Florence Azais
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Documents
Publications
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A Compact DC Model of Gate Oxide Short DefectMicroelectronic Engineering, 2004, 72 (1-4), pp.140-148. ⟨10.1016/j.mee.2003.12.051⟩
Article dans une revue
lirmm-00108564v1
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GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact ModelLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil
Communication dans un congrès
lirmm-00269604v1
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A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect[Research Report] 04080, Lirmm, University of Montpellier. 2004
Rapport
lirmm-00109221v1
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