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Arnaud Virazel

9
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  • 1100642
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Présentation

Enseignant-chercheur au **LIRMM** dans l’équipe de recherche **TEST**: Test and dEpendability of microelectronic integrated SysTems. <https://www.lirmm.fr/recherche/equipes/test> **Cours** : <http://www.lirmm.fr/~virazel/COURS/index.php?dir=L1%20-%20HLEE202/Cours/> **Researchgate** : [https://www.researchgate.net/profile/Arnaud\_Virazel](https://www.researchgate.net/profile/Arnaud_Virazel)

Publications

938981

Auto-adaptive ultra-low power IC

Alberto Bosio , Philippe Debaud , Patrick Girard , Stéphane Guilhot , Miroslav Valka
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2016, Istanbaul, Turkey. ⟨10.1109/DTIS.2016.7483886⟩
Communication dans un congrès lirmm-01457361v1

Design-for-Diagnosis Architecture for Power Switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩
Communication dans un congrès lirmm-01272684v1

iBoX — Jitter based Power Supply Noise sensor

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel
ETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩
Communication dans un congrès lirmm-01248601v1

Test and diagnosis of power switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩
Communication dans un congrès lirmm-01248590v1

Power Supply Noise Sensor Based on Timing Uncertainty Measurements

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩
Communication dans un congrès lirmm-00806890v1

Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès lirmm-00806859v1

A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
ETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩
Communication dans un congrès lirmm-00647822v1

Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector

Luigi Dilillo , Alberto Bosio , Miroslav Valka , Patrick Girard , Serge Pravossoudovitch
DFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩
Communication dans un congrès lirmm-00651226v1