Nombre de documents

108

Yann Le Bihan (Professeur à l'Université Paris-Sud)


Yann Le Bihan est un ancien élève de l'ENS de Cachan (Agrégation de Génie Electrique en 1996). Il a obtenu un Doctorat de l'ENS de Cachan en 2000 puis l'Habilitation à Diriger des Recherches de l'Université Paris-Sud en 2007. De 2001 à 2011 il a été Maître de Conférences à l’IUT de Cachan (Université Paris-Sud). Depuis 2011, il est Professeur des Universités à l’IUT de Cachan.

En 2000 il a rejoint le LGEP (Laboratoire de Génie Electrique de Paris), devenu GeePs (Génie électrique et électronique de Paris) en 2015.  Son activité de recherche porte principalement sur la caractérisation et le contrôle non destructif par méthodes électromagnétiques : modélisation, conception de capteurs, problèmes inverses.


Article dans une revue35 documents

  • Alexandra Christophe, Yann Le Bihan, Francesca Rapetti. A mortar element approach on overlapping non-nested grids: Application to eddy current non-destructive testing. Applied Mathematics and Computation, Elsevier, 2015, 267, pp.71-82. <hal-01254684>
  • Chelabi Mohamed, Tarik Hacib, Zoubida Belli, Mohamed Rachid Mekideche, Yann Le Bihan. The combination of adaptive database SDM and multi-output SVM for eddy current testing. COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, Emerald, 2015, 34 (6), pp.1731-1739. <hal-01254657>
  • Laurent Stubbe, Yann Le Bihan, Andre-Emmanuel Ozout, Gaëlle Herivan, Éric Berthelot. An Eddy Current System for the Study of the Cranial Rhythmic Impulse. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2015, 51 (1), 3 p. <hal-01256983>
  • Abla Dahia, Yann Le Bihan, Éric Berthelot, Laurent Daniel. A model-based method for the characterisation of stress in magnetic materials using eddy current non-destructive evaluation. Journal of Physics D, 2015, 48 (19), 10 p. <hal-01254884>
  • Marjorie Grzeskowiak, Fatiha El Hatmi, Antoine Diet, Benamara Megdouda, David Delcroix, et al.. Coils for ingestible capsules: Near-field magnetic induction link . Comptes rendus de l’Académie des sciences. Série IV, Physique, astrophysique, Elsevier, 2015, 16 (9), pp. 819-835. <hal-01257135>
  • Tao Peng, Johan Moulin, Francisco Alves, Yann Le Bihan. Fabrication and AC characterization of magneto-impedance microsensors for alternating magnetic field measurement. International Journal of Applied Electromagnetics and Mechanics, 2014, 45 (1-4 / 2014), pp.809-816. <10.3233/JAE-141910>. <hal-01099319>
  • Houda Zaidi, Laurent Santandrea, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Finite element simulation of the probe displacement in eddy current testing. International Journal of Applied Electromagnetics and Mechanics, 2014, 45 (1-4 / 2014), pp.887-893. <http://iospress.metapress.com/content/e641118936725642/?issue=1&genre=article&spage=887&issn=1383-5416&volume=45>. <10.3233/JAE-141921>. <hal-01099318>
  • Yann Le Bihan, József Pávó, Claude Marchand. Partial least square regression: an analysis tool for quantitative non-destructive testing. European Physical Journal: Applied Physics, EDP Sciences, 2014, 67 (3), pp.30901. <10.1051/epjap/2014130487>. <hal-01099333>
  • Yann Le Bihan. Analytical modeling of an inductive sensor with open magnetic core and conductive shielding above a multi-layered medium. European Physical Journal: Applied Physics, EDP Sciences, 2014, 65 (3), 30901 (7 p.). <10.1051/epjap/2013130488>. <hal-01099334>
  • Marjorie Grzeskowiak, Antoine Diet, Stephane Protat, Christophe Bourcier, Yann Le Bihan, et al.. Pebbles Tracking Thanks to RFID LF Multi-Loops Inductively Coupled Reader. Progress In Electromagnetics Research C, 2014, 55, pp.129 - 137. <hal-01104660>
  • Alexandra Christophe, Laurent Santandrea, Francesca Rapetti, Guillaume Krebs, Yann Le Bihan. An Overlapping Nonmatching Grid Mortar Element Method for Maxwell's Equations. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2014, 50 (2), pp.Article 7010004. <10.1109/TMAG.2013.2282034>. <hal-01093403>
  • Houda Zaidi, Laurent Santandrea, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Efficient FEM modeling of printed coils for eddy current testing. European Physical Journal Applied Physics EPJAP, 2013, 64 (2), pp.24510. <hal-01271826>
  • Chiara Zorni, Christophe Reboud, Jean-Marc Decitre, Laurent Santandréa, Yann Le Bihan, et al.. Modelling eddy current testing of ferromagnetic medium. International Journal of Applied Electromagnetics and Mechanics, 2012, 39 (1), pp.245-250. <10.3233/JAE-2012-1467>. <hal-00756275>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Use of Overlapping Finite Elements for Connecting Arbitrary Surfaces With Dual Formulations. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2012, 48 (2), pp.583-586. <10.1109/TMAG.2011.2175907>. <hal-00779504>
  • Denis Premel, Damien Molka, Sylvain Chatillon, Yann Le Bihan. Numerical simulation of electromagnetic acoustic transducers in time domain. Studies in Applied Electromagnetics and Mechanics, 2012, 36, pp.19-28. <10.3233/978-1-60750-968-4-19>. <hal-00779503>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Modeling of thin conductive and magnetic layers in eddy current testing by overlapping finite elements. International Journal of Applied Electromagnetics and Mechanics, 2012, 39 (1-4), pp.341-346. <10.3233/JAE-2012-1480>. <hal-00779505>
  • Mostafa-Kamel Smaïl, Yann Le Bihan, Lionel Pichon. Fast diagnosis of transmission lines using neural networks and principal component analysis. International Journal of Applied Electromagnetics and Mechanics, 2012, 39 (1-4), pp.435-441. <10.3233/JAE-2012-1493>. <hal-00779080>
  • Abdelghani Ayad, Farid Benhamida, Mohamed Bensetti, Yann Le Bihan, Abdelbaar Bendaoud. Solution of Inverse Problems in Electromagnetic NDT Using Neural Networks. Przeglad Elektrotechniczny, 2011, 2011 (9a), pp.330-333. <hal-00712479>
  • Guillaume Krebs, Thomas Henneron, Stéphane Clenet, Yann Le Bihan. Overlapping finite elements used to connect non-conforming meshes in 3-D with a vector potential formulation. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2011, 47 (5), pp.1218-1221. <10.1109/TMAG.2010.2074189>. <hal-00712477>
  • Tarik Hacib, Yann Le Bihan, Mostafa-Kamel Smaïl, Mohamed Rachid Mekideche, Olivier Meyer, et al.. Microwave Characterization Using Ridge Polynomial Neural Networks and Least-Square Support Vector Machines. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2011, 47 (5), pp.990-993. <10.1109/TMAG.2010.2087743>. <hal-00711555>
  • Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan, Mohamed Rachid Mekideche, Olivier Meyer, et al.. Support vector machines for measuring dielectric properties of materials. COMPEL, 2010, 29 (4), pp.1081-1089. <hal-00555259>
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Modeling of thin structures in eddy current testing with shell elements. European Physical Journal: Applied Physics, EDP Sciences, 2010, 52 (2), pp.23303-23308. <10.1051/epjap/2010082>. <hal-00555697>
  • Tarik Hacib, Yann Le Bihan, Mohamed Rachid Mekideche, Hulusi Acikgoz, Olivier Meyer, et al.. Microwave Characterization Using Least-Square Support vector Machines. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2010, 46 (8), pp.2811-2814. <hal-00555258>
  • A. Ospina, L. Santandrea, Y. Le Bihan, C. Marchand. Modeling of thin structures in eddy current testing with shell elements. European Physical Journal: Applied Physics, EDP Sciences, 2010, 52 (2), <10.1051/epjap/2010082>. <hal-00634365>
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Electromagnetic Field Computation in Magnetic and Conductive Thin sheets. Sensor letters, American Scientific Publishers, 2009, 7 (3), pp. 480-485. <hal-00447227>
  • Hulusi Acikgoz, Benjamin Jannier, Yann Le Bihan, Olivier Dubrunfaut, Olivier Meyer, et al.. Direct and inverse modeling of a microwave sensor determining the proportion of fluids in a pipeline. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2009, 45 (3), pp. 1510-1513. <hal-00446570>
  • Hulusi Acikgoz, Benjamin Jannier, Yann Le Bihan, Olivier Dubrunfaut, Olivier Meyer, et al.. Direct and Inverse Modeling of a Microwave Sensor Determining the Proportion of Fluids in a Pipeline. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2009, 45 (3), pp. 1510-1513. <hal-00447295>
  • Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing. Sensor letters, American Scientific Publishers, 2009, 7 (5), pp. 475-479. <hal-00447220>
  • Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Non-destructive evaluation of small defects using an eddy current microcoil sensor array. Sensor letters, American Scientific Publishers, 2009, 7 (3), pp. 400-405. <hal-00447228>
  • Hulusi Acikgoz, Laurent Santandréa, Yann Le Bihan, S. Gyimothy, J. Pavo, et al.. Generation and use of optimised databases in microwave characterisation. IET Science Measurement and Technology, Institution of Engineering and Technology, 2008, 2 (6), pp.467-473. <10.1049/iet-smt:20080086>. <hal-00763791>
  • Yann Le Bihan, J. Pavo, Claude Marchand. Characterization of small cracks in eddy current testing. European Physical Journal: Applied Physics, EDP Sciences, 2008, 43 (2), pp.231-237. <10.1051/epjap:2008112>. <hal-00761612>
  • Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects. Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293. <hal-00354401>
  • Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Microwave characterization of dielectric materials using Bayesian neural networks. Progress In Electromagnetics Research, EMW Publishing, 2008, 03, pp.169-182. <hal-00351284>
  • Mohamed Bensetti, Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Adaptive mesh refinement and probe signal calculation in eddy current NDT by complementary formulations. IEEE Transactions on Magnetics, Institute of Electrical and Electronics Engineers, 2008, 44 (6), pp.1646 - 1649. <hal-00352639>
  • Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Neural networks for broad-band evaluation of complex permittivity using a coaxial discontinuity. European Physical Journal: Applied Physics, EDP Sciences, 2007, 39 (2), pp.197-201. <hal-00322873>

Communication dans un congrès66 documents

  • Fethi Benyoubi, Yann Le Bihan, Mohamed Bensetti, Lionel Pichon, Mouloud Feliachi, et al.. Développement d'un modèle équivalent pour la réduction du champ magnétique rayonné par un moteur à courant continu. CEM2016, 18ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique,, Jul 2016, Rennes, France. 2016. <hal-01388634>
  • Toufik Boubehziz, Alexandra Christophe, Laurent Santandrea, Yann Le Bihan. Mise en œuvre informatique et analyse des performances comparées d’une méthode de décomposition de domaine en recouvrement avec joints. 8ème Conférence Européenne sur les Méthodes Numériques en Electromagnétisme (NUMELEC 2015), Jun 2015, Saint-Nazaire, France. 2 p. <hal-01255989>
  • Jinane Harmouche, Claude Delpha, Yann Le-Bihan, Demba Diallo. Non-Destructive incipient damage detection using Kullback-Leibler divergence. IEEE. International Symposium on Industrial Electronics - ISIE 2015, Jun 2015, Rio de Janeiro, Brazil. pp.913-918. <hal-01169228>
  • Jinane Harmouche, Karim Tout, Claude Delpha, Yann Le-Bihan, Demba Diallo. Détection de fissures par courants de Foucault en utilisant la divergence de Kullback-Leibler. GRETSI 2015, Sep 2015, Lyon, France. <hal-01193157>
  • Benjamin Delabre, Jean-Marc Decitre, Yann Le Bihan, Eric Berthelot. Design of a flexible eddy current sensor in view of the evaluation of electromagnetic properties of a material. 54th Annual British Conference of Non-Destructive Testing, Sep 2015, Telford, United Kingdom. 10 p. <hal-01243586>
  • Antoine Diet, Marjorie Grzeskowiak, Yann Le Bihan, M. Benamara, Christophe Conessa, et al.. Detection tube for small HF RFID tags, thanks to mutual coupling with a coil resonator. European Microwave Conference, Sep 2015, Paris, France. 2015. <hal-01239709>
  • Guillaume Krebs, Laurent Santandréa, Francesca Rapetti, Yann Le Bihan, Alexandra Christophe. A Mortar Edge Element Method with Overlapping for Time Domain Magnetodynamic Calculations. CEM 2014, Mar 2014, London, United Kingdom. Proceedings of the 9th IET International Conference on Computation in Electromagnetics, pp.1-2, <10.1049/cp.2014.0187>. <hal-01093425>
  • Andre-Emmanuel Ozout, Gaëlle Herivan, Yann Le Bihan, Laurent Stubbe, Éric Berthelot. An Eddy Current System for the Study of the Cranial Rhythmic Impulse. EMSA 2014, Jul 2014, Vienna, Austria. Proceedings of the 10th European Conference on Magnetic Sensors and Actuators. <hal-01099322>
  • Alexandra Christophe, Francesca Rapetti, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Mortar FEs on Overlapping Meshes: Application to Magnetodynamic. ESCO 2014, Jun 2014, Pilsen, Czech Republic. Proceedings of the 4th European Seminar on Computing. <hal-01099226>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Modeling of flexible probes for eddy current testing. CEFC 2014, May 2014, Annecy, France. Proceedings of the 16th Biennial IEEE Conference on Electromagnetic Field Computation. <hal-01099312>
  • Abla Dahia, Eric Berthelot, Yann Le Bihan, Laurent Daniel. Méthode de caractérisation non destructive par courants de Foucault de l’état de contraintes dans les matériaux magnétiques. Journées COFREND 2014, May 2014, Bordeaux, France. Actes des Journées COFREND 2014. <hal-01099316>
  • M. Chelabi, Tarik Hacib, Z. Belli, Mohamed Mekideche, Yann Le Bihan. Optimal database combining with Multi Output Support Vector Machine for Eddy Current Testing. EVER 2014, Mar 2014, Monaco, Monaco. Proceedings of the Ninth International Conference on Ecological Vehicles and Renewable Energies, pp.1 - 4, <10.1109/EVER.2014.6844142>. <hal-01099330>
  • Hakim Sadou, Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan. Use of ANFIS for Microwave Sensor Determining the Dielectric Properties of Materials. EMSA 2014, Jul 2014, Vienna, Austria. Proceedings of the 10th European Conference on Magnetic Sensors and Actuators, pp.78. <hal-01099328>
  • M. Chelabi, Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan. Non-destructive Evaluation of Small Defects Using a Combination between 3D FEM and Multi-output SVM. EMSA 2014, Jul 2014, Vienna, Austria. Proceedings of 10th European Conference on Magnetic Sensors and Actuators, pp.255. <hal-01099321>
  • Abla Dahia, Éric Berthelot, Yann Le Bihan, Laurent Daniel. Numerical and Experimental Study of the Eddy Current Non-destructive Testing of Stress in Magnetic Materials. EMSA 2014, Jul 2014, Vienna, Austria. Proceedings of the 10th European Conference on Magnetic Sensors and Actuators, pp.146. <hal-01099324>
  • Abla Dahia, Eric Berthelot, Yann Le Bihan, Laurent Daniel. Caractérisation non destructive par courants de Foucault de l'état de contraintes dans les matériaux magnétiques. Symposium de Génie Électrique 2014, Jul 2014, Cachan, France. <hal-01065303>
  • Antoine Diet, Marjorie Grzeskowiak, Yann Le Bihan, Christophe Conessa. Improving LF Reader Antenna volume of detection for RFID token tag thanks to Identical Coaxial Loops (ICLs) and in/out-of phase multiple-loops structures. IEEE RFID-TA 2014, Sep 2014, Tampere, Finland. Proceedings of the 2014 IEEE RFID Technology and Applications Conference, 2014, <10.1109/RFID-TA.2014.6934229>. <hal-01104665>
  • Alexandra Christophe, Francesca Rapetti, Yann Le Bihan, Edouard Demaldent. Méthode de décomposition de domaine pour la modélisation de contrôles non destructifs par courants de Foucault. COFREND 2014, May 2014, Bordeaux, France. Actes des Journées COFREND 2014. <hal-01096607>
  • Alexandra Christophe, Laurent Santandréa, Yann Le Bihan, Francesca Rapetti. Numerical method with overlapping non-matching grids to take into account the displacement for eddy current problems. CEFC 2014, May 2014, Annecy, France. Proceedings of the 16th Biennial IEEE Conference on Electromagnetic Field Computation. <hal-01096614>
  • Alexandra Christophe, Francesca Rapetti, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Mortar FEs on overlapping subdomains for eddy current non destructive testing. Enumath 2013, Aug 2013, Lausanne, Suisse. 2013. <hal-00932676>
  • Yann Le Bihan. Aspects expérimentaux du contrôle non destructif par courants de Foucault. Colloque Inductique 2013, Apr 2013, Tizi-Ouzou, Algérie. 2013. <hal-00932721>
  • M. Chelabi, Tarik Hacib, Yann Le Bihan, H. Sadou. Cracks reconstruction from eddy current testing signals using multi regression SVM. Colloque Inductique 2013, Apr 2013, Tizi-Ouzou, Algérie. pp.37-38, 2013. <hal-00932739>
  • Yann Le Bihan, Claude Marchand, Joszef Pavo. Quantitative Evaluation of Small Anomalies in Non-Destructive Testing using Partial Least Square Regression. Colloque Inductique 2013, Apr 2013, Tizi-Ouzou, Algeria. pp.83-84, 2013. <hal-00932700>
  • Yann Le Bihan. Principe, modélisation et mise en œuvre du contrôle non destructif par courants de Foucault. Deuxièmes Journées d'étude "Haute Tension, Electrostatique & Compatibilité électromagnétique", Apr 2013, Sidi-Bel-Abbès, Algérie. 2013. <hal-00932718>
  • Yann Le Bihan. Analytical Modeling of an Inductive Sensor with Open Magnetic Core and Conductive Shielding above a Multi-Layered Medium. Colloque Inductique 2013, Apr 2013, Tizi-Ouzou, Algeria. pp.81-82, 2013. <hal-00932744>
  • Alexandra Christophe, Laurent Santandréa, Francesca Rapetti, Guillaume Krebs, Yann Le Bihan. An overlapping non-matching grid mortar element method for Maxwell's equations. Compumag 2013, Jun 2013, Budapest, Hungary. pp.1-1, 2013. <hal-00932675>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Efficient FEM modelling of printed coils for eddy current testing. Numelec 2012, Jul 2012, Marseille, France. pp.1-1, 2012. <hal-00779582>
  • Laurent Santandréa, Yann Le Bihan, Christophe Reboud, Pierre Calmon. Simulation Tool for the Error Estimation of the Probe Tilt in Eddy Current NDT Context. PIERS 2012, Mar 2012, Kuala Lumpur, Malaisie. pp.65, 2012. <hal-00779590>
  • Wilfried Favre, Laroussi Bettaieb, J. Després, José Alvarez, Jean-Paul Kleider, et al.. Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers. 26th EU PVSEC, Sep 2011, Hambourg, Germany. 2011. <hal-00710780>
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Evaluation of a Planar Coil Model Using Shell Elements. PIERS 2011, Mar 2011, Morocco. pp.1, 2011. <hal-00712532>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Use of overlapping finite elements for connecting arbitrary surfaces with dual formulations. Compumag 2011, Jul 2011, Sydney, Australia. pp.1-2, 2011. <hal-00712534>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan, Edouard Demaldent. Modeling of Thin Conducting and Magnetic Layers in Eddy Current Testing by Overlapping Finite elements. ISEM 2011, 2011, Napoli, Italie. pp.1-6, 2011. <hal-00712507>
  • Guillaume Krebs, Yann Le Bihan, Claude Marchand, Francisco Alves. Prise en compte des milieux fins dans le CND CF grâce à la méthode overlapping. 2ème Colloque National sur l'Inductique, May 2011, Béjaïa, Algérie. 2011. <hal-00712509>
  • Abdelghani Ayad, Farid Benhamida, Mohamed Bensetti, Yann Le Bihan, Abdelbaar Bendaoud. SOLUTION OF INVERSE PROBLEMS IN ELECTROMAGNETIC NDT USING NEURAL NETWORKS. 2ème Colloque National sur l'Inductique, May 2011, Algeria. 4 p., 2011. <hal-00712501>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Modelling of 3D Thin Regions in Magnetostatic NDT Using Overlapping Elements in Dual Formulations. PIERS 2011, Mar 2011, Marrakech, Morocco. pp.1-5, 2011. <hal-00712508>
  • Denis Premel, Damien Molka, Sylvain Chatillon, Yann Le Bihan. Numerical simulation of electromagnetic acoustic transducers in time domain. ENDE 2011, May 2011, Madras, Inde. 2p., 2011. <hal-00712533>
  • Mostafa-Kamel Smaïl, Yann Le Bihan, Lionel Pichon. Fast Diagnosis of Transmission Lines using Neural Networks and Principal Component Analysis. ISEM 2011, Sep 2011, Naples, Italy. pp.543-544, 2011. <hal-00711590>
  • Chiara Zorni, Christophe Reboud, Jean-Marc Decitre, Laurent Santandréa, Yann Le Bihan, et al.. ECT simulation of ferromagnetic planar pieces in harmonic regime. ISEM 2011, Sep 2011, Naples, Italy. pp.453--554, 2011. <hal-00658015>
  • Tarik Hacib, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Microwave Characterization using Ridge Polynomial Neural Networks and Least-Square Support Vector Machines. 14th IEEE Conference on Electromagnetic Field Computation, May 2010, Chicago, United States. 2010. <hal-00555264>
  • Yann Le Bihan, Claude Marchand, Joszef Pavo, Guillaume Krebs. Partial Least Square Regression for Quantitative Evaluation of Small Anomalies in Non-Destructive Testing. CEFC 2010, May 2010, Chicago, United States. 4 p., 2010. <hal-00555707>
  • Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. A contribution to connect non-conform meshes with overlapping finite elements. IGTE 2010, Sep 2010, Graz, Austria. 6 p., 2010. <hal-00555710>
  • Guillaume Krebs, Thomas Henneron, Stéphane Clenet, Yann Le Bihan. Overlapping finite elements used to connect non-conforming meshes in 3D with a vector potential formulation. CEFC 2010, May 2010, Chicago, United States. 4 p., 2010. <hal-00555706>
  • Alejandro Ospina Vargas, Houda Zaidi, Laurent Santandréa, Guillaume Krebs, Yann Le Bihan. Comparison of two methods for modeling thin regions in eddy current non-destructive testing. CEFC 2010, May 2010, Chicago, IL, United States. 2010. <hal-00555709>
  • Laurent Santandréa, Yann Le Bihan. Using COMSOL-Multiphysics in Eddy Current Non Destructive Testing Context. COMSOL CONFERENCE PARIS, Nov 2010, PARIS, France. pp.3576, 2010. <hal-00557541>
  • Tarik Hacib, Yann Le Bihan, Hulusi Acikgoz, Olivier Meyer. Utilisation des machines à vecteurs supports LSSVM pour la mesure des propriétés diélectriques de matériaux. 11èmes Journées de Caractérisation Microondes et Matériaux, Mar 2010, Brest, France. pp.O8-1, 2010. <hal-00555267>
  • Laurent Santandréa, Yahya Choua, Alejandro Ospina Vargas, Yann Le Bihan, Claude Marchand. Analyse of different programming solutions adapted to block matrix type in electromagnetic modelling. COMPUMAG, Nov 2009, FLorianapolis, Brésil. 2009. <hal-00447267>
  • Francisco Alves, Léna Abi Rached, Yann Le Bihan, J. Moulin, E. Dufour-Gergam, et al.. Nanostructured Soft Magnetic Films: elaboration, performances and applications for tri-layered sensors based on magneto-impedance effect. Nanostructuring by ion beams, Feb 2009, Bubhaneswar, India. <hal-00448855>
  • Alejandro Ospina Vargas, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Planar Coil Model using Shell Elements Applied to an Eddy-Current Non-Destructive Testing. 17th Conference on the computation of electromagnetics fields, COMPUMAG 2009, Dec 2009, Florianopolis, Brésil. pp. 873-874, 2009. <hal-00447249>
  • Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Mesh Refinement in Eddy Current Testing with Separated T-R probes. COMPUMAG, Nov 2009, Florianópolis, Brazil. pp. 1048-1049, 2009. <hal-00447250>
  • Tarik Hacib, Yann Le Bihan, Mohamed Mekideche, Nassira Ferkha. Ridge Polynomial Neural Network for Non-Destructive Eddy Current Evaluation. ISEF 2009 - XIV International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering, 2009, Arras, France. 7 p., 2009. <hal-00555701>
  • Yann Le Bihan, Claude Marchand, Francisco Alves. Modélisation en CND : de la conception à l'inversion. CNI'09, 2009, Algérie. pp.10, 2009. <hal-00555700>
  • Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Support Vector Machines for Measuring Dielectric Properties of Materials. ISEF 2009 - XIV International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering, Sep 2009, Arras, France. pp.CD-Rom Proceedings, 2009. <hal-00446791>
  • Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Microwave Characterization using Least-Square Support Vector Machines. Compumag, Nov 2009, Florianópolis, Brazil. pp. 640-641, 2009. <hal-00446790>
  • Léna Abi Rached, Francisco Alves, Yann Le Bihan. Numerical tool for the design of magnetic sensors based on GMI effect. 17th Conference on the computation of electromagnetics fields - COMPUMAG 2009, Nov 2009, Florianopolis, Brazil. pp. 438-439, 2009. <hal-00447248>
  • Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the DOF management of dual formulations for the modelling of thin cracks in ECT. European Magnetic Sensors and Actuators Conference EMSA 2008 Conference, Jul 2008, Caen, France. 2008. <hal-00352908>
  • Hulusi Acikgoz, Benjamin Jannier, Yann Le Bihan, Olivier Dubrunfaut, Olivier Meyer, et al.. Modeling of a microwave sensor for the determination of the proportion of fluids in a gas line. 13ème IEEE Conf. on Electromagnetic Field Computation (CEFC), May 2008, Athènes, Greece. <hal-00352204>
  • Cyril Ravat, P.-Y. Joubert, Yann Le Bihan, Claude Marchand. Non destructive evaluation of small defects using an eddy current microcoil sensor array. EMSA 2008 Conference, Jul 2008, Caen, France. 2008. <hal-00353081>
  • Cyril Ravat, P.-Y. Joubert, Yann Le Bihan, Claude Marchand, M. Woytazik, et al.. Performances d'une sonde matricielle à microbobines pour la détection par courants de Foucault de défauts débouchants de faibles dimensions. Journées COFREND, May 2008, Toulouse, France. 2008. <hal-00354404>
  • Hulusi Acikgoz, Laurent Santandréa, Yann Le Bihan, S. Gyimothy, J. Pavo, et al.. Generation and use of optimized databases in microwave characterization. IET Computation on Electromagnetic, Apr 2008, Brighton, United Kingdom. pp.58-59, 2008. <hal-00351661>
  • Hulusi Acikgoz, Benjamin Jannier, Yann Le Bihan, Olivier Dubrunfaut, Olivier Meyer. Modélisation numérique d'un capteur pour la mesure des concentrations des phases d'un fluide en écoulement et inversion par réseaux de neurones. 10èmes Journées de Caractérisation Micro-onde et Matériaux (JCMM 2008), Apr 2008, Limoges, France. pp. O3-1.1 - O3-1.4, 2008. <hal-00351654>
  • Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Caractérisation micro-ondes de matériaux diélectrique par réseaux de neurones avec régulation bayesienne. 10èmes Journées de Caractérisation Micro-onde et Matériaux (JCMM 2008), Apr 2008, Limoges, France. pp. O9-4.1 - O9-4.4, 2008. <hal-00351655>
  • Séverine Paillard, Yahya Choua, Grégoire Pichenot, Yann Le Bihan, Marc Lambert, et al.. Modelling of flawed riveted structure for EC inspection in aeronautics. ENDE’07, Jun 2007, Cardiff, United Kingdom. Proceedings of the 12th International Workshop on Electromagnetic Non–Destructive Evaluation, 2007. <hal-01104131>
  • Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Réseaux de neurones bayésiens pour la caractérisation micro-ondes. GDR Ondes - Réunion générale interférence d'ondes, Nov 2007, Pessac, France. <hal-00352182>
  • Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Technique d'inversion par réseaux de neurones appliquée à la caractérisation large bande de matériaux diélectriques. 15e Journées Nationales Micro-ondes (JNM 2007), May 2007, Toulouse, France. pp.4D16, 2007. <hal-00351286>
  • Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Microwave characterization of dielectrics materials using the combination of a finite element technique and neural networks. Compumag 2007, Jun 2007, Aachen, Germany. pp.933-934, 2007. <hal-00351290>
  • Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Neural Networks for Broad-Band Evaluation of Complex Permittivity using a Coaxial Discontinuity. NUMELEC'06, Nov 2006, Lille, France. pp. 165-166, 2006. <hal-00336251>

Poster2 documents

  • Chelabi Mohamed, Tarik Hacib, Yann Le Bihan, Boughedda Houssem. Crack Estimation using Adaptive Inversion Database With Multi Output Support Vector Machine for Eddy Current Testing. 20th International Conference on the Computation of Electromagnetic Fields (COMPUMAG 2015), Jun 2015, Montréal, Canada. 2 p. <hal-01254784>
  • Florent Loete, Yann Le Bihan, Denis Mencaraglia. Tunable Eddy Current Device for the Contactless Characterization of a Large Variety of Semiconductor Materials. IEEE Sensors 2015, Nov 2015, Busan, South Korea. <hal-01246248>

Chapitre d'ouvrage3 documents

  • Alexandra Christophe-Argenvillier, Francesca Rapetti, Laurent Santandrea, Guillaume Krebs, Yann Le Bihan. Mortar FEs on overlapping subdomains for eddy current non destructive testing. Numerical Mathematics and Advanced Applications - ENUMATH 2013, 103, pp.785-793, 2015, Lecture Notes in Computational Science and Engineering. <hal-01141137>
  • Tarik Hacib, Yann Le Bihan, Mohamed Rachid Mekideche, Nassira Ferkha. Ridge Polynomial Neural Network for Non-destructive Eddy Current Evaluation. Slawomir Wiak, Ewa Napieralska Juszczak (Eds.). Computational Methods for the Innovative Design of Electrical Devices, Springer, pp.185-199, 2011, Studies in Computational Intelligence, <10.1007/978-3-642-16225-1_10>. <hal-00761656>
  • S. Paillard, G. Pichenot, Yahya Choua, Yann Le Bihan, Marc Lambert, et al.. Modelling of flawed riveted structures for EC inspection in aeronautics. A. Tamburrino; Y. Melikhov; Z. Chen; L. Upda. Electromagnetic Non–Destructive Evaluation, 31, IOS Press, pp.217-224, 2008, Studies in Applied Electromagnetics and Mechanics, 978-1-58603-896-0. <10.3233/978-1-58603-896-0-217>. <hal-00761552>

Brevet1 document

  • Florent Loete, Yann Le Bihan, Denis Mencaraglia. Mesure sans contact de la conductivité de semiconducteurs. France, N° de brevet: FR 1553392. 2015. <hal-01246254>

Autre publication1 document

  • Hulusi Acikgoz, Lionel Pichon, Yann Le Bihan, Olivier Meyer. Caractérisation électromagnétique de structures complexes. Revue recherche Supélec 2009 / 2011, p. 85. 2009. <hal-00445761>