Documentation
Français (FR)

Anglais (EN)

Florence Azais

14

Documents

Publications

1027443

	On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints Stéphane David-Grignot , Achraf Lamlih , Mohamed Moez Belhaj , Vincent Kerzérho , Florence Azaïs Journal of Electronic Testing: : Theory and Applications, 2018, 34 (3), pp.281-290. ⟨10.1007/s10836-018-5710-4⟩ Article dans une revue lirmm-01706621v1
	Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.#1640014. ⟨10.1142/S0218126616400144⟩ Article dans une revue lirmm-01233013v1
	SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre Journal of Electronic Testing: : Theory and Applications, 2016, 32 (1), pp.69-82. ⟨10.1007/s10836-015-5556-y⟩ Article dans une revue lirmm-01347312v1
	Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre Journal of Electronic Testing: : Theory and Applications, 2015, 31 (5-6), pp.443-459. ⟨10.1007/s10836-015-5548-y⟩ Article dans une revue lirmm-01233017v1

	Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital Signals Stéphane David-Grignot , Achraf Lamlih , Vincent Kerzérho , Florence Azaïs , Fabien Soulier IMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. ⟨10.1109/IMS3TW.2017.7995205⟩ Communication dans un congrès lirmm-01699387v1
	A digital technique for the evaluation of SSB phase noise of analog/RF signals Florence Azaïs , Stéphane David-Grignot , François Lefevre , Laurent Latorre LATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. ⟨10.1109/LATW.2015.7102407⟩ Communication dans un congrès lirmm-01233125v1
	Embedded test instrument for on-chip phase noise evaluation of analog/IF signals Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242, ⟨10.1109/DDECS.2015.11⟩ Communication dans un congrès lirmm-01233136v1
	Digital on-chip measurement circuit for built-in phase noise testing Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177880⟩ Communication dans un congrès lirmm-01233161v1
	A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/ETS.2015.7138761⟩ Communication dans un congrès lirmm-01233093v1
	Stochastic model for phase noise measurement from 1-bit signal acquisition Stéphane David-Grignot , Florence Azaïs , François Lefevre , Laurent Latorre IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. ⟨10.1109/IMS3TW.2014.6997400⟩ Communication dans un congrès lirmm-01119368v1
	Low-cost phase noise testing of complex RF ICs using standard digital ATE Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre ITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩ Communication dans un congrès lirmm-01119356v1
	Phase noise measurement on IF analog signals using standard digital ATE resources Stéphane David-Grignot , Laurent Latorre , Florence Azaïs , François Lefevre NEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124, ⟨10.1109/NEWCAS.2014.6933998⟩ Communication dans un congrès lirmm-01119359v1

	Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre ETS: European Test Symposium, May 2013, Avignon, France. , 18th IEEE European Test Symposium, 2013 Poster de conférence lirmm-00820084v1

	Method And Apparatus For Measuring Phase Noise Florence Azaïs , Laurent Latorre , Stéphane David-Grignot , François Lefevre France, Patent n° : 81582852EP01. 2013, pp.32 Brevet lirmm-00985404v1