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Xavier Portier
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Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parametersJournal of Applied Physics, 2015, 118 (21), pp.215703. ⟨10.1063/1.4936167⟩
Article dans une revue
hal-01241229v1
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Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric FieldJournal of Physical Chemistry C, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩
Article dans une revue
hal-01163403v1
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