Number of documents

1

Yi Liu


Charge de Recherche, CR1, CNRS

Laboratoire d'Optique Appliquée

group ILM


IOP Conference Series: Materials Science and Engineering   

Journal articles1 document

  • Y Liu, D. Tainoff, M. Boukhari, J. Richard, A. Barski, et al.. Sensitive 3-omega measurements on epitaxial thermoelectric thin films. IOP Conference Series: Materials Science and Engineering, IOP Publishing, 2014, 68, pp.012005. ⟨10.1088/1757-899X/68/1/012005⟩. ⟨cea-01996778⟩