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Quantitative analysis Electron holography Holography 0710Pz Aluminum alloy Electron diffraction Acceleration voltages 6146w 7765Ly Article 6837Lp AMORPHIZATION ATOMIC MOTIONS 6837Og Electrons ALMGSI ALLOYS 6105a Transmission electron microscopy Dark field electron holography Strain
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65

Dr. Florent Houdellier

Research activities : new instrumental and methodological developments in Transmission Electron Microscopy (TEM)

Since 2016 :   CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Caracterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM).

 

2007-2016:    CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service 

 

2006 - 2007: Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope. 

 

2006:            Pierre Favard Award of the French Microscopy Society for the best thesis 2005-2006

 

2003 - 2006: PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements

 

1998 - 2003: Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics

 

Some developments, a selective choice : 

Article dans une revue54 documents

  • Florent Houdellier, Giuseppe Mario Caruso, Sébastien J. Weber, Mathieu Kociak, Arnaud Arbouet. Development of a high brightness ultrafast Transmission Electron Microscope based on a laser-driven cold field emission source. Ultramicroscopy, 2018, 186, pp.128-138. 〈10.1016/j.ultramic.2017.12.015〉. 〈hal-01704768〉
  • Isabel González Vallejo, Geoffrey Gallé, Brice Arnaud, Shelley Scott, Max Lagally, et al.. Observation of large multiple scattering effects in ultrafast electron diffraction on monocrystalline silicon. Physical Review B : Condensed matter and materials physics, American Physical Society, 2018, 97 (5), 〈10.1103/PhysRevB.97.054302〉. 〈hal-01717337〉
  • Shuichi Mamishin, Yudai Kubo, Robin Cours, Marc Monthioux, Florent Houdellier. 200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy. Ultramicroscopy, Elsevier, 2017, 182, pp.303 - 307. 〈10.1016/j.ultramic.2017.07.018〉. 〈hal-01741769〉
  • Y Kubo, Christophe Gatel, Etienne Snoeck, Florent Houdellier. Optimising electron microscopy experiment through electron optics simulation. Ultramicroscopy, Elsevier, 2017, 175, pp.67--80. 〈10.1016/j.ultramic.2017.01.007〉. 〈hal-01706932〉
  • Giuseppe Mario Caruso, Florent Houdellier, Pierre Abeilhou, Arnaud Arbouet. Development of an ultrafast electron source based on a cold-field emission gun for ultrafast coherent TEM. Applied Physics Letters, American Institute of Physics, 2017, 111 (2), pp.023101. 〈10.1063/1.4991681〉. 〈hal-01739806〉
  • Thibaud Denneulin, Florent Houdellier, Martin Hÿtch. Differential phase-contrast dark-field electron holography for strain mapping. Ultramicroscopy, 2016, 160, pp.98-109. 〈10.1016/j.ultramic.2015.10.002〉. 〈hal-01723740〉
  • Christophe Gatel, Florent Houdellier, Etienne Snoeck. Dynamical holographic Moirés in a TEM. Journal of Physics D: Applied Physics, IOP Publishing, 2016, 49 (32), pp.324001. 〈10.1088/0022-3727/49/32/324001〉. 〈hal-01707046〉
  • Falk Röder, Florent Houdellier, Thibaud Denneulin, Etienne Snoeck, Martin Hÿtch. Realization of a tilted reference wave for electron holography by means of a condenser biprism. Ultramicroscopy, Elsevier, 2016, 161, pp.23 - 40. 〈10.1016/j.ultramic.2015.11.004〉. 〈hal-01404505〉
  • Charudatta Phatak, Ludvig De Knoop, Florent Houdellier, Christophe Gatel, Martin Hÿtch, et al.. Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection. Ultramicroscopy, Elsevier, 2016, 164, pp.24--30. 〈10.1016/j.ultramic.2016.03.005〉. 〈hal-01430579〉
  • Florent Houdellier, Falk Röder, Etienne Snoeck. Development of splitting convergent beam electron diffraction (SCBED). Ultramicroscopy, 2015, 159 (P1), pp.59-66. 〈10.1016/j.ultramic.2015.08.002〉. 〈hal-01723741〉
  • Florent Houdellier, Ludvig De Knoop, Christophe Gatel, Aurélien Masseboeuf, S Mamishin, et al.. Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip. Ultramicroscopy, Elsevier, 2015, 151, pp.107--115. 〈10.1016/j.ultramic.2014.11.021〉. 〈hal-01430585〉
  • Ludvig De Knoop, Christophe Gatel, Florent Houdellier, Marc Monthioux, Aurélien Masseboeuf, et al.. Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing. Applied Physics Letters, American Institute of Physics, 2015, 106 (26), pp.263101. 〈10.1063/1.4923245〉. 〈hal-01430586v2〉
  • Etienne Snoeck, Florent Houdellier, Yoshifumi Taniguch, Aurélien Masseboeuf, Christophe Gatel, et al.. Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes. Microscopy and Microanalysis, Cambridge University Press (CUP), 2014, 20 (S3), pp.932--933. 〈10.1017/S1431927614006382〉. 〈hal-01430589〉
  • Ludvig De Knoop, Florent Houdellier, Christophe Gatel, Aurélien Masseboeuf, Marc Monthioux, et al.. Determining the work function of a carbon-cone cold-field emitter by in situ electron holography. Micron, Elsevier, 2014, 63, pp.2--8. 〈10.1016/j.micron.2014.03.005〉. 〈hal-01430588〉
  • Elsa Javon, Axel Lubk, Robin Cours, Shay Reboh, Nikolay Cherkashin, et al.. Dynamical effects in strain measurements by dark-field electron holography. Ultramicroscopy, Elsevier, 2014, 147, pp.70-85. 〈10.1016/j.ultramic.2014.06.005〉. 〈hal-01721158〉
  • Shay Reboh, P. Morin, Martin Hÿtch, Florent Houdellier, Alain Claverie. Mechanics of silicon nitride thin-film stressors on a transistor-like geometry. APL MATERIALS, 2013, 1 (4), 〈10.1063/1.4826545〉. 〈hal-01724108〉
  • Axel Lubk, Falk Röder, Tore Niermann, Christophe Gatel, Sébastien Joulié, et al.. A new linear transfer theory and characterization method for image detectors. Part II: Experiment. Ultramicroscopy, Elsevier, 2012, 115, pp.78 - 87. 〈10.1016/j.ultramic.2012.01.011〉. 〈hal-01742051〉
  • Florent Houdellier, Aurélien Masseboeuf, M. Monthioux, Martin Hÿtch. New carbon cone nanotip for use in a highly coherent cold field emission electron microscope. Carbon, Elsevier, 2012, 50 (5), pp.2037-2044. 〈10.1016/j.carbon.2012.01.023〉. 〈hal-00678407〉
  • Teresa Hungría, Covadonga Correas, Florent Houdellier, Octavio Peña, Eladio Vila, et al.. Study of Nanocrystalline BiMnO3--PbTiO3: Synthesis, Structural Elucidation, and Magnetic Characterization of the Whole Solid Solution. Chemistry - A European Journal, Wiley-VCH Verlag, 2012, 18 (29), pp.9075-9082. 〈10.1002/chem.201200148〉. 〈hal-00817004〉
  • Arnaud Arbouet, Florent Houdellier, Renaud Marty, Christian Girard. Interaction of an ultrashort optical pulse with a metallic nanotip: A Green dyadic approach. Journal of Applied Physics, American Institute of Physics, 2012, 112 (5), pp.053103. 〈10.1063/1.4747840〉. 〈hal-01742052〉
  • Martin Hÿtch, Nikolay Cherkashin, Shay Reboh, Florent Houdellier, Alain Claverie. Strain mapping in layers and devices by electron holography. Physica Status Solidi (A) Applications and Materials Science, 2011, 208 (3), pp.580-583. 〈10.1002/pssa.201000281〉. 〈hal-01736038〉
  • Luca Ortolani, Florent Houdellier, Marc Monthioux, Etienne Snoeck, Vittorio Morandi. Surface electrostatic potentials in carbon nanotubes and graphene membranes investigated with electron holography. Carbon, Elsevier, 2011, 49 (4), pp.1423 - 1429. 〈10.1016/j.carbon.2010.12.010〉. 〈hal-01742045〉
  • Martin Hÿtch, Florent Houdellier, Florian Hüe, Etienne Snoeck. Dark-field electron holography for the measurement of geometric phase. Ultramicroscopy, Elsevier, 2011, 111 (8), pp.1328 - 1337. 〈10.1016/j.ultramic.2011.04.008〉. 〈hal-01742047〉
  • Martin Hÿtch, Florent Houdellier, Florian Hüe, Etienne Snoeck. Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations. Journal of Physics: Conference Series, IOP Publishing, 2010, 241, 〈10.1088/1742-6596/241/1/012027〉. 〈hal-01742031〉
  • Teresa Hungría, Florent Houdellier, Miguel Algueró, Alicia Castro. Monoclinic symmetry of twin-free nanocrystals in the BiScO3 -PbTiO3 solid solution as revealed by aberration-corrected TEM. Physical Review B : Condensed matter and materials physics, American Physical Society, 2010, 81 (10), 〈10.1103/PhysRevB.81.100102〉. 〈hal-01742032〉
  • N. Van Steenberge, S. Hóbor, S. Suriñach, A. Zhilyaev, Florent Houdellier, et al.. Effects of severe plastic deformation on the structure and thermo-mechanical properties of Zr55Cu30Al10Ni5 bulk metallic glass. Journal of Alloys and Compounds, Elsevier, 2010, 500 (1), pp.61 - 67. 〈10.1016/j.jallcom.2010.03.195〉. 〈hal-01742036〉
  • Luca Ortolani, Florent Houdellier, Marc Monthioux, Vittorio Morandi. Chirality dependent surface adhesion of single-walled carbon nanotubes on graphene surfaces. Carbon, Elsevier, 2010, 48 (11), pp.3050 - 3056. 〈10.1016/j.carbon.2010.04.036〉. 〈hal-01742041〉
  • Joël Douin, P. Donnadieu, Florent Houdellier. Elastic strain around needle-shaped particles embedded in Al matrix. Acta Materialia, Elsevier, 2010, 58 (17), pp.5782-5788. 〈10.1016/j.actamat.2010.06.053〉. 〈hal-00532981〉
  • Houria Jabbar, Jean-Philippe Monchoux, Florent Houdellier, Mickaël Dollé, Frank-Peter Schimansky, et al.. Microstructure and mechanical properties of high niobium containing TiAl alloys elaborated by spark plasma sintering. Intermetallics, Elsevier, 2010, 18, pp.2312 - 2321. 〈10.1016/j.intermet.2010.07.024〉. 〈hal-01742044〉
  • Marie-José Casanove, Nicolas Combe, Florent Houdellier, Martin Hÿtch. Visualising alloy fluctuations by spherical-aberration–corrected HRTEM. EPL - Europhysics Letters, European Physical Society/EDP Sciences/Società Italiana di Fisica/IOP Publishing, 2010, 91 (3), 〈10.1209/0295-5075/91/36001〉. 〈hal-01742039〉
  • Nikolay Cherkashin, Martin Hÿtch, Florent Houdellier, Florian Hüe, Vincent Paillard, et al.. On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates. Applied Physics Letters, American Institute of Physics, 2009, 94 (14), pp.141910. 〈10.1063/1.3116648〉. 〈hal-00417300〉
  • A. Gouye, Florian Hüe, A. Halimaoui, O. Kermarrec, Y. Campidelli, et al.. Selective growth of tensily strained Si1−yCy films on patterned Si substrates. Materials Science in Semiconductor Processing, Elsevier, 2009, 12 (1-2), pp.34 - 39. 〈10.1016/j.mssp.2009.07.006〉. 〈hal-01742015〉
  • S. Koffel, Nikolay Cherkashin, Florent Houdellier, Martin Hÿtch, Gérard Benassayag, et al.. End of range defects in Ge. Journal of Applied Physics, American Institute of Physics, 2009, 105, pp.126110. 〈10.1063/1.3153985〉. 〈hal-01736054〉
  • Florian Hüe, Martin Hÿtch, Florent Houdellier, Hugo Bender, Alain Claverie. Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography. Applied Physics Letters, American Institute of Physics, 2009, 95 (7), pp.73103 - 73103. 〈10.1063/1.3192356〉. 〈hal-01742020〉
  • Damien Jacob, Julien Stodolna, Hugues Leroux, Falko Langenhorst, Florent Houdellier. Pyroxenes microstructure in comet 81P/Wild 2 terminal Stardust particles. Meteoritics and Planetary Science, Wiley, 2009, 44 (10), pp.1475 - 1488. 〈10.1111/j.1945-5100.2009.tb01187.x〉. 〈hal-01742027〉
  • Florian Hüe, Martin Hÿtch, Hugo Bender, Florent Houdellier, Alain Claverie. Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy. Physical Review Letters, American Physical Society, 2008, 100 (15), 〈10.1103/PhysRevLett.100.156602〉. 〈hal-01741994〉
  • S. Rubino, P. Schattschneider, M. Stöger-Pollach, C. Hebert, J. Rusz, et al.. Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope. Journal of Materials Research, Cambridge University Press (CUP), 2008, 23 (10), pp.2582 - 2590. 〈10.1557/JMR.2008.0348〉. 〈hal-01742008〉
  • Martin Hÿtch, Florent Houdellier, Florian Hüe, Etienne Snoeck. Nanoscale holographic interferometry for strain measurements in electronic devices. Nature, Nature Publishing Group, 2008, 453 (7198), pp.1086 - 1089. 〈10.1038/nature07049〉. 〈hal-01742001〉
  • D. Cammilleri, V. Yam, F. Fossard, C. Renard, D. Bouchier, et al.. Lateral epitaxial growth of germanium on silicon oxide. Applied Physics Letters, American Institute of Physics, 2008, 93 (4), pp.43110 - 43110. 〈10.1063/1.2963363〉. 〈hal-01742002〉
  • Marc Legros, Olivier Ferry, Florent Houdellier, Alain Jacques, Amand George. Fatigue of single crystalline silicon: Mechanical behaviour and TEM observations. Materials Science and Engineering: A, Elsevier, 2008, 483-484, pp.353 - 364. 〈10.1016/j.msea.2006.10.200〉. 〈hal-01741996〉
  • Florian Hüe, Martin Hÿtch, Florent Houdellier, Etienne Snoeck, Alain Claverie. Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography. Materials Science and Engineering: B, Elsevier, 2008, 154-155, pp.221 - 224. 〈10.1016/j.mseb.2008.10.020〉. 〈hal-01742010〉
  • V. D. Cammilleri, V. Yam, F. Fossard, C. Renard, D. Bouchier, et al.. Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition. Materials Science in Semiconductor Processing, Elsevier, 2008, 11 (5-6), pp.214-216. 〈10.1016/j.mssp.2008.07.003〉. 〈hal-01293141〉
  • L. Vincent, L. Thome, F. Garrido, O. Kaitasov, Florent Houdellier. Microstructure of Cs-implanted zirconia: Role of temperature. Journal of Applied Physics, American Institute of Physics, 2008, 104, pp.114904. 〈10.1063/1.3021162〉. 〈in2p3-00854119〉
  • J. Verbeeck, C. Hebert, S. Rubino, P. Novák, J. Rusz, et al.. Optimal aperture sizes and positions for EMCD experiments. Ultramicroscopy, Elsevier, 2008, 108 (9), pp.865 - 872. 〈10.1016/j.ultramic.2008.02.007〉. 〈hal-01742004〉
  • Florent Houdellier, D. Jacob, C. Roucau, Marie-José Casanove. Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samples. Ultramicroscopy, Elsevier, 2008, 108 (4), pp.295 - 301. 〈10.1016/j.ultramic.2007.04.003〉. 〈hal-01707829〉
  • Florent Houdellier, Martin Hÿtch. Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF). Ultramicroscopy, Elsevier, 2008, 108 (3), pp.285 - 294. 〈10.1016/j.ultramic.2007.08.016〉. 〈hal-01707842〉
  • J. Morniroli, Florent Houdellier, C. Roucau, J. Puiggalí, S. Gestí, et al.. LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a Cs corrector: Comparison with electron precession. Ultramicroscopy, Elsevier, 2008, 108 (2), pp.100 - 115. 〈10.1016/j.ultramic.2007.03.006〉. 〈hal-01707841〉
  • Bénédicte Warot-Fonrose, Florent Houdellier, Martin Hÿtch, Lionel Calmels, Virginie Serin, et al.. Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique. Ultramicroscopy, Elsevier, 2008, 108 (5), pp.393 - 398. 〈10.1016/j.ultramic.2007.05.013〉. 〈hal-01707847〉
  • Florent Houdellier, A. Altibelli, C. Roucau, Marie-José Casanove. New approach for the dynamical simulation of CBED patterns in heavily strained specimens. Ultramicroscopy, Elsevier, 2008, 108 (5), pp.426 - 432. 〈10.1016/j.ultramic.2007.06.002〉. 〈hal-01741992〉
  • Lionel Calmels, Florent Houdellier, Bénédicte Warot-Fonrose, Christophe Gatel, Martin Hÿtch, et al.. Experimental application of sum rules for electron energy loss magnetic chiral dichroism. Physical Review B : Condensed matter and materials physics, American Physical Society, 2007, 76 (6), 〈10.1103/PhysRevB.76.060409〉. 〈hal-01741982〉
  • Florent Houdellier, C. Roucau, Marie-José Casanove. Convergent beam electron diffraction for strain determination at the nanoscale. Microelectronic Engineering, Elsevier, 2007, 84 (3), pp.464 - 467. 〈10.1016/j.mee.2006.10.063〉. 〈hal-01741979〉
  • Florent Houdellier, Martin Hÿtch. Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy. Microelectronic Engineering, Elsevier, 2007, 84 (3), pp.460 - 463. 〈10.1016/j.mee.2006.10.062〉. 〈hal-01741980〉
  • Florent Houdellier, Martin Hÿtch, Etienne Snoeck, Marie-José Casanove. High-resolution electron holography for the study of composition and strain in thin film semiconductors. Materials Science and Engineering: B, Elsevier, 2006, 135 (3), pp.188 - 191. 〈10.1016/j.mseb.2006.08.035〉. 〈hal-01741978〉
  • Florent Houdellier, C. Roucau, L. Clement, J.L. Rouvière, Marie-José Casanove. Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers. Ultramicroscopy, Elsevier, 2006, 106 (10), pp.951 - 959. 〈10.1016/j.ultramic.2006.04.011〉. 〈hal-01707838〉

Communication dans un congrès8 documents

  • Christophe Gatel, Aurélien Masseboeuf, Etienne Snoeck, Bénédicte Warot-Fonrose, Florent Houdellier. Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron Microscopy. MCMeet - GDRs MCM2 et MEETICC, Oct 2017, Strasbourg, France. 〈hal-01725341〉
  • Arnaud Arbouet, Christophe Gatel, Ludvig De Knoop, Aurélien Masseboeuf, Mathieu Kociak, et al.. Towards ultrafast TEM based on a modified cold-field emission TEM. 2016 Houches WE Heraeus Workshop, May 2016, Les Houches, France. 〈hal-01768918〉
  • Mina Bionta, Benoît Chalopin, Marc Delmas, Florent Houdellier, Aurélien Masseboeuf, et al.. Ultrafast laser-induced field emission from a single carbon nanotube based nanotip. 2015 Conference on Lasers and Electro-Optics (CLEO) : Applications and Technology, May 2015, San Jose, United States. 2015 Conference on Lasers and Electro-Optics (CLEO) : Applications and Technology, 159, pp.JW2A--52, 2015, 〈10.1364/CLEO_AT.2015.JW2A.52〉. 〈hal-01430583〉
  • Nikolay Cherkashin, Florent Houdellier, Martin Hÿtch, M Korytov. Measurement of crystalline lattice strain by transmission electron microscopy”. 14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France. 〈http://www.crhea.cnrs.fr/sfmu2015/ 〉. 〈hal-01763051〉
  • P. Donnadieu, Y. Shao, G. Botton, S. Lazar, M. Cheynet, et al.. Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation. PTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France. 〈hal-00610638〉
  • Alain Claverie, Nikolay Cherkashin, Florian Hüe, Shay Reboh, Florent Houdellier, et al.. Strain Mapping of Layers and Devices Using Electron Holography. ECS Trans. 2010, 2010, Unknown, Unknown or Invalid Region. The Electrochemical Society, 2010, 〈10.1149/1.3487533〉. 〈hal-01736051〉
  • Nikolay Cherkashin, Adrien Gouye, Florian Hüe, Florent Houdellier, Martin Hÿtch, et al.. Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate. ECS Transactions, May 2008, Unknown, Unknown or Invalid Region. The Electrochemical Society, 2008, 〈10.1149/1.2911510〉. 〈hal-01736065〉
  • Nikolay Cherkashin, A. Gouye, Florian Hüe, Florent Houdellier, Martin Hÿtch, et al.. Determination of strain within Si1-yCy layers grown by CVD on a Si substrate. Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. 1026, pp.12-19, 2011, 〈10.1557/PROC-1026-C07-03〉. 〈hal-01736057〉

Chapitre d'ouvrage2 documents

  • Martin Hÿtch, Florent Houdellier, Nikolay Cherkashin, Shay Reboh, Elsa Javon, et al.. Dark-Field Electron Holography for Strain Mapping. Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, 〈10.1002/9781118579022.ch4〉. 〈hal-01736026〉
  • Florent Houdellier, Martin Hÿtch, Florian Hüe, Etienne Snoeck. CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction. P.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. 〈10.1016/S1076-5670(08)01006-9〉. 〈hal-01742322〉

Thèse1 document

  • Florent Houdellier. Contribution au développement du CBED et de l’holographie HREM pour l’analyse des déformations de couches épitaxiées. Optique [physics.optics]. INSA Toulouse; CNRS-CEMES, 2006. Français. 〈tel-01754061〉