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Florence Azais

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"laurent-latorre"

	Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, 40 (11), pp.2400-2410. ⟨10.1109/TCAD.2020.3043318⟩ Article dans une revue lirmm-03426162v1

	Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing” Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre LATS 2023 - IEEE 24th Latin American Test Symposium, Mar 2023, Veracruz, Mexico. pp.1-2, ⟨10.1109/LATS58125.2023.10154484⟩ Communication dans un congrès lirmm-04257082v1
	Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli Thibault Vayssade , Mouhamad Chehaitly , Florence Azaïs , Laurent Latorre , François Lefèvre ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465473⟩ Communication dans un congrès lirmm-03426321v1
	Digital test of ZigBee transmitters: Validation in industrial test environment Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre DATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩ Communication dans un congrès lirmm-03426209v1
	Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATE Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia Communication dans un congrès lirmm-03001537v1
	EVM measurement of RF ZigBee transceivers using standard digital ATE Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩ Communication dans un congrès lirmm-03000882v1
	Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs Florence Azaïs , Serge Bernard , Mariane Comte , Bastien Deveautour , Sophie Dupuis IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩ Communication dans un congrès lirmm-02993384v1