Florence Azais
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On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF CircuitsJournal of Electronic Testing: : Theory and Applications, 2023, 39, pp.155-170. ⟨10.1007/s10836-023-06058-7⟩
Article dans une revue
lirmm-04080259v1
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Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled AcquisitionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, 40 (11), pp.2400-2410. ⟨10.1109/TCAD.2020.3043318⟩
Article dans une revue
lirmm-03426162v1
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Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF CircuitsJournal of Electronic Testing: : Theory and Applications, 2020, 36 (2), pp.189-203. ⟨10.1007/s10836-020-05868-3⟩
Article dans une revue
lirmm-03000864v1
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Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing”LATS 2023 - IEEE 24th Latin American Test Symposium, Mar 2023, Veracruz, Mexico. pp.1-2, ⟨10.1109/LATS58125.2023.10154484⟩
Communication dans un congrès
lirmm-04257082v1
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Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuliETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465473⟩
Communication dans un congrès
lirmm-03426321v1
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Digital test of ZigBee transmitters: Validation in industrial test environmentDATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩
Communication dans un congrès
lirmm-03426209v1
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICsIOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Communication dans un congrès
lirmm-02993384v1
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Implementing indirect test of RF circuits without compromising test quality: a practical case studyLATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093666⟩
Communication dans un congrès
lirmm-03000910v1
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Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATEETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès
lirmm-03001537v1
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EVM measurement of RF ZigBee transceivers using standard digital ATEDFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩
Communication dans un congrès
lirmm-03000882v1
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Indirect test of RF circuits using ensemble methodsETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès
lirmm-03001530v1
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The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated CircuitsSETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Communication dans un congrès
lirmm-02375866v1
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