Keywords

Co-authors

External widget

Download bibliography

Number of documents

209

Publications of Florence Azaïs


Journal articles43 documents

  • Thibault Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefèvre. Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2019, 19 (1), pp.16-24. ⟨10.1109/TDMR.2019.2898769⟩. ⟨lirmm-02077048⟩
  • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell. Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. Journal of Electronic Testing, Springer Verlag, 2019, 35 (1), pp.59-75. ⟨10.1007/s10836-019-05776-1⟩. ⟨lirmm-02075690⟩
  • Stéphane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzérho, Florence Azaïs, et al.. On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. Journal of Electronic Testing, Springer Verlag, 2018, 34 (3), pp.281-290. ⟨10.1007/s10836-018-5710-4⟩. ⟨lirmm-01706621⟩
  • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology. IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2017, 16 (3), pp.417-430. ⟨10.1109/TNANO.2017.2664895⟩. ⟨hal-01709588⟩
  • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies. Journal of Electronic Testing, Springer Verlag, 2017, 33 (4), pp.515-527. ⟨10.1007/s10836-017-5674-9⟩. ⟨hal-01709587⟩
  • Florence Azaïs, Stéphane David-Grignot, Laurent Latorre, François Lefevre. SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. Journal of Electronic Testing, Springer Verlag, 2016, 32 (1), pp.69-82. ⟨10.1007/s10836-015-5556-y⟩. ⟨lirmm-01347312⟩
  • Florence Azaïs, Stéphane David-Grignot, Laurent Latorre, François Lefevre. Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. Journal of Circuits, Systems, and Computers, World Scientific Publishing, 2016, 25 (3), pp.#1640014. ⟨10.1142/S0218126616400144⟩. ⟨lirmm-01233013⟩
  • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102. ⟨10.1016/j.mejo.2015.09.014⟩. ⟨lirmm-01232890⟩
  • Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. Journal of Electronic Testing, Springer Verlag, 2015, 31 (5-6), pp.443-459. ⟨10.1007/s10836-015-5548-y⟩. ⟨lirmm-01233017⟩
  • Jean-Marc Galliere, Florence Azaïs, Mariane Comte, Michel Renovell. Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm. Information Technology, Oldenbourg Verlag, 2014, 56 (4), pp.173-181. ⟨http://www.degruyter.com/view/j/itit⟩. ⟨10.1515/itit-2013-1040⟩. ⟨hal-01167054⟩
  • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect Measurements. Microelectronics Journal, Elsevier, 2014, 45 (3), pp.336-344. ⟨10.1016/j.mejo.2013.12.006⟩. ⟨lirmm-00936443⟩
  • Ahmed Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet. Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers. Journal of Electronic Testing, Springer Verlag, 2014, 30 (1), pp.87-100. ⟨10.1007/s10836-013-5423-7⟩. ⟨lirmm-00984275⟩
  • Vincent Kerzérho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, et al.. A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectronics Journal, Elsevier, 2013, 44 (9), pp.840-843. ⟨http://www.sciencedirect.com/science/article/pii/S0026269213001468⟩. ⟨10.1016/j.mejo.2013.06.009⟩. ⟨lirmm-00875985⟩
  • Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir. A Level-Crossing Approach for the Analysis of RF Modulated Signals using only Digital Test Resources. Journal of Electronic Testing, Springer Verlag, 2011, 27 (3), pp.289-303. ⟨10.1007/s10836-011-5222-y⟩. ⟨lirmm-00702746⟩
  • Ahmed Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet. A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level. Journal of Electronic Testing, Springer Verlag, 2011, 27 (3), pp.411-423. ⟨10.1007/s10836-011-5207-x⟩. ⟨lirmm-00702741⟩
  • Vincent Kerzérho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, et al.. Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. Journal of Electronic Testing, Springer Verlag, 2011, 27 (3), pp.335-350. ⟨10.1007/s10836-011-5194-y⟩. ⟨lirmm-00609243⟩
  • Norbert Dumas, Florence Azaïs, Frédérick Mailly, Pascal Nouet. Study of an electrical setup for capacitive MEMS accelerometers test and calibration. Journal of Electronic Testing, Springer Verlag, 2010, 26-1, pp.111-125. ⟨10.1007/s10836-009-5122-6⟩. ⟨lirmm-00432757⟩
  • Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Pascal Nouet, Florence Azaïs. Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time Domain. Microelectronics Reliability, Elsevier, 2009, 49 (12), pp.1424-1432. ⟨10.1016/j.microrel.2009.06.056⟩. ⟨lirmm-00435866⟩
  • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design, Hindawi Publishing Corporation, 2008, 2008 (Article ID 482159), pp.8. ⟨10.1155/2008/482159⟩. ⟨lirmm-00346722⟩
  • Carl Jeffrey, Norbert Dumas, Zhou Xu, Frédérick Mailly, Florence Azaïs, et al.. Sensor Testing Through Bias Superposition. Sensors and Actuators A: Physical , Elsevier, 2007, 136 (1), pp.441-455. ⟨10.1016/j.sna.2006.11.030⟩. ⟨lirmm-00177756⟩
  • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. Fully Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC. IET Computers & Digital Techniques, Institution of Engineering and Technology, 2007, 1 (3), pp.146-153. ⟨lirmm-00195172⟩
  • Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet. Electro-Thermal Short Pulsed Simulation for SOI Technology. Microelectronics Reliability, Elsevier, 2006, 46 (9-11), pp.1482-1485. ⟨10.1016/j.microrel.2006.07.015⟩. ⟨lirmm-00128255⟩
  • Serge Bernard, Vincent Kerzérho, Philippe Cauvet, Florence Azaïs, Mariane Comte, et al.. A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP. IEEE Design & Test, IEEE, 2006, 23 (3), pp.237-243. ⟨lirmm-00115131⟩
  • Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. Electro-thermal stimuli for MEMS testing in FSBM technology. Journal of Electronic Testing, Springer Verlag, 2006, 22 (2), pp.189-198. ⟨lirmm-00112942⟩
  • Jean-Marc Galliere, Michel Renovell, Florence Azaïs, Yves Bertrand. Delay Testing Viability of Gate Oxide Short Defect. Journal of Computer Science and Technology, Iberoamerican Science & Technology Education Consortium, 2005, 20 (2), pp.195-200. ⟨10.1007/s11390-005-0195-x⟩. ⟨lirmm-00105323⟩
  • Jean-Marc Galliere, Michel Renovell, Florence Azaïs, Yves Bertrand. Viability of a Delay Testing of Gate Oxide Short Transistors. Journal of Computer Science and Technology, Iberoamerican Science & Technology Education Consortium, 2005, 20 (2), pp.6. ⟨lirmm-00370370⟩
  • Florence Azaïs, Benjamin Caillard, Stéphanie Dournelle, Pascal Salomé, Pascal Nouet. A New Multi-Finger SCR-Based Structure for Efficient On-Chip ESD Protection. Microelectronics Reliability, Elsevier, 2005, 45 (2), pp.233-243. ⟨lirmm-00105321⟩
  • Antonio Andrade, Gustavo Vieira, Tiago Balen, Marcelo Lubaszewski, Florence Azaïs, et al.. Built-In Self-Test of Global Interconnects of Field Programmable Analog Arrays. Microelectronics Journal, Elsevier, 2005, 36 (12), pp.1112-1123. ⟨lirmm-00367974⟩
  • Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell. Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. Journal of Electronic Testing, Springer Verlag, 2005, 21 (2), pp.135-146. ⟨10.1007/s10836-005-6143-4⟩. ⟨lirmm-00105334⟩
  • Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell. A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. Journal of Electronic Testing, Springer Verlag, 2005, 21 (1), pp.9-16. ⟨lirmm-00105328⟩
  • Florence Azaïs, Serge Bernard, Mariane Comte, Yves Bertrand, Michel Renovell. Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. Journal of Electronic Testing, Springer Verlag, 2005, 21 (3), pp.291-298. ⟨lirmm-00105322⟩
  • Da. Martin, Romain Desplats, Gérard Haller, Florence Azaïs, Pascal Nouet. Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectronics Reliability, Elsevier, 2004, 44 (9/11), pp.1553-1558. ⟨lirmm-00108546⟩
  • Rachid Bouchakour, Jean-.Michel Portal, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand, et al.. A Compact DC Model of Gate Oxide Short Defect. Microelectronic Engineering, Elsevier, 2004, 72 (1-4), pp.140-148. ⟨10.1016/j.mee.2003.12.051⟩. ⟨lirmm-00108564⟩
  • Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. Journal of Electronic Testing, Springer Verlag, 2004, Vol. 20 n°3, pp. 257-267. ⟨hal-00004514⟩
  • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. Journal of Electronic Testing, Springer Verlag, 2004, 20 (4), pp.375-387. ⟨lirmm-00108545⟩
  • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. A-to-D Converter Static Error Detection from Dynamic Parameter Measurements. Microelectronics Journal, Elsevier, 2003, 34 (10), pp. 945-953. ⟨lirmm-00269601⟩
  • Uroš Kač, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell. Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test. IEEE Design & Test, IEEE, 2003, 20 (2), pp.32-39. ⟨10.1109/MDT.2003.1188260⟩. ⟨lirmm-00269600⟩
  • Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test, IEEE, 2003, 20 (1), pp.60-67. ⟨lirmm-00269822⟩
  • Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp. 469-479. ⟨lirmm-00269602⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp. 377-386. ⟨lirmm-00269754⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp.10. ⟨lirmm-00370365⟩
  • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Analog Built-In Saw-Tooth Generator for ADC Histogram Test. Microelectronics Journal, Elsevier, 2002, 33 (10), pp.781-789. ⟨lirmm-00268587⟩
  • Michel Renovell, Florence Azaïs, Yves Bertrand. Improving Defect Detection in Static-Voltage Testing. IEEE Design & Test, IEEE, 2002, 17 (6), pp.83-89. ⟨lirmm-00268605⟩

Conference papers137 documents

  • Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre. Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. ETS: European Test Symposium, May 2019, Baden-Baden, Germany. ⟨10.1109/ETS.2019.8791540⟩. ⟨lirmm-02274367⟩
  • Thibault Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefèvre. Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. pp.17-22, ⟨10.1109/IOLTS.2018.8474229⟩. ⟨lirmm-01997910⟩
  • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell. Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. LATS: Latin-American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩. ⟨lirmm-02064921⟩
  • Stéphane David-Grignot, Achraf Lamlih, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, et al.. Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital Signals. IMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. ⟨10.1109/IMS3TW.2017.7995205⟩. ⟨lirmm-01699387⟩
  • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell, et al.. Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩. ⟨hal-01709614⟩
  • Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Galliere, Michel Renovell, et al.. Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩. ⟨hal-01709615⟩
  • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩. ⟨lirmm-01374300⟩
  • Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩. ⟨lirmm-01374292⟩
  • Florence Azaïs. Analog test: Why still “à la mode” after more than 25 years of research?. ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138772⟩. ⟨lirmm-01922917⟩
  • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A framework for efficient implementation of analog/RF alternate test with model redundancy. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩. ⟨lirmm-01233104⟩
  • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A generic methodology for building efficient prediction models in the context of alternate testing. IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩. ⟨lirmm-01233150⟩
  • Vincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, et al.. Toward adaptation of ADCs to operating conditions through on-chip correction. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩. ⟨lirmm-01233117⟩
  • Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Digital on-chip measurement circuit for built-in phase noise testing. IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177880⟩. ⟨lirmm-01233161⟩
  • Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition. ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/ETS.2015.7138761⟩. ⟨lirmm-01233093⟩
  • Florence Azaïs, Stéphane David-Grignot, Laurent Latorre, François Lefevre. Embedded test instrument for on-chip phase noise evaluation of analog/IF signals. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242, ⟨10.1109/DDECS.2015.11⟩. ⟨lirmm-01233136⟩
  • Manuel J. Barragan, Gildas Leger, Florence Azaïs, R. D. Blanton, Adit D. Singh, et al.. Special session: Hot topics: Statistical test methods. VTS: VLSI Test Symposium, Apr 2015, Napa, CA, United States. ⟨10.1109/VTS.2015.7116265⟩. ⟨hal-01177043⟩
  • Florence Azaïs, Stéphane David-Grignot, François Lefevre, Laurent Latorre. A digital technique for the evaluation of SSB phase noise of analog/RF signals. LATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. ⟨10.1109/LATW.2015.7102407⟩. ⟨lirmm-01233125⟩
  • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩. ⟨lirmm-00994714⟩
  • Vincent Kerzérho, Florence Azaïs, Mouhamadou Dieng, Mariane Comte, Serge Bernard, et al.. Self-Adaptive NFC Systems. IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. ⟨lirmm-01084355⟩
  • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩. ⟨lirmm-01119361⟩
  • Haithem Ayari, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Syhem Larguech, et al.. Investigations on alternate analog/RF test with model redundancy. STEM Workshop, May 2014, Paderborn, Germany. ⟨lirmm-01119374⟩
  • Mouhamadou Dieng, Florence Azaïs, Mariane Comte, Serge Bernard, Vincent Kerzérho, et al.. Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩. ⟨lirmm-01119365⟩
  • Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, et al.. Solutions for the self-adaptation of communicating systems in operation. IOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩. ⟨hal-01118068⟩
  • Stéphane David-Grignot, Florence Azaïs, François Lefevre, Laurent Latorre. Stochastic model for phase noise measurement from 1-bit signal acquisition. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. ⟨10.1109/IMS3TW.2014.6997400⟩. ⟨lirmm-01119368⟩
  • Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩. ⟨lirmm-01119356⟩
  • Stéphane David-Grignot, Laurent Latorre, Florence Azaïs, François Lefevre. Phase noise measurement on IF analog signals using standard digital ATE resources. NEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124, ⟨10.1109/NEWCAS.2014.6933998⟩. ⟨lirmm-01119359⟩
  • Ahmed Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet, Mohamed Masmoudi. Self-test and self-calibration of a MEMS convective accelerometer. DTIP: Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2013, Barcelona, Spain. pp.239-242. ⟨lirmm-00814231⟩
  • Jie Jiang, Marina Aparicio Rodriguez, Mariane Comte, Florence Azaïs, Michel Renovell, et al.. MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.177-182, ⟨10.1109/ATS.2013.41⟩. ⟨lirmm-00932357⟩
  • Marina Aparicio Rodriguez, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, et al.. Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced Delays. LATW: Latin American Test Workshop, Apr 2013, Cordoba, Argentina. ⟨10.1109/LATW.2013.6562657⟩. ⟨lirmm-00820067⟩
  • Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzérho, Florence Azaïs, et al.. Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications. NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩. ⟨lirmm-00839190⟩
  • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing. 3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States. ⟨lirmm-00985422⟩
  • Ahmed Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet. An Electrical Test Method for MEMS Convective Accelerometers: Development and Evaluation. DATE'11: IEEE/ACM Design, Automation & Test in Europe Conference, France. pp.6. ⟨lirmm-00702754⟩
  • Ahmed Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet. A MEMS Convective Accelerometer Equipped with On-Chip Facilities for Sensitivity Electrical Calibration. IMS3TW'11: IEEE International Mixed-Signals, Sensors and Systems Test Workshop, United States. pp.82-87, ⟨10.1109/IMS3TW.2011.21⟩. ⟨lirmm-00702759⟩
  • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Making predictive analog/RF alternate test strategy independent of training set size. ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩. ⟨lirmm-00803564⟩
  • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, et al.. Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩. ⟨lirmm-00803453⟩
  • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. On the use of redundancy to reduce prediction error in alternate analog/RF test. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩. ⟨lirmm-00803556⟩
  • Marina Aparicio Rodriguez, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell, et al.. An IR-Drop Simulation Principle Oriented to Delay Testing. DCIS'12: 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409. ⟨lirmm-00804254⟩
  • Florence Azaïs, Laurent Latorre. Low-cost SNR estimation of analog signals using standard digital Automated Test Equipment (ATE). NEWCAS: International New Circuits and Systems Conference, Jun 2012, Montréal, Canada. pp.197-200, ⟨10.1109/NEWCAS.2012.6328990⟩. ⟨lirmm-00803558⟩
  • Ahmed Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet. Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategy. LATW: Latin American Test Workshop, Apr 2012, Quito, Ecuador. ⟨10.1109/LATW.2012.6261237⟩. ⟨lirmm-00803451⟩
  • Nicolas Pous, Florence Azaïs, Laurent Latorre, Gabriel Confais, Jochen Rivoir. Level-Crossing based QAM Demodulation for Low-Cost Analog/RF Testing. NEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.309-312, ⟨10.1109/NEWCAS.2011.5981317⟩. ⟨lirmm-00702763⟩
  • Ahmed Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet. Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical Setup. LATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. ⟨10.1109/LATW.2011.5985907⟩. ⟨lirmm-00702769⟩
  • Ahmed Rekik, Brahim Mezghani, Florence Azaïs, Norbert Dumas, Mohamed Masmoudi, et al.. Investigation on the Effect of Geometrical Dimensions on the Conductive Behaviour of a MEMS Convective Accelerometer. DTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.14-17. ⟨lirmm-00632610⟩
  • Ahmed Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet. Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective Accelerometers. IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494555⟩
  • Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir. AM-Demodulation of Analog/RF Signals Using Digital Tester Channels. IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494546⟩
  • Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir. On the Use of Standard Digital ATE for the Analysis of RF Signals. ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.43-48. ⟨lirmm-00492828⟩
  • Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Vincent Kerzérho, et al.. Adaptive LUT-Based System for In Situ ADC Auto-correction. IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494424⟩
  • Vincent Kerzérho, Florence Azaïs, Mariane Comte, Philippe Cauvet, Serge Bernard, et al.. ANC-Based Method for Testing Converters with Random-Phase Harmonics. IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494578⟩
  • Ahmed Rekik, Florence Azaïs, Norbert Dumas, Mohamed Masmoudi, Frédérick Mailly, et al.. A Study of Package Effects on the Behavior of MEMS Convective Accelerometers. DTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.6-9. ⟨lirmm-00489026⟩
  • Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir. Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester Channels. LATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A. ⟨lirmm-00473524⟩
  • Florence Azaïs, Yves Bertrand, Michel Renovell. Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367718⟩
  • Norbert Dumas, Florence Azaïs, Frédérick Mailly, Pascal Nouet. A Method for Electrical Calibration of MEMS Accelerometers Through Multivariate Regression. IMS3TW'09: IEEE 15th Mixed-Signals, Sensors and Systems Test Workshop, Jun 2009, pp.N/A. ⟨lirmm-00399110⟩
  • Florence Azaïs, Yves Bertrand, Michel Renovell. An Analysis of the Timing Behavior of CMOS Digital Blocks under Simultaneous Switching Noise Conditions. DDECS'09: IEEE Design and Diagnostics of Electronic Circuits and Systems, Apr 2009, Liberec, Czech Republic. pp.158-163. ⟨lirmm-00386906⟩
  • Florence Azaïs, Laurent Latorre, Pascal Nouet, Nicolas Pous, Jochen Rivoir. Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATE. ATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩. ⟨lirmm-00436384⟩
  • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. LH-BIST for Digital Correction of ADC Offset. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203. ⟨lirmm-00375659⟩
  • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation. ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750. ⟨lirmm-00448863⟩
  • Jean-Marc Galliere, Florence Azaïs, Michel Renovell, Luigi Dilillo. Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229. ⟨lirmm-00370798⟩
  • Ahmed Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet, et al.. Investigations on Electrical-only Test Setup for MEMS Convective Accelerometer. ICSCS: International Conference on Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412624⟩. ⟨lirmm-00436265⟩
  • Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Pascal Nouet, Florence Azaïs. Transit Time Extraction Method for ESD Protection Diodes Model. IEW'08: International ESD Workshop, Port d'Albret, France. ⟨lirmm-00337884⟩
  • Norbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet. A Novel Method for Test and Calibration of Capacitive Accelerometers with a Fully Electrical Setup. DDECS'08: 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2008, Bratislava, Slovaquie, pp.6, ⟨10.1109/DDECS.2008.4538807⟩. ⟨lirmm-00337873⟩
  • Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell. On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise. LATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16. ⟨lirmm-00260194⟩
  • Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell. On the Detection of SSN-Induced Logic Errors Through On-Chip Monitoring. IOLTS: International On-Line Testing Symposium, Jul 2008, Rhodes, Greece. pp.233-238, ⟨10.1109/IOLTS.2008.19⟩. ⟨lirmm-00294767⟩
  • Norbert Dumas, Florence Azaïs, Frédérick Mailly, Pascal Nouet. Evaluation of a Fully Electrical Test and Calibration Method for MEMS Capacitive Accelerometers. IMS3TW'08: 14th IEEE International Mixed-Signals, Sensor, and Systems Test Workshop, Jun 2008, Vancouver, Canada, pp.6, ⟨10.1109/IMS3TW.2008.4581616⟩. ⟨lirmm-00337875⟩
  • Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Hélène Beckrich-Ros, Corinne Richier, et al.. A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients. 30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9. ⟨lirmm-00337880⟩
  • Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, et al.. European Network for Test Education. DELTA'02: 1st International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.230-239. ⟨lirmm-00268490⟩
  • Florence Azaïs, Benjamin Caillard, Pascal Nouet, Pascal Salomé. Caractérisation et Modélisation de Thyristors Parasites en Technologie CMOS Fortement Submicronique. Colloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 137-140. ⟨lirmm-00269319⟩
  • Aboubacar Chaehoi, Laurent Latorre, Florence Azaïs, Pascal Nouet. Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test Strategy. IMSTW'03: 9th IEEE International Mixed-Signal Testing Workshop, Sevilla (Spain), France. pp. 99-103. ⟨lirmm-00269582⟩
  • Florence Azaïs, Benjamin Caillard, Stéphanie Dournelle, Pascal Nouet, Pascal Salomé. A Novel SCR-Based Protection Structure Against ESD with Efficient Multi-Finger Triggering. ESSDERC'03: 3rd European Solid-State Device Research Conference, Estoril (Portugal), pp. 207-210. ⟨lirmm-00269605⟩
  • Benjamin Caillard, Florence Azaïs, Pascal Nouet, Stéphanie Dournelle, Pascal Salomé. Electrical Modeling of LSCRs in Deep Submicron CMOS Technologies for Circuit-Level Simulation of ESD. BCTM'03: Bipolar/BiCMOS Circuits and Technology Meeting, Toulouse (France), pp. 97-100. ⟨lirmm-00269608⟩
  • Benjamin Caillard, Florence Azaïs, Pascal Nouet, Stéphanie Dournelle, Pascal Salomé. STMSCR: A New Multi-Finger SCR-Based Protection Structure Against ESD. EOS/ESD Symposium, Las Vegas (USA), pp. 223-241. ⟨lirmm-00269603⟩
  • Florence Azaïs, Pascal Nouet, Uroš Kač, Franc Novak. Design of an IEEE 1149.4 Test Chip with Extended ABM Functionality. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159. ⟨lirmm-00269340⟩
  • Benjamin Caillard, Florence Azaïs, Pascal Nouet, Pascal Salomé, Stéphanie Dournelle. Protection contre les ESD : Caractérisation et Modélisation de Thyristors Parasites. EOS/ESD/EMI Workshop, Toulouse (France), France. pp.P nd. ⟨lirmm-00269343⟩
  • Olivier Leman, Boris Alandry, El Mehdi Boujamaa, Norbert Dumas, Frédérick Mailly, et al.. Conception de MEMS : de l'idée à l'integration SoC/SiP. GDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France. ⟨lirmm-00361232⟩
  • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators. IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201. ⟨lirmm-00161708⟩
  • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩. ⟨lirmm-00158527⟩
  • Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Pascal Nouet, Florence Azaïs. Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time Domain. EOS/ESD'07: 29th Electrical Overstress/Electrostatic Discharge Symposium, Sep 2007, Anaheim, CA, USA, pp.3A.2_1- 3A.2_10, ⟨10.1109/EOSESD.2007.4401748⟩. ⟨lirmm-00199232⟩
  • Antoine Rivière, Philippe Coll, David Bernard, Pascal Nouet, Florence Azaïs. On the Use of LVTPNP in ESD Protection Structures. IEW'07: International Electrostatic Discharge Workshop, May 2007, Lake Tahoe, CA, United States. ⟨lirmm-00199246⟩
  • Florence Azaïs, Laurent Larguier, Michel Renovell. Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits. ATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.239-244. ⟨lirmm-00179262⟩
  • Florence Azaïs, Laurent Larguier, Michel Renovell. Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching Noise. LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru. ⟨lirmm-00199261⟩
  • Olivier Leman, Florence Azaïs, Laurent Latorre, Frédérick Mailly, Pascal Nouet. On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor. LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34. ⟨lirmm-00102750⟩
  • Marie Lafont, Florence Azaïs, Philippe Galy, Pascal Salomé, Pascal Nouet. A simulation tool for CDM stress evaluation at circuit level. EOS/ESD/EMI Workshop, May 2006, Toulouse, France. pp.89-92. ⟨lirmm-00112986⟩
  • Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet. Partially Depleted SOI Body-Contacted MOSFET-Triggered Silicon Controlled Rectifier for ESD Protection. EOS/ESD Symposium, Sep 2006, Tucson (USA), pp.6. ⟨lirmm-00112952⟩
  • Serge Bernard, Florence Azaïs, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC. IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88. ⟨lirmm-00119266⟩
  • Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. “Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164. ⟨lirmm-00115676⟩
  • Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet. Electro-thermal short pulsed simulation for SOI technology. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany. ⟨lirmm-00112981⟩
  • Florence Azaïs. Test of a CMOS Micro Compass. 2nd PATENT-DfMM Summer School, Sep 2005. ⟨lirmm-00106560⟩
  • Hong Liu, H.G. Kerkhoff, A. Richardson, X. Zhang, Pascal Nouet, et al.. Design&Test of an Oscillation Based System Architecture for DNA Sensor Arrays. IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.234-239. ⟨lirmm-00106525⟩
  • Antonio Zenteno, Víctor Champac, Michel Renovell, Florence Azaïs. Analysis and Attenuation Proposal in Ground Bounce: II. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.34-39. ⟨lirmm-00106514⟩
  • Christophe Entringer, P. Flatrese, Pascal Salomé, Pascal Nouet, Florence Azaïs. Comparison Between 0.13 µm PD-SOI Gated Diode and non Gated Diode through DC TCAD Simulations. EUROSOI'05, Jan 2005, Grenade, Spain. ⟨lirmm-00106519⟩
  • Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet. Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS Testing. IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219. ⟨lirmm-00106522⟩
  • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Fast and Fully-Efficient Test Flow for ADCs. IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249. ⟨lirmm-00106523⟩
  • Christophe Entringer, Philippe Flatresse, Pascal Salomé, Pascal Nouet, Florence Azaïs. Physics and Design Optimization of ESD Diode for 0.13mm PD-SOI Technology. EOS/ESD: Electrical Overstress/Electrostatic Discharge, Sep 2005, Anaheim, United States. ⟨lirmm-00106041⟩
  • Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212. ⟨lirmm-00106516⟩
  • Frédérick Mailly, Norbert Dumas, Laurent Latorre, Florence Azaïs, Pascal Nouet. Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias Modulation. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218. ⟨lirmm-00106517⟩
  • Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218. ⟨lirmm-00105996⟩
  • Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, et al.. Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS: VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.389-400, ⟨10.1109/VTS.2005.85⟩. ⟨lirmm-00105998⟩
  • Hans G. Kerkhoff, X. Zhang, Hong Liu, Andrew Richardson, Pascal Nouet, et al.. VHDL-AMS Fault Simulation for Testing DNA Bio-Sensing Arrays. IEEE SENSORS, Oct 2005, Irvine, United States. ⟨10.1109/ICSENS.2005.1597878⟩. ⟨lirmm-00106042⟩
  • Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet. Towards On-Line Testing of MEMS Using Electro-Thermal Excitation. ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81. ⟨lirmm-00106009⟩
  • Da. Martin, R. Desplats, G. Haller, Florence Azaïs, Pascal Nouet. Optimised Probing Flow for High Speed Fault Localization. ISTFA'04: International Symposium on Testing and Failure Analysis, Nov 2004, Worcester (USA). ⟨lirmm-00108898⟩
  • Antonio Zenteno, Víctor Champac, Michel Renovell, Florence Azaïs. Analysis and Attenuation Proposal in Ground Bounce. ATS: Asian Test Symposium, Nov 2004, Kenting Taiwan. pp.460-463, ⟨10.1109/ATS.2004.25⟩. ⟨lirmm-00108931⟩
  • Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell. An Approach to the Built-in-Self of Field Programmable Analog Arrays. VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.383-388. ⟨lirmm-00108908⟩
  • Da. Martin, G. Haller, Florence Azaïs, Pascal Nouet. Investigations on the Use of EWS Data for Failure Diagnosis Enhancement. LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena (Colombia), pp.6-10. ⟨lirmm-00108652⟩
  • Antonio Andrade Jr, Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, et al.. Testing Global Interconnects of Field Programmable Analog Arrays . IMSTW'04: 10th International Mixed-Signal Testing Workshop, Jun 2004, Portland, Oregon, United States. ⟨lirmm-00108657⟩
  • Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. Electrically-Induced Thermal Stimuli for MEMS Testing. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65. ⟨lirmm-00108904⟩
  • Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet. On the Use of Electrical Stimuli for MEMS Testing. LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122. ⟨lirmm-00108651⟩
  • Florence Azaïs. Towards Low-Cost Testing of Analog-to-Digital Converters. Workshop on the Testing of High Resolution Mixed-Signal Interfaces, 2004. ⟨lirmm-00109143⟩
  • Laurent Latorre, Florence Azaïs, Marie-Lise Flottes, Serge Bernard, Régis Lorival, et al.. Test Digital, Test de Mémoires, Test Mixte : 5 Centres de Compétence pour la Formation en Europe. CNFM'04 : 8ème Journées Pédagogiques du Comité National de Formation en Microélectronique, 2004, Saint Malo, France. p. 242. ⟨lirmm-00108671⟩
  • Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell. Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC: International Test Conference, Oct 2004, Charlotte, United States. pp.893-902. ⟨lirmm-00108897⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Delay Testing of MOS Transistor with Gate Oxide Short. ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173. ⟨lirmm-00269641⟩
  • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test FLow Optimization. ITC'03: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209. ⟨lirmm-00269610⟩
  • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs. IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190. ⟨lirmm-00269583⟩
  • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. An Automatic Tool for Generation of ADC BIST Architecture. IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84. ⟨lirmm-00269580⟩
  • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. Automatic Generation of LH-BIST Architecture for ADC Testing. IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12. ⟨lirmm-00269683⟩
  • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203. ⟨lirmm-00269498⟩
  • Mariane Comte, Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test Flow Optimization. ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩. ⟨lirmm-00269527⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand, Jean-Michel Portal, et al.. GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. ⟨lirmm-00269604⟩
  • Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell. On the Synthesis of Analog Cascaded Filters with Optimal Test Point Insertion. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216. ⟨lirmm-00269499⟩
  • Michel Renovell, Tiago R. Balen, M. Schreiber, Florence Azaïs, Marcelo Lubaszewski. OBIST Applied to FPAAs: A Case Study. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.238-243. ⟨lirmm-00269501⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Low Voltage Testing of Gate Oxide Short in CMOS Technology. DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174. ⟨lirmm-00268526⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. A Non-Split Model for Realistic Gate Oxide Short in CMOS Technology. DCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204. ⟨lirmm-00268432⟩
  • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale. Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50. ⟨lirmm-00269325⟩
  • Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, et al.. A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students. FIE: Frontiers in Education, Nov 2002, Boston, Massachusetts, United States. pp.T2E-24. ⟨lirmm-00269423⟩
  • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On-Chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SoC: Very Large Scale Integration of Systems-on-Chips, 2002, Montpellier, France. pp.425-436. ⟨lirmm-00268477⟩
  • Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. A High Accuracy Triangle-Wave Signal Generator for On-Chip ADC Testing. ETW: European Test Workshop, 2002, Corfu, Greece. pp.89-94. ⟨lirmm-00268483⟩
  • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, et al.. Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179. ⟨lirmm-00269320⟩
  • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Evaluation of ADC Static Parameters via Frequency Domain. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169. ⟨lirmm-00269347⟩
  • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Evaluation of ADC Static Parameters Through Dynamic Testing. ADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98. ⟨lirmm-00269338⟩
  • Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, et al.. A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students. FIE'02: Frontiers in Education Conference, Boston, Massachusetts (USA), pp.T2E-24. ⟨lirmm-00191523⟩
  • Florence Azaïs, Yves Bertrand, Jose Vicente Calvano, Marcelo Lubaszewski, Pascal Nouet, et al.. Designing Testable Analog Filters with Optimal DFT Insertion. IMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203. ⟨lirmm-00269341⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short. DBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16. ⟨lirmm-00269333⟩
  • Uroš Kač, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell. Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test Chip. BTW: Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2. ⟨lirmm-00269342⟩
  • Uroš Kač, Franc Novak, Jozef Stefan, Florence Azaïs, Pascal Nouet, et al.. Experimental test infrastructure supporting IEEE 11494 Standard. ETW: European Test Workshop, 2002, Corfou, Greece. ⟨lirmm-00268606⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Modeling Gate Oxide Short Defects in CMOS Minimum Transistors. ETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20. ⟨lirmm-00268527⟩
  • Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, et al.. EuNICE-Test Project: A remote Access to Engineering Test for European Universities. EWME: European Workshop on Microelectronics Education, 2002, Vigo, Spain. pp.133-136. ⟨lirmm-00268489⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand. Boolean and Current Detection of MOS Transistor with Gate Oxide Short. IEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10. ⟨lirmm-00370400⟩
  • Marcelo Lubaszewski, Michel Renovell, Salvador Mir, Florence Azaïs, Yves Bertrand. A built-in multi-mode stimuli generator for analogue and mixed-signal testing. Brazilian Symposium on Integrated Circuit Design, 1998, Rio de Janeiro, Brazil. pp.175-178, ⟨10.1109/SBCCI.1998.715435⟩. ⟨hal-00005876⟩
  • Marcelo Lubaszewski, Michel Renovell, Florence Azaïs, Yves Bertrand. A multi-mode stimuli generator for analogue and mixed-signal built-in-self-test. IMSTW: International Mixed Signal Testing Workshop, Jun 1998, The Hague, Pays-Bas. pp.100-106. ⟨hal-01384740⟩
  • Michel Renovell, Marcelo Lubaszewski, S. Mir, Florence Azaïs, Yves Bertrand. A multi-mode signature analyzer for analog and mixed circuits. VLSI: Integrated Systems on Silicon, Aug 1997, Gramado, Brazil. pp.65-76, ⟨10.1007/978-0-387-35311-1_6⟩. ⟨hal-01399998⟩

Poster communications4 documents

  • Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits. ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨http://www.ieee-ets.org/past_events/ets13/program.php⟩. ⟨lirmm-00820084⟩
  • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Implementing model redundancy in predictive alternate test to improve test confidence. ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩. ⟨lirmm-00820077⟩
  • Florence Azaïs, Laurent Larguier, Michel Renovell. Logic Errors in CMOS Circuits due to Simultaneous Switching Noise. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.59-64, 2007. ⟨lirmm-00154744⟩
  • Da. Martin, Gérard Haller, Florence Azaïs, Pascal Nouet. On the Development of a Low-Cost Diagnostic Flow for Efficient Failure Analysis. ETS: European Test Symposium, May 2004, Ajaccio, France. 9th IEEE European Test Symposium, 2004. ⟨lirmm-00108658⟩

Books1 document

  • Florence Azaïs, Serge Bernard, Yves Bertrand, Marie-Lise Flottes, Patrick Girard, et al.. Test de Circuits et de Systèmes Intégrés. Collection EGEM, Ed.Hermès, 2004, 2-7462-0864-4. ⟨lirmm-00109158⟩

Book sections2 documents

  • Michel Renovell, Florence Azaïs, Joan Figueras, Rosa Rodríguez-Montañés, Daniel Arumi. Models for Bridging Defects. Models in Hardware Testing, 43, Springer Netherlands, pp.33-70, 2010, Frontiers in Electronic Testing, 978-90-481-3281-2. ⟨lirmm-00371365⟩
  • Florence Azaïs, Pascal Nouet. Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test Standard. Huertas J.L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, pp.28, 2004, 1-4020-7724-6. ⟨lirmm-00109159⟩

Directions of work or proceedings1 document

  • Marcello Lubaszewski, Florence Azaïs, Paolo Rech. Proceedings of 19th International Mixed-Signal Testing Workshop (IMSTW - 2014). Sep 2014, Porto Alegre, Brazil. IEEE, 2014. ⟨lirmm-01433614⟩

Patents6 documents

  • Florence Azaïs, Laurent Latorre, Stéphane David-Grignot, François Lefevre. Method And Apparatus For Measuring Phase Noise. France, Patent n° : 81582852EP01. 2013, pp.32. ⟨lirmm-00985404⟩
  • Christophe Entringer, Philippe Flatresse, Pascal Salomé, Pascal Nouet, Florence Azaïs. Gated thyristor and related system and method. United States, Patent n° : US7619863 (B2). 2009, pp.N/A. ⟨lirmm-00406923⟩
  • Christophe Entringer, Philippe Flatresse, Pascal Salomé, Florence Azaïs, Pascal Nouet. Thyristor à Grille. N° de brevet: 06/52837. 2006, pp.15. ⟨lirmm-00128273⟩
  • Benjamin Caillard, Stéphanie Dournelle, Pascal Salomé, Florence Azaïs, Pascal Nouet. Electrostatic Discharge Protection Device Comprising Several Thyristors. France, Patent n° : United States Patent n° 7-113-377. 2006, pp.N/A. ⟨lirmm-00406883⟩
  • Florence Azaïs, Benjamin Caillard, Stéphanie Dournelle, Pascal Nouet, Pascal Salomé. Smart Triggered Multifinger SCR (STMSCR). France, Patent n° : 0202009. 2002. ⟨lirmm-00090262⟩
  • Florence Azaïs, Benjamin Caillard, Stéphanie Dournelle, Pascal Nouet, Pascal Salomé. Smart Triggered Multifinger SCR (STMSCR). United States, Patent n° : 0202009. 9568. 2002, pp.P/N. ⟨lirmm-00268609⟩

Other publications11 documents

  • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. ⟨lirmm-00679018⟩
  • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. ⟨lirmm-00679022⟩
  • Patrick Girard, Florence Azaïs, Serge Bernard, Alberto Bosio, Luigi Dilillo, et al.. TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année. 2010. ⟨lirmm-00461745⟩
  • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire). 2010. ⟨lirmm-00504873⟩
  • Patrick Girard, Michel Renovell, Florence Azaïs, Yves Bertrand, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique Intermédiaire). 2003, pp.P nd. ⟨lirmm-00269720⟩
  • Patrick Girard, Michel Renovell, Florence Azaïs, Serge Bernard, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique de Fin d'Année). 2003, pp.P nd. ⟨lirmm-00269749⟩
  • Florence Azaïs, Benjamin Caillard, Pascal Nouet. Caractérisation TLP des Structures STMSCR du Run H8T106. 2003, pp.P nd. ⟨lirmm-00269719⟩
  • Florence Azaïs, Benjamin Caillard, Pascal Nouet. Modélisation Electrique de LSCR en Technologie H9. 2002. ⟨lirmm-00268608⟩
  • Patrick Girard, Florence Azaïs, Serge Bernard, Yves Bertrand, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe. 2002. ⟨lirmm-00268586⟩
  • Marie-Lise Flottes, Yves Bertrand, Florence Azaïs, Régis Lorival, Serge Bernard, et al.. Project Management and Trainer Education Deliverable: Management Report, Attendees and Training Contents, Training Evaluation. 2002. ⟨lirmm-00268593⟩
  • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Mixed-Signal BISR. 2002. ⟨lirmm-00268607⟩

Reports4 documents

  • Marie Lafont, Florence Azaïs, Pascal Nouet. Study of a Multi-Chip Circuit under CDM Stress. 06024, 2006, 20 p. ⟨lirmm-00102726⟩
  • Marie Lafont, Florence Azaïs, Pascal Nouet. HBM and CDM Stress Evaluation at Circuit Level. 06023, 2006, 15 p. ⟨lirmm-00102725⟩
  • Marie Lafont, Florence Azaïs, Pascal Nouet. Modelling and Comparison of TQFP48 and GBA64 Packages in CDM Environment. 06022, 2006, 40 p. ⟨lirmm-00102724⟩
  • Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand, Jean-.Michel Portal. A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect. [Research Report] 04080, Lirmm, University of Montpellier. 2004. ⟨lirmm-00109221⟩