CV Accueil - Archive ouverte HAL

	Atomic-scale and optical investigation of nanostructured Er disilicates in silica S. Guehairia , Rémi Demoulin , H. Merabet , Philippe Pareige , Julien Cardin Journal of Alloys and Compounds, 2022, 926, pp.166947. ⟨10.1016/j.jallcom.2022.166947⟩ Article dans une revue hal-03762893v1
	Influence of phosphorus on the growth and the photoluminescence properties of Si-NCs formed in P-doped SiO/SiO 2 multilayers Fatme Trad , Alaa E Giba , Xavier Devaux , Mathieu Stoffel , Denis Zhigunov Nanoscale, 2021, ⟨10.1039/D1NR04765E⟩ Article dans une revue hal-03457250v1
	Correlation of luminescence measurements to the structural characterization of Pr3+-doped HfSiOx Rémi Demoulin , L. Khomenkova , C. Labbe , F. Gourbilleau , Celia Castro Journal of Luminescence, 2021, 235, pp.118004. ⟨10.1016/j.jlumin.2021.118004⟩ Article dans une revue hal-03164169v1
	Correlated Structural and Luminescence Analysis of B‐Doped Si‐Nanocrystals Embedded in Silica Rémi Demoulin , Dominique Muller , Daniel Mathiot , Philippe Pareige , Etienne Talbot physica status solidi (RRL) - Rapid Research Letters, 2020, 14 (6), pp.2000107. ⟨10.1002/pssr.202000107⟩ Article dans une revue hal-03329836v1
	Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography Rémi Demoulin , Manuel Roussel , Sébastien Duguay , Dominique Muller , Daniel Mathiot Journal of Physical Chemistry C, 2019, 123 (12), pp.7381-7389. ⟨10.1021/acs.jpcc.8b08620⟩ Article dans une revue hal-02082140v1
	On the interplay between Si-Er-O segregation and erbium silicate (Er 2 Si 2 O 7 ) formation in Er-doped SiO x thin films Georges Beainy , C. Frilay , Philippe Pareige , F. Gourbilleau , Etienne Talbot Journal of Alloys and Compounds, 2018, 755, pp.55 - 60. ⟨10.1016/j.jallcom.2018.04.310⟩ Article dans une revue hal-01785730v1
	Origin of Pr 3+ luminescence in hafnium silicate films: combined atom probe tomography and TEM investigations Rémi Demoulin , Georges Beainy , Celia Castro , Philippe Pareige , Larysa Khomenkova Nano Futures, 2018, 2 (3), pp.2. ⟨10.1088/2399-1984/aad009⟩ Article dans une revue hal-01845624v1
	Correlation between the nanoscale structure and the optical properties of Ce-doped SiO 1.5 thin films Georges Beainy , Jennifer Weimmerskirch-Aubatin , Mathieu Stoffel , Michel Vergnat , Hervé Rinnert Journal of Luminescence, 2017, 191, pp.88 - 91. ⟨10.1016/j.jlumin.2016.10.017⟩ Article dans une revue hal-01633490v1
	Direct Insight into Ce-Silicates/Si-Nanoclusters Snowman-Like Janus Nanoparticles Formation in Ce-Doped SiO x Thin Layers Georges Beainy , Jennifer Weimmerskirch-Aubatin , Mathieu Stoffel , Michel Vergnat , Hervé Rinnert Journal of Physical Chemistry C, 2017, 121 (22), pp.12447-12453. ⟨10.1021/acs.jpcc.7b03199⟩ Article dans une revue hal-02180298v1
	Structural and optical study of Ce segregation in Ce-doped SiO 1.5 thin films Georges Beainy , Jennifer Weimmerskirch-Aubatin , Mathieu Stoffel , M. Vergnat , Hervé Rinnert Journal of Applied Physics, 2015, 118 (23), pp.234308. ⟨10.1063/1.4938061⟩ Article dans une revue hal-01633488v1
	Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters Nooshin Amirifar , Rodrigue Lardé , Etienne Talbot , Philippe Pareige , Lorenzo Rigutti Journal of Applied Physics, 2015, 118 (21), pp.215703. ⟨10.1063/1.4936167⟩ Article dans une revue hal-01241229v1
	Observation of a nanoscale phase separation in blue-emitting Ce-doped SiO1.5 thin films Jennifer Weimmerskirch-Aubatin , Mathieu Stoffel , Xavier Devaux , Alexandre Bouché , Georges Beainy Journal of Materials Chemistry C, 2015, 3 (48), pp.12499-12506. ⟨10.1039/c5tc02722e⟩ Article dans une revue hal-01271639v1
	Atomic scale investigation of Si and Ce-rich nanoclusters in Ce-doped SiO1.5 thin films Georges Beainy , Jennifer Weimmerskirch-Aubatin , Mathieu Stoffel , Michel Vergnat , Hervé Rinnert physica status solidi (c), 2015, 12 (12), pp.1313 - 1316. ⟨10.1002/pssc.201510081⟩ Article dans une revue hal-01611700v1
	Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field Lorenzo Mancini , Nooshin Amirifar , Deodatta Shinde , Ivan Blum , Matthieu Gilbert Journal of Physical Chemistry C, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩ Article dans une revue hal-01163403v1
	Confined phase separation in SiO$_X$ nanometric thin layers Manuel Roussel , Etienne Talbot , Cristelle Pareige , R.P. Nalini , Fabrice Gourbilleau Applied Physics Letters, 2013, 103, pp.203109. ⟨10.1063/1.4830375⟩ Article dans une revue hal-00966660v1
	Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica Etienne Talbot , Rodrigue Lardé , Philippe Pareige , Larysa Khomenkova , Khalil Hijazi Nanoscale Research Letters, 2013, 8, pp.39. ⟨10.1186/1556-276X-8-39⟩ Article dans une revue hal-00786012v1
	Influence of the supersaturation on Si diffusion and growth of Si nanoparticles in silcion-rich silica Manuel Roussel , Etienne Talbot , Philippe Pareige , Fabrice Gourbilleau Journal of Applied Physics, 2013, 113, pp.063519. ⟨10.1063/1.4792218⟩ Article dans une revue hal-00788699v1
	Phase transformation in SiOx/SiO2 multilayers for optielectronics and microelectronics applications Manuel Roussel , Etienne Talbot , R.P. Nalini , Fabrice Gourbilleau , Philippe Pareige Ultramicroscopy, 2013, 132, pp.290. ⟨10.1016/j.ultramic.2012.10.013⟩ Article dans une revue hal-00861764v1
	Atomic scale observation of phase separation and formation of silicon clusters in Hf higk-κ silicates Etienne Talbot , Manuel Roussel , C. Genevois , Philippe Pareige , Larysa Khomenkova Journal of Applied Physics, 2012, 111, pp.103519. ⟨10.1063/1.4718440⟩ Article dans une revue hal-00738660v1
	Atomic scale microstructures of high-k HfSiO thin films fabricated by magnetron sputtering Etienne Talbot , Manuel Roussel , Larysa Khomenkova , Fabrice Gourbilleau , Philippe Pareige Materials Science and Engineering: B, 2012, 177 (10), pp.717 - 720. ⟨10.1016/j.mseb.2011.10.011⟩ Article dans une revue hal-01633475v1
	Evidence of Superparamagnetic Co Clusters in Pulsed Laser Deposition-Grown Zn 0.9 Co 0.1 O Thin Films Using Atom Probe Tomography Rodrigue Lardé , Etienne Talbot , Philippe Pareige , Herrade Bieber , Guy Schmerber Journal of the American Chemical Society, 2011, 133 (5), pp.1451-1458. ⟨10.1021/ja108290u⟩ Article dans une revue hal-01633468v1
	Characterization and metrology of nanoclusters-based nanostructures Philippe Pareige , Manuel Roussel , Lardé Rodrigue , Ramesh Pratibha Nalini , Fabrice Gourbilleau ECS Transactions, 2011, 35 (18), pp.55. ⟨10.1149/1.3647904⟩ Article dans une revue hal-01633471v1
	(Invited) Characterization and Metrology of Nanoclusters-Based Nanostructures by Atom Probe Tomography Philippe Pareige , Rodrigue Lardé , F. Gourbilleau , Etienne Talbot ECS Meeting Abstracts, 2011, MA2011-01 (19), pp.1252-1252. ⟨10.1149/MA2011-01/19/1252⟩ Article dans une revue hal-03820066v1
	Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography. Manuel Roussel , Etienne Talbot , F. Gourbilleau , Philippe Pareige Nanoscale Research Letters, 2011, 6, pp.164. ⟨10.1186/1556-276X-6-164⟩ Article dans une revue hal-00737879v1
	Atomic scale investigation of silicon nanowires and nanoclusters Manuel Roussel , W.H. Chen , Etienne Talbot , Rodrigue Lardé , E. Cadel Nanoscale Research Letters, 2011, 6, pp.271-1-6. ⟨10.1186/1556-276X-6-271⟩ Article dans une revue hal-00597078v1
	Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide Rodrigue Lardé , Etienne Talbot , François Vurpillot , Philippe Pareige , G. Schmerber Journal of Applied Physics, 2009, 105 (12), pp.126107. ⟨10.1063/1.3152579⟩ Article dans une revue hal-01633464v1
	Si nanoparticles in SiO 2 An atomic scale observation for optimization of optical devices Etienne Talbot , Rodrigue Lardé , F. Gourbilleau , C. Dufour , Philippe Pareige EPL - Europhysics Letters, 2009, 87 (2), ⟨10.1209/0295-5075/87/26004⟩ Article dans une revue hal-01633465v1

	Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO 2 Rémi Demoulin , Manuel Roussel , Sébastien Duguay , D. Muller , D. Mathiot Microscopy & Microanalysis 2019, Aug 2019, Portland, United States. pp.2540-2541, ⟨10.1017/S1431927619013436⟩ Communication dans un congrès hal-02294165v1
	Métrologie du dopage de nanocristaux de silicium par sonde atomique tomographique Etienne Talbot , Rémi Demoulin , Philippe Pareige , Dominique Muller , Daniel Mathiot Réunion plénière du GDR NACRE, Nov 2018, Paris, France Communication dans un congrès hal-02120693v1
	Rare-earth clustering in silicon rich silica: precipitation mechanisms and optical properties Etienne Talbot , Georges Beainy , Philippe Pareige , Fabrice Gourbilleau , Jennifer Weimmerskirch-Aubatin Spring EMRS 2017, May 2017, Strasbourg, France Communication dans un congrès hal-02120705v1
	Growth of silicon nanoparticles in silica by spinodal decomposition Etienne Talbot , Manuel Roussel , Cristelle Pareige , Georges Beainy , Fabrice Gourbilleau Spring EMRS 2016, May 2016, Lille, France Communication dans un congrès hal-02120711v1
	Growth of silicon nanoparticles in silica at atomic scale: influence of rare-earth dopants Etienne Talbot , Manuel Roussel , Cristelle Pareige , Georges Beainy , Fabrice Gourbilleau Spring EMRS 2015, May 2015, Lille, France Communication dans un congrès hal-02120861v1
	Investigation of the Si-rich silicon oxide by 3D atom probe tomography Etienne Talbot , Rodrigue Lardé , Fabrice Gourbilleau , Christian Dufour , Philippe Pareige 2008 MRS Fall Meeting, Dec 2008, Boston, United States. ⟨10.1557/PROC-1111-D06-08-MM09-08⟩ Communication dans un congrès hal-01633462v1

Etienne Talbot

Présentation

Publications

Atomic-scale and optical investigation of nanostructured Er disilicates in silica

Influence of phosphorus on the growth and the photoluminescence properties of Si-NCs formed in P-doped SiO/SiO 2 multilayers

Correlation of luminescence measurements to the structural characterization of Pr3+-doped HfSiOx

Correlated Structural and Luminescence Analysis of B‐Doped Si‐Nanocrystals Embedded in Silica

Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography

On the interplay between Si-Er-O segregation and erbium silicate (Er 2 Si 2 O 7 ) formation in Er-doped SiO x thin films

Origin of Pr 3+ luminescence in hafnium silicate films: combined atom probe tomography and TEM investigations

Correlation between the nanoscale structure and the optical properties of Ce-doped SiO 1.5 thin films

Direct Insight into Ce-Silicates/Si-Nanoclusters Snowman-Like Janus Nanoparticles Formation in Ce-Doped SiO x Thin Layers

Structural and optical study of Ce segregation in Ce-doped SiO 1.5 thin films

Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters

Observation of a nanoscale phase separation in blue-emitting Ce-doped SiO1.5 thin films

Atomic scale investigation of Si and Ce-rich nanoclusters in Ce-doped SiO1.5 thin films

Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Confined phase separation in SiO$_X$ nanometric thin layers

Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica

Influence of the supersaturation on Si diffusion and growth of Si nanoparticles in silcion-rich silica

Phase transformation in SiOx/SiO2 multilayers for optielectronics and microelectronics applications

Atomic scale observation of phase separation and formation of silicon clusters in Hf higk-κ silicates

Atomic scale microstructures of high-k HfSiO thin films fabricated by magnetron sputtering

Evidence of Superparamagnetic Co Clusters in Pulsed Laser Deposition-Grown Zn 0.9 Co 0.1 O Thin Films Using Atom Probe Tomography

Characterization and metrology of nanoclusters-based nanostructures

(Invited) Characterization and Metrology of Nanoclusters-Based Nanostructures by Atom Probe Tomography

Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography.

Atomic scale investigation of silicon nanowires and nanoclusters

Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide

Si nanoparticles in SiO 2 An atomic scale observation for optimization of optical devices

Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO 2

Métrologie du dopage de nanocristaux de silicium par sonde atomique tomographique

Rare-earth clustering in silicon rich silica: precipitation mechanisms and optical properties

Growth of silicon nanoparticles in silica by spinodal decomposition

Growth of silicon nanoparticles in silica at atomic scale: influence of rare-earth dopants

Investigation of the Si-rich silicon oxide by 3D atom probe tomography