , Etienne Snoeck , Bénédicte Warot-Fonrose , Florent Houdellier MCMeet - GDRs MCM2 et MEETICC, Oct 2017, Strasbourg, France Communication dans un congrès hal-01725341v1
	Towards ultrafast TEM based on a modified cold-field emission TEM Arnaud Arbouet , Christophe Gatel , Ludvig de Knoop , Aurélien Masseboeuf , Mathieu Kociak 2016 Houches WE Heraeus Workshop, May 2016, Les Houches, France Communication dans un congrès hal-01768918v1
	Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , Shuichi Mamishin PICO-2015, Apr 2015, Jülich, Netherlands Communication dans un congrès hal-02123316v1
	In situ electron microscopy of hard and soft matter Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux Joint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela Communication dans un congrès hal-02123302v1
	Strain Mapping of Layers and Devices Using Electron Holography Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩ Communication dans un congrès hal-01736051v1
	Determination of strain within Si1-yCy layers grown by CVD on a Si substrate Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩ Communication dans un congrès hal-01736057v1

	Dark-Field Electron Holography for Strain Mapping Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩ Chapitre d'ouvrage hal-01736026v1
	CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction Florent Houdellier , Martin Hÿtch , Florian Hüe , Etienne Snoeck P.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩ Chapitre d'ouvrage hal-01742322v1