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An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurementsReview of Scientific Instruments, 2013, 84 (12), pp.123705. ⟨10.1063/1.4848995⟩
Article dans une revue
hal-00922585v1
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[Invited] SMM characterization of Au nanodots and FcC11SH moleculesXX Annual Linz Winter Workshop, Advances in Single-Molecule Research for Biology & Nanoscience, Feb 2018, Linz, Austria
Communication dans un congrès
hal-01962187v1
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Sub-10 nm-scale capacitors and tunnel junctions measurements by SMM coupled to RF interferometry45th European Microwave Conference EuMC 2015, Sep 2015, Paris, France. ⟨10.1109/EuMC.2015.7345849⟩
Communication dans un congrès
hal-01962399v1
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Interferometric scanning microwave microscope for nanotechnology applicationAmerican Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States
Communication dans un congrès
hal-00811777v1
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SOL-like calibrated RF measurements at the nanoscale on a modified scanning microwave microscope2nd Nano Measure Scientific Symposium, Nano Measure 2012, 2012, Stanford, CA, United States
Communication dans un congrès
hal-00797722v1
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