Florence Azais
70
Documents
Publications
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Self-test and self-calibration of a MEMS convective accelerometerDTIP: Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2013, Barcelona, Spain. pp.239-242
Communication dans un congrès
lirmm-00814231v1
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Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategyLATW: Latin American Test Workshop, Apr 2012, Quito, Ecuador. ⟨10.1109/LATW.2012.6261237⟩
Communication dans un congrès
lirmm-00803451v1
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A MEMS Convective Accelerometer Equipped with On-Chip Facilities for Sensitivity Electrical CalibrationIMS3TW'11: IEEE International Mixed-Signals, Sensors and Systems Test Workshop, United States. pp.82-87, ⟨10.1109/IMS3TW.2011.21⟩
Communication dans un congrès
lirmm-00702759v1
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Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical SetupLATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. ⟨10.1109/LATW.2011.5985907⟩
Communication dans un congrès
lirmm-00702769v1
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Investigation on the Effect of Geometrical Dimensions on the Conductive Behaviour of a MEMS Convective AccelerometerDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.14-17
Communication dans un congrès
lirmm-00632610v1
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An Electrical Test Method for MEMS Convective Accelerometers: Development and EvaluationDATE: Design, Automation and Test in Europe, Mar 2011, Grenoble, France. ⟨10.1109/DATE.2011.5763137⟩
Communication dans un congrès
lirmm-00702754v1
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A Study of Package Effects on the Behavior of MEMS Convective AccelerometersDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.6-9
Communication dans un congrès
lirmm-00489026v1
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Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective AccelerometersIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494555v1
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Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester ChannelsLATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A
Communication dans un congrès
lirmm-00473524v1
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A Method for Electrical Calibration of MEMS Accelerometers Through Multivariate RegressionIMS3TW'09: IEEE 15th Mixed-Signals, Sensors and Systems Test Workshop, Jun 2009, pp.N/A
Communication dans un congrès
lirmm-00399110v1
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Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATEATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩
Communication dans un congrès
lirmm-00436384v1
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Investigations on Electrical-only Test Setup for MEMS Convective AccelerometerICSCS: International Conference on Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412624⟩
Communication dans un congrès
lirmm-00436265v1
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A Novel Method for Test and Calibration of Capacitive Accelerometers with a Fully Electrical SetupDDECS 2008 - 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2008, Bratislava, Slovakia. ⟨10.1109/DDECS.2008.4538807⟩
Communication dans un congrès
lirmm-00337873v1
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A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9
Communication dans un congrès
lirmm-00337880v1
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Caractérisation et Modélisation de Thyristors Parasites en Technologie CMOS Fortement SubmicroniqueColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 137-140
Communication dans un congrès
lirmm-00269319v1
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A Novel SCR-Based Protection Structure Against ESD with Efficient Multi-Finger TriggeringESSDERC'03: 3rd European Solid-State Device Research Conference, Estoril (Portugal), pp. 207-210
Communication dans un congrès
lirmm-00269605v1
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Conception de MEMS : de l'idée à l'integration SoC/SiPGDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France
Communication dans un congrès
lirmm-00361232v1
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Design of an IEEE 1149.4 Test Chip with Extended ABM FunctionalityIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159
Communication dans un congrès
lirmm-00269340v1
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Protection contre les ESD : Caractérisation et Modélisation de Thyristors ParasitesEOS/ESD/EMI Workshop, Toulouse (France), France. pp.P nd
Communication dans un congrès
lirmm-00269343v1
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Evaluation of a Fully Electrical Test and Calibration Method for MEMS Capacitive AccelerometersIMS3TW'08: 14th IEEE International Mixed-Signals, Sensor, and Systems Test Workshop, Jun 2008, Vancouver, Canada, pp.6, ⟨10.1109/IMS3TW.2008.4581616⟩
Communication dans un congrès
lirmm-00337875v1
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Transit Time Extraction Method for ESD Protection Diodes ModelIEW'08: International ESD Workshop, Port d'Albret, France
Communication dans un congrès
lirmm-00337884v1
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Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test StrategyIMSTW'03: 9th IEEE International Mixed-Signal Testing Workshop, Sevilla (Spain), France. pp. 99-103
Communication dans un congrès
lirmm-00269582v1
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STMSCR: A New Multi-Finger SCR-Based Protection Structure Against ESDEOS/ESD Symposium, Las Vegas (USA), pp. 223-241
Communication dans un congrès
lirmm-00269603v1
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Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time DomainEOS/ESD'07: 29th Electrical Overstress/Electrostatic Discharge Symposium, Sep 2007, Anaheim, CA, USA, pp.3A.2_1- 3A.2_10, ⟨10.1109/EOSESD.2007.4401748⟩
Communication dans un congrès
lirmm-00199232v1
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On the Use of LVTPNP in ESD Protection StructuresIEW'07: International Electrostatic Discharge Workshop, May 2007, Lake Tahoe, CA, United States
Communication dans un congrès
lirmm-00199246v1
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A simulation tool for CDM stress evaluation at circuit levelEOS/ESD/EMI Workshop, May 2006, Toulouse, France. pp.89-92
Communication dans un congrès
lirmm-00112986v1
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Partially Depleted SOI Body-Contacted MOSFET-Triggered Silicon Controlled Rectifier for ESD ProtectionEOS/ESD Symposium, Sep 2006, Tucson (USA), pp.6
Communication dans un congrès
lirmm-00112952v1
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Electro-thermal short pulsed simulation for SOI technologyESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany
Communication dans un congrès
lirmm-00112981v1
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On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field SensorLATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34
Communication dans un congrès
lirmm-00102750v1
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BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212
Communication dans un congrès
lirmm-00106516v1
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Design&Test of an Oscillation Based System Architecture for DNA Sensor ArraysIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.234-239
Communication dans un congrès
lirmm-00106525v1
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VHDL-AMS Fault Simulation for Testing DNA Bio-Sensing ArraysIEEE SENSORS, Oct 2005, Irvine, United States. ⟨10.1109/ICSENS.2005.1597878⟩
Communication dans un congrès
lirmm-00106042v1
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Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias ModulationLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218
Communication dans un congrès
lirmm-00106517v1
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On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorVTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218
Communication dans un congrès
lirmm-00105996v1
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Comparison Between 0.13 µm PD-SOI Gated Diode and non Gated Diode through DC TCAD SimulationsEUROSOI'05, Jan 2005, Grenade, Spain
Communication dans un congrès
lirmm-00106519v1
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Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS TestingIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219
Communication dans un congrès
lirmm-00106522v1
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Physics and Design Optimization of ESD Diode for 0.13mm PD-SOI TechnologyEOS/ESD: Electrical Overstress/Electrostatic Discharge, Sep 2005, Anaheim, United States
Communication dans un congrès
lirmm-00106041v1
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Towards On-Line Testing of MEMS Using Electro-Thermal ExcitationETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81
Communication dans un congrès
lirmm-00106009v1
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Optimised Probing Flow for High Speed Fault LocalizationISTFA'04: International Symposium on Testing and Failure Analysis, Nov 2004, Worcester (USA)
Communication dans un congrès
lirmm-00108898v1
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Investigations on the Use of EWS Data for Failure Diagnosis EnhancementLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena (Colombia), pp.6-10
Communication dans un congrès
lirmm-00108652v1
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On the Use of Electrical Stimuli for MEMS TestingLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122
Communication dans un congrès
lirmm-00108651v1
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Electrically-Induced Thermal Stimuli for MEMS TestingETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65
Communication dans un congrès
lirmm-00108904v1
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Electrical Modeling of LSCRs in Deep Submicron CMOS Technologies for Circuit-Level Simulation of ESDBCTM 2003 - Bipolar/BiCMOS Circuits and Technology Meeting, Sep 2003, Toulouse, France. pp.97-100, ⟨10.1109/BIPOL.2003.1274943⟩
Communication dans un congrès
lirmm-00269608v1
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On the Synthesis of Analog Cascaded Filters with Optimal Test Point InsertionLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216
Communication dans un congrès
lirmm-00269499v1
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Experimental test infrastructure supporting IEEE 11494 StandardETW: European Test Workshop, 2002, Corfou, Greece
Communication dans un congrès
lirmm-00268606v1
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Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test ChipBTW 2002 - 1st IEEE International Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2
Communication dans un congrès
lirmm-00269342v1
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Designing Testable Analog Filters with Optimal DFT InsertionIMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203
Communication dans un congrès
lirmm-00269341v1
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On the Development of a Low-Cost Diagnostic Flow for Efficient Failure AnalysisETS: European Test Symposium, May 2004, Ajaccio, France. 9th IEEE European Test Symposium, 2004
Poster de conférence
lirmm-00108658v1
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Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test StandardHuertas J.L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, pp.28, 2004, 1-4020-7724-6
Chapitre d'ouvrage
lirmm-00109159v1
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Gated thyristor and related system and methodUnited States, Patent n° : US7619863 (B2). 2009, pp.N/A
Brevet
lirmm-00406923v1
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Electrostatic Discharge Protection Device Comprising Several ThyristorsFrance, Patent n° : United States Patent n° 7-113-377. 2006, pp.N/A
Brevet
lirmm-00406883v1
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Thyristor à GrilleN° de brevet: 06/52837. 2006, pp.15
Brevet
lirmm-00128273v1
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Smart Triggered Multifinger SCR (STMSCR)United States, Patent n° : 0202009. 9568. 2002, pp.P/N
Brevet
lirmm-00268609v1
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Smart Triggered Multifinger SCR (STMSCR)France, Patent n° : 0202009. 2002
Brevet
lirmm-00090262v1
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Caractérisation TLP des Structures STMSCR du Run H8T1062003, pp.P nd
Autre publication scientifique
lirmm-00269719v1
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Modélisation Electrique de LSCR en Technologie H92002
Autre publication scientifique
lirmm-00268608v1
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Modelling and Comparison of TQFP48 and GBA64 Packages in CDM Environment06022, 2006, 40 p
Rapport
lirmm-00102724v1
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HBM and CDM Stress Evaluation at Circuit Level06023, 2006, 15 p
Rapport
lirmm-00102725v1
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Study of a Multi-Chip Circuit under CDM Stress06024, 2006, 20 p
Rapport
lirmm-00102726v1
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