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Nombre de documents

112

Vincent BEROULLE - Université de Grenoble Alpes, Grenoble INP - LCIS


Chapitre d'ouvrage2 documents

  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Noise optimisation of a piezoresistive CMOS MEMS Magnetic Field Sensor. SOC DESIGN METHODOLOGIES, 90, Kluwer Academic Publishers, pp.496, 2002, Series: IFIP Advances in Information and Communication Technology, 1-4020-7148-5. ⟨hal-01105261⟩
  • Laurent Latorre, Vincent Beroulle, Yves Bertrand, Pascal Nouet. MEMS monolithiques.: Application à la mesure du champ magnétique. Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422. ⟨hal-01105274⟩

Article dans une revue23 documents

  • Zahra Kazemi, David Hely, Mahdi Fazeli, Vincent Beroulle. A Review on Evaluation and Configuration of Fault Injection Attack Instruments to Design Attack Resistant MCU-Based IoT Applications. Electronics, Penton Publishing Inc., 2020, 9 (7), pp.1153. ⟨10.3390/electronics9071153⟩. ⟨hal-02953431⟩
  • Rahma Benfraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb. An Optimized NS2 Module for UHF Passive RFID Systems. Journal of Electronic Testing, Springer Verlag, 2019, 35 (1), pp.45-58. ⟨10.1007/s10836-018-5769-y⟩. ⟨hal-02426108⟩
  • Johan Laurent, Vincent Beroulle, Christophe Deleuze, Florian Pebay-Peyroula, Athanasios Papadimitriou. Cross-layer analysis of software fault models and countermeasures against hardware fault attacks in a RISC-V processor. Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2019, 71, pp.102862. ⟨10.1016/j.micpro.2019.102862⟩. ⟨hal-02426107⟩
  • J.-M. Dutertre, Vincent Beroulle, Philippe Candelier, Stephan de Castro, Louis-Barthelemy Faber, et al.. Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulk. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2019, 19 (1), pp.6-15. ⟨10.1109/TDMR.2018.2886463⟩. ⟨hal-01971932⟩
  • Arash Nejat, David Hely, Vincent Beroulle. ESCALATION: Leveraging Logic Masking to Facilitate Path-Delay-Based Hardware Trojan Detection Methods. Journal Hardware and Systems Security, Springer, In press, ⟨10.1007/s41635-018-0033-6⟩. ⟨hal-01724155⟩
  • Yassine Naija, Vincent Beroulle, Mohsen Machhout. Security Enhancements of a Mutual Authentication Protocol Used in a HF Full-Fledged RFID Tag. Journal of Electronic Testing, Springer Verlag, 2018, 34 (3), pp.291 - 304. ⟨10.1007/s10836-018-5725-x⟩. ⟨hal-01899794⟩
  • Vincent Beroulle, Oum-El-Kheir Aktouf, David Hely. SafeRFID Project: A complete Framework for the Improvement of UHF RFID System Dependability. International Journal On Advances in Networks and Services, IARIA, 2017, 10 (1&2). ⟨hal-01617627⟩
  • Yassine Naija, Vincent Beroulle, Mohsen Machhout. Low Cost Countermeasure at Authentication Protocol Level against Electromagnetic Side Channel Attacks on RFID Tags. International journal of advanced computer science and applications (IJACSA), The Science and Information Organization, 2017, 8 (11), ⟨10.14569/IJACSA.2017.081109⟩. ⟨hal-01663566⟩
  • Dubeuf Jérémy, David Hely, Vincent Beroulle. ECDSA Passive Attacks, Leakage Sources, and Common Design Mistakes . ACM Transactions on Design Automation of Electronic Systems, Association for Computing Machinery, 2016, ⟨10.1145/2820611⟩. ⟨hal-01398724⟩
  • Béringuier-Boher Noemie, Vincent Beroulle, David Hély, Joël Damiens, Philippe Candelier. Clock generator behavioral modeling for supply voltage glitch attack effects analysis. Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2016. ⟨hal-01390988⟩
  • Athanasios Papadimitriou, David Hely, Vincent Beroulle, Paolo Maistri, Regis Leveugle. Analysis of laser-induced errors: RTL fault models versus layout locality characteristics. Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2016, ⟨10.1016/j.micpro.2016.01.018⟩. ⟨hal-01299277⟩
  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, Minh Duc Nguyen, David Hely. RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate. Journal of Electronic Testing, Springer Verlag, 2010, pp.1. ⟨10.1007/s10836-010-5191-6⟩. ⟨hal-00575585⟩
  • Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach. Design-for-Test Approach of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and Application. IET Computers & Digital Techniques, Institution of Engineering and Technology, 2009, 3 (5), pp.487-500. ⟨10.1049/iet-cdt.2008.0072⟩. ⟨hal-01105280⟩
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, J.L. Carbonero. Decreasing Test Qualification Time of AMS&RF Systems by using Normal Estimation. IEEE Design & Test, IEEE, 2008, pp.0. ⟨hal-00218160⟩
  • Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach. High-Speed Design-for-Test Architecture for Asynchronous NoC-based Systems-on-Chip. IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2008, 10, pp.12. ⟨hal-01105282⟩
  • Yves Joannon, Vincent Beroulle, Jean-Louis Carbonero, Smail Tedjini, Chantal Robach. Choice of a high level fault model for the Optimization of Validation Test Set reused for Manufacturing Test. VLSI Design, Hindawi Publishing Corporation, 2008, vol. 2008 (Article ID 596146), pp.0. ⟨hal-00331235⟩
  • Rami Khouri, Vincent Beroulle, Tan-Phu Vuong, Smail Tedjini. UHF RFID tag-antenna matching optimization using VHDL-AMS behavioral modeling. Analog Integrated Circuits and Signal Processing, Springer Verlag, 2006, 50 (2), pp. 81-162, ISSN : 0925-1030. ⟨hal-00218161⟩
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design of CMOS MEMS Based on Mechanical Resonators Using a RF Simulation Approach. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2004, 23 (6), pp.962-967. ⟨lirmm-00108542⟩
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design of CMOS MEMS Based on Mechanical Resonators Using a RF Simulation Approach. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2004, 23 (6), pp.962-967. ⟨hal-01105295⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Monotithic Piezoresistive CMOS Magnetic Field Sensors. Sensors and Actuators, Elsevier, 2003, A: Physical, Vol. 103 (1-2), pp. 23-32. ⟨lirmm-00269696⟩
  • Muriel Dardalhon, Vincent Beroulle, Laurent Latorre, Pascal Nouet, Guy Perez, et al.. Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. Microelectronics Reliability, Elsevier, 2002, 42 (9-11), pp.1777-1782. ⟨10.1016/S0026-2714(02)00230-5⟩. ⟨lirmm-00268582⟩
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design of CMOS MEMS Based on Mechanical Resonators Using a RF Simulation Approach. Sensors and Actuators A: Physical , Elsevier, 2002, pp.1-10. ⟨hal-01105289⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. Journal of Electronic Testing, Springer Verlag, 2001, Volume 17 (Issue 5), pp.Pages: 439 - 450. ⟨hal-00378525⟩

Communication dans un congrès82 documents

  • Amir Alipour, David Hely, Vincent Beroulle, Giorgio Natale. Power of Prediction: Advantages of Deep Learning Modeling as Replacement for Traditional PUF CRP Enrollment. TrueDevice2020, Mar 2020, Grenoble, France. ⟨hal-02954099⟩
  • Julie Roux, Vincent Beroulle, Katell Morin-Allory, Regis Leveugle, Lilian Bossuet, et al.. Cross Layer Fault Simulations for Analyzing the Robustness of RTL Designs in Airborne Systems. 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2020, Novi Sad, Serbia. pp.1-4, ⟨10.1109/DDECS50862.2020.9095559⟩. ⟨hal-02937868⟩
  • Zahra Kazemi, Mahdi Fazeli, David Hely, Vincent Beroulle. Hardware Security Vulnerability Assessment to Identify the Potential Risks in A Critical Embedded Application. 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), Jul 2020, Napoli, France. pp.1-6, ⟨10.1109/IOLTS50870.2020.9159739⟩. ⟨hal-02953435⟩
  • Johan Laurent, Christophe Deleuze, Vincent Beroulle, Florian Pebay-Peyroula. Analyzing Software Security Against Complex Fault Models with Frama-C Value Analysis. 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), Aug 2019, Atlanta, United States. pp.33-40, ⟨10.1109/FDTC.2019.00013⟩. ⟨hal-02426133⟩
  • Johan Laurent, Vincent Beroulle, Christophe Deleuze, Florian Pebay-Peyroula. Fault Injection on Hidden Registers in a RISC-V Rocket Processor and Software Countermeasures. 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2019, Florence, Italy. pp.252-255, ⟨10.23919/DATE.2019.8715158⟩. ⟨hal-02426113⟩
  • Arash Nejat, Zahra Kazemi, Vincent Beroulle, David Hély, Mahdi Fazeli. Restricting Switching Activity Using Logic Locking to Improve Power Analysis-Based Trojan Detection. 2019 IEEE 4th International Verification and Security Workshop (IVSW), Jul 2019, Rhodes Island, Greece. pp.49-54, ⟨10.1109/IVSW.2019.8854402⟩. ⟨hal-02426128⟩
  • Zahra Kazemi, Athanasios Papadimitriou, Ioanna Souvatzoglou, Ehsan Aerabi, Mosabbah Mushir Ahmed, et al.. On a Low Cost Fault Injection Framework for Security Assessment of Cyber-Physical Systems: Clock Glitch Attacks. 2019 IEEE 4th International Verification and Security Workshop (IVSW), Jul 2019, Rhodes Island, Greece. pp.7-12, ⟨10.1109/IVSW.2019.8854391⟩. ⟨hal-02426130⟩
  • Baptiste Pestourie, Vincent Beroulle, Nicolas Fourty. Security Evaluation with an Indoor UWB Localization Open Platform: Acknowledgment Attack Case Study. 2019 IEEE 30th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC), Sep 2019, Istanbul, Turkey. pp.1-7, ⟨10.1109/PIMRC.2019.8904224⟩. ⟨hal-02426131⟩
  • Souhir Gabsi, Vincent Beroulle, Hamdi Bilgacem, Mohsen Machhout. Architectural Choices for Implementing a Secure ECC-based Lightweight RFID Tag. 2019 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS), Apr 2019, Gammarth-Tunis, Tunisia. pp.1-5, ⟨10.1109/DTSS.2019.8914902⟩. ⟨hal-02426112⟩
  • Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb. An Evaluation of UHF RFID Anti-Collision Protocols with NS2. 2018 9th IFIP International Conference on New Technologies, Mobility and Security (NTMS), Feb 2018, Paris, France. ⟨10.1109/NTMS.2018.8328679⟩. ⟨hal-01899812⟩
  • Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb. An approach to enhance the safety and security of EPC Class-1 generation-2 UHF RFID systems. 2018 2nd International Conference on Inventive Systems and Control (ICISC), Jan 2018, Coimbatore, France. ⟨10.1109/ICISC.2018.8398977⟩. ⟨hal-01899809⟩
  • Baptiste Pestourie, Vincent Beroulle, Nicolas Fourty. Guidelines for the Choice of a Wireless Secure Positioning and Communication System. 2018 International Workshop on Secure Internet of Things (SIoT), Sep 2018, Barcelona, Spain. pp.1-7, ⟨10.1109/SIoT.2018.00007⟩. ⟨hal-02426120⟩
  • Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb. Time Modeling with NS2 in UHF RFID Anti-Collision Protocols. 2018 IEEE 32nd International Conference on Advanced Information Networking and Applications (AINA), May 2018, Krakow, France. ⟨10.1109/AINA.2018.00016⟩. ⟨hal-01899806⟩
  • Zahra Kazemi, Athanasios Papadimitriou, David Hély, Mahdi Fazeli, Vincent Beroulle. Hardware Security Evaluation Platform for MCU-Based Connected Devices: Application to Healthcare IoT. 2018 IEEE 3rd International Verification and Security Workshop (IVSW), Jul 2018, Costa Brava, France. pp.87-92, ⟨10.1109/IVSW.2018.8494843⟩. ⟨hal-02426115⟩
  • Johan Laurent, Vincent Beroulle, Christophe Deleuze, Florian Pebay-Peyroula, Athanasios Papadimitriou. On the Importance of Analysing Microarchitecture for Accurate Software Fault Models. 2018 21st Euromicro Conference on Digital System Design (DSD), Aug 2018, Prague, France. ⟨10.1109/DSD.2018.00097⟩. ⟨hal-01899800⟩
  • Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan de Castro, Louis-Barthelemy Faber, et al.. Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model. FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩. ⟨emse-01856008⟩
  • Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, et al.. The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩. ⟨emse-01856000⟩
  • Yassine Naija, Vincent Beroulle, Mohsen Machhout. ElectroMagnetic Attack Test Platform for Validating RFID Tag Architectures. 2018 6th International EURASIP Workshop on RFID Technology (EURFID), Sep 2018, Brno, Czech Republic. pp.1-7, ⟨10.1109/EURFID.2018.8611655⟩. ⟨hal-02426123⟩
  • Jeremy Dubeuf, David Hély, Vincent Beroulle. Enhanced Elliptic Curve Scalar Multiplication Secure Against Side Channel Attacks and Safe Errors. Constructive Side-Channel Analysis and Secure Design - 8th International Workshop, COSADE 2017, Apr 2017, Paris, France. pp.65-82, ⟨10.1007/978-3-319-64647-3_5⟩. ⟨hal-02426126⟩
  • Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb. A global approach for the improvement of UHF RFID safety and security. Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2017 12th International Conference on, Apr 2017, Palma de Mallorca, Spain. ⟨hal-01663938⟩
  • Vincent Beroulle, Oum-El-Kheir Aktouf, David Hely. System-Level Simulation for the Dependability Improvement of UHF RFID Systems. ICWMC 2016 : The Twelfth International Conference on Wireless and Mobile Communications (includes QoSE WMC 2016), IARIA, Nov 2016, Barcelone, Spain. ⟨hal-01432066⟩
  • Seyyed Mohammad Saleh Samimi, Ehsan Aerabi, Arash Nejat, Mahdi Fazeli, David Hely, et al.. High output hamming-distance achievement by a greedy logic masking approach. 2016 IEEE East-West Design & Test Symposium (EWDTS), Oct 2016, Yerevan, France. ⟨10.1109/EWDTS.2016.7807657⟩. ⟨hal-01724174⟩
  • Arash Nejat, David Hely, Vincent Beroulle. How logic masking can improve path delay analysis for Hardware Trojan detection. 2016 IEEE 34th International Conference on Computer Design (ICCD), Oct 2016, Phenix, United States. ⟨10.1109/ICCD.2016.7753319⟩. ⟨hal-01418432⟩
  • Arash Nejat, David Hely, Vincent Beroulle. Reusing logic masking to facilitate path-delay-based hardware Trojan detection. 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), Jul 2016, Sant Felliu, Spain. ⟨10.1109/IOLTS.2016.7604696⟩. ⟨hal-01412412⟩
  • Romain Champon, Vincent Beroulle, Athanasios Papadimitriou, David Hély, Gilles Grenevrier, et al.. Comparison of RTL Fault Models for the Robustness Evaluation of Aerospace FPGA devices. 22nd IEEE international Symposium on On-Line Testing and Robust System Design (IOLTS 2016), Jul 2016, San Feliu de Guiwols, Spain. ⟨hal-01391000⟩
  • Yassine Naija, Vincent Beroulle, David Hely, Mohsen Machhout. Design and Validation of a Secured Digital Ultralight 14443-Type A RFID tag with a FPGA Platform. 11th Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS 2016) , 2016, Istanbul, Turkey. ⟨hal-01391006⟩
  • Arash Nejat, David Hely, Vincent Beroulle. Facilitating side channel analysis by obfuscation for Hardware Trojan detection. IEEE Design & Test Symposium (IDT 2015), Dec 2015, Dead sea, Jordan. ⟨10.1109/IDT.2015.7396749⟩. ⟨hal-01391014⟩
  • Athanasios Papadimitriou, Marios Tampas, David Hély, Vincent Beroulle, Paolo Maistri, et al.. Validation of RTL laser fault injection model with respect to layout information. Hardware Oriented Security and Trust (HOST 2016), May 2015, Washington,, United States. ⟨10.1109/HST.2015.7140241⟩. ⟨hal-01392792⟩
  • Vincent Beroulle, Philippe Candelier, Stephan de Castro, Giorgio Di Natale, Jean-Max Dutertre, et al.. Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩. ⟨hal-01383737⟩
  • Omar Abdelmalek, David Hely, Vincent Beroulle. Emulation Based Fault Injection on UHF RFID Transponder. 17th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Varsaw, Poland. pp.1-4. ⟨hal-01010294⟩
  • Omar Abdelmalek, David Hely, Vincent Beroulle. Fault Tolerance Evaluation of RFID Tags. 15th IEEE Latin America Test Workshop, Mar 2014, Fortaleza, Brazil. pp.1-6. ⟨hal-00958582⟩
  • Noémie Boher, Kamil Gomina, David Hely, Vincent Beroulle, Jean-Baptiste Rigaud, et al.. Voltage Glitch Attacks on Mixed Signal Systems. 17th Euromicro Conference on Digital Systems Design, Aug 2014, Verone, Italy. pp.1-6. ⟨hal-01063664⟩
  • Athanasios Papadimitriou, David Hely, Vincent Beroulle, Paolo Maistri, R. Leveugle. A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks. Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, Mar 2014, Dresden, Germany. pp.1-4, ⟨10.7873/DATE2014.219⟩. ⟨hal-00981848⟩
  • Pierre Vanhauwaert, Paolo Maistri, R. Leveugle, Athanasios Papadimitriou, David Hely, et al.. On error models for RTL security evaluations. 9th Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) 2014, May 2014, Santorini, Greece. pp.1-6. ⟨hal-01010314⟩
  • Omar Abdelmalek, David Hely, Vincent Beroulle. EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement. Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2013 8th International Conference on, Mar 2013, Marrakesh, Morocco. pp.20-24, ⟨10.1109/DTIS.2013.6527771⟩. ⟨hal-00950128⟩
  • Ibrahim Mezzah, Omar Kermia, Hamimi Chemali, Omar Abdelmalek, David Hely, et al.. Assertion based on-line fault detection applied on UHF RFID tag. 8th IEEE International Design & Test Symposium 2013, Dec 2013, Marrakesh, Morocco. pp.1-5, ⟨10.1109/IDT.2013.6727091⟩. ⟨hal-00950130⟩
  • Noémie Boher, David Hely, Vincent Beroulle, Joël Damiens, Philippe Candelier. Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology.. Quality Electronic Design (ISQED), 2013 14th International Symposium on, Mar 2013, United States. pp.531-537, ⟨10.1109/ISQED.2013.6523662⟩. ⟨hal-00861556⟩
  • Noémie Boher, David Hely, Vincent Beroulle, Kamil Gomina, Joël Damiens, et al.. Evaluating and Enhancing the Security of Analog and Mixed IPs in Complex System On Chip. Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, TRUDEVICE 2013, May 2013, Avignon, France. ⟨hal-01010298⟩
  • Omar Abdelmalek, David Hely, Vincent Beroulle. An UHF RFID Emulation Platform with Fault Injection and real time Monitoring capabilities. 8th IEEE International Design & Test Symposium 2013, Dec 2013, Marrakesh, Morocco. pp.1-2, ⟨10.1109/IDT.2013.6727143⟩. ⟨hal-00933386⟩
  • David Hely, Vincent Beroulle, Abdelmalek Omar. Triggering Hardware Trojans in EPC C1G2 RFID Tags. Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, TRUDEVICE 2013, May 2013, Avignon, France. ⟨hal-00958199⟩
  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hély. Evaluation of a new RFID system performance monitoring approach. Design Automation & Test in Europe, 2012, Dresden, Germany. ⟨hal-01105361⟩
  • Gilles Fritz, Boutheina Maaloul, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hely. Read rate profile monitoring for defect detection in RFID Systems. IEEE International Conference on RFID-Technologies and Applications (RFID-TA 2011), Sep 2011, Sitges (Barcelona), Spain. pp. 89-94. ⟨hal-00628783⟩
  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hely. SystemC Modeling of RFID Systems for Robustness Analysis. 19th International Conference on Software, Telecommunications and Computer Networks IEEE SoftCOM, Sep 2011, Hvar (Split), Croatia. pp.ISBN : 978-953-290-027-9. ⟨hal-00628789⟩
  • David Hely, Vincent Beroulle, Feng Lu, Jose Ramon Garcia Oya. Towards an unified IP verification and robustness analysis platform. 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011, Apr 2011, France. ⟨hal-00593524⟩
  • Minh Duc Nguyen, Gilles Fritz, Oum-El-Kheir Aktouf, Vincent Beroulle, David Hély. Towards middleware-based fault-tolerance in RFID systems. 13th European Workshop on Dependable Computing (EWDC 2011), May 2011, Pise, Italy. pp.49-52. ⟨hal-00593732⟩
  • Minh Duc Nguyen, Gilles Fritz, Oum-El-Kheir Aktouf, Vincent Beroulle, David Hely. Towards middleware-based fault-tolerance in RFID systems. 13th European Workshop on Dependable Computing, EWDC 2011, May 2011, Pise, Italy. pp.5. ⟨hal-00580368⟩
  • Gilles Fritz, Vincent Beroulle, Nguyen Minh Duc, Oum-El-Kheir Aktouf, Ioannis Parissis. Read-Error-Rate evaluation for RFID system on-line testing. 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), Jun 2010, La Grande Motte, France. pp.1. ⟨hal-00491923⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal Conditioning. MEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259. ⟨lirmm-00268486⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field Sensing. SoC Design Methodologies - International Conference on Very Large Scale Integration of Systems-on-Chip, Montpellier, France, pp.461-472. ⟨lirmm-00268487⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems. VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444. ⟨lirmm-00268484⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test Methodology. LATW'02: 3rd IEEE Latin American Test Workshop, Montevideo (Uruguay), France. pp. 99-104. ⟨lirmm-00269323⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Conception et Test d'une Micro-Boussole Electromécanique Intégrée. Colloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100. ⟨lirmm-00269324⟩
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design & Simulation of a CMOS MEMS Using Standard Microelectronic CAD Environment. NANOTECH'03: Nanotechnology Conference and Trade Show, San Francisco, CA (USA), pp. 472-475. ⟨lirmm-00269546⟩
  • Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach. A Design-for-Test Implementation of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and Application. The 2nd ACM/IEEE International Symposium on Networks-on-Chip, Apr 2008, Newcastle, United Kingdom. pp. 149-158. ⟨hal-00331239⟩
  • Xuan-Tu Tran, Jean Durupt, Yvain Thonnard, François Bertrand, Chantal Robach, et al.. Implementation of a Design-for-Test Architecture for Asynchronous Networks-on-Chip. The 1st ACM/IEEE International Symposium on Networks-on-Chip (NOCS 2007), May 2007, Princeton, New Jersey, United States. pp.100. ⟨hal-00187291⟩
  • Rami Khouri, Yvan Duroc, Vincent Beroulle, Smail Tedjini, O.F. Oliveira Gomes. VHDL-AMS modeling of an UWB link radio including antennas. IEEE International Conference on Electronics, Circuits and Systems (ICECS2007), Dec 2007, Morocco. pp. 570-573. ⟨hal-00377834⟩
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. How to Implement an Asynchronous Test Wrapper for Network-on-Chip Nodes. The 12th IEEE European Test Symposium (ETS 2007), May 2007, Freiburg, Germany. pp.Tran07HTI. ⟨hal-00166373⟩
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Using of Behavioral level AMS & RF Simulation for Validation Test Set Optimization. WTW'07, May 2007, Berkeley, United States. pp.62-67. ⟨hal-00250420⟩
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. Functional Verification of RTL Designs driven by Mutation Testing metrics. 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 2007. DSD 2007., Aug 2007, Lubeck, Germany. pp.222-227, ⟨10.1109/DSD.2007.4341472⟩. ⟨hal-00254470⟩
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. Impact of Hardware Emulation on the verification quality improvement. Very Large Scale Integration, 2007. VLSI - SoC 2007. IFIP International Conference on, Oct 2007, Atlanta, United States. pp.218-223, ISBN: 978-1-4244-1710-0. ⟨hal-00218169⟩
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Génération de vecteurs de test pour les systèmes analogiques mixtes et RF. Ecole d'hiver Francophone sur les Technologies de Conception des systèmes embarqués Hétérogènes (FETCH 2007), Jan 2007, Villard-de-Lans, France. pp.1. ⟨hal-00250410⟩
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Choice of a high level fault model for the Optimization of Validation Test Set reused for Manufacturing Test. IMSTW'07, Jun 2007, Porto, Portugal. pp.66 - 71, ⟨10.1155⟩. ⟨hal-00250422⟩
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Qualification of Behavioral Level Design Validation for AMS&RF SoCs. VLSI SOC'07, Oct 2007, Atlanta, United States. pp.100 - 106. ⟨hal-00250426⟩
  • Youssef Serrestou, Chantal Robach, Vincent Beroulle. How to Improve a set of design validation data by using mutation-based test. 2006 IEEE Design and Diagnostics of Electronic Circuits and systems, Apr 2006, Prague, Czech Republic. pp.75-76. ⟨hal-00254378⟩
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. IP Validation using Genetic Algorithms guided by Mutation Testing. Conference on Design of Circuit and Integrated Systems, Nov 2006, Barcelone, Spain. pp.CD. ⟨hal-00254467⟩
  • Yves Joannon, Vincent Beroulle, Rami Khouri, Smail Tedjini, Chantal Robach, et al.. Modélisation comportementale d'un émetteur récepteur W-CDMA en VHDL-AMS. JNRDM'06, May 2006, Rennes, France. pp.1. ⟨hal-00250399⟩
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. A DfT Architecture for Asynchronous Networks-on-Chip. The 11th IEEE European Test Symposium, May 2006, Southampton, United Kingdom. pp.219-224, ⟨10.1109/ETS.2006.3⟩. ⟨hal-00142999⟩
  • Xuan Tu Tran, Vincent Beroulle, Jean Durupt, Chantal Robach, François Bertrand. Design-for-Test of Asynchronous Networks-on-Chip. IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, Czech Republic. pp. 163-167. ⟨hal-00218149⟩
  • Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, et al.. Behavioral modeling of W-CDMA transceiver with VHDL-AMS language. DDECS'06, Apr 2006, Prague, Czech Republic. pp.113 - 118. ⟨hal-00250397⟩
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Qualification et génération de vecteurs pour la validation et le test de production de systèmes analogiques, mixtes et RF. GdR SoC-SiP, 2006, ¨Paris, France. pp.1. ⟨hal-00250407⟩
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Mutation Sampling Technique for the Generation of Structural Test Data. DATE: Design, Automation and Test in Europe, 2005, Munich, Germany. pp.1022. ⟨lirmm-00105978⟩
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Mutation sampling technique for the generation of structural test data. 6th IEEE Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. ⟨hal-00378490⟩
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Mutation Sampling Technique for the Generation of Structural Test Data. DATE: Design, Automation and Test in Europe, Mar 2005, Munich, Germany. pp.1022-1023. ⟨hal-00181680⟩
  • Rami Khouri, Vincent Beroulle, Tan Phu Vuong, Smail Tedjini. Wireless System Validation using VHDL-AMS Behavioral Antenna Models : Radio-Frequency Identification case study. European Conference on Wireless Technology 2004, Amsterdam, Oct 2004, Amsterdam, France. pp.185-188. ⟨hal-00259990⟩
  • Luigi Dilillo, Vincent Beroulle, Norbert Dumas, Laurent Latorre, Pascal Nouet. An A/D Interface for Resonant Piezoresistive MEMS Sensor. ISIE'04: IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio (France), pp.83-88. ⟨lirmm-00108896⟩
  • Rami Khouri, Vincent Beroulle, Tan-Phu Vuong, Smail Tedjini. Optimisation de la télé-alimentation des systèmes RFID UHF grâce à la modélisation comportementale du lien RF. 6ème journées d'études Faible Tension Faible Consommation, May 2003, Paris, France. ⟨hal-00378617⟩
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Software-Based Testing of Sequential VHDL Descriptions. ETW: European Test Workshop, Mar 2003, Maastricht, Netherlands. pp.199-200. ⟨lirmm-00269437⟩
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes. Software-based testing of sequential vhdl descriptions. IEEE European Test Workshop, May 2003, Maastrich, France. pp.199-200. ⟨hal-00193680⟩
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal Systems. DATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.1120-1120, ⟨10.1109/DATE.2002.998476⟩. ⟨lirmm-00268488⟩
  • Laurent Latorre, Vincent Beroulle, Yves Bertrand, Guy Cathébras, Pascal Nouet. On the Use of CMOS 0n-Chip Mechanical Devices for Spectral Analysis. EUROSENSORS, Sep 2002, Prague, Czech Republic. pp.191-192. ⟨lirmm-00268509⟩
  • Muriel Dardalhon, Marc-Olivier Dzeukou, Vincent Beroulle, Laurent Latorre, Pascal Nouet, et al.. Impact of Environmental Parameters on CMOS MEMS Structures. CANEUS, Aug 2002, Montreal, Canada. ⟨lirmm-00269356⟩
  • Vincent Beroulle, Laurent Latorre, Muriel Dardalhon, Coumar Oudéa, Guy Perez, et al.. Impact of Technology Spreading on MEMS Design Robustness. SoC Design Methodologies - International Conference on Very Large Scale Integration of Systems-on-Chip, Dec 2001, Montpellier, France. pp.241-251, ⟨10.1007/978-0-387-35597-9_21⟩. ⟨lirmm-00268485⟩

Autre publication5 documents

  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, Minh Duc Nguyen. Sûreté de fonctionnement des systèmes RFID – Evaluation et simulation des dysfonctionnements. 2010. ⟨hal-00509521⟩
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. Amélioration des Jeux de Test pour la Validation de Conception. 2006. ⟨hal-00381553⟩
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. Conception en vue de Test pour l'Architecture d'un Réseau sur Puce Asynchrone. 2006. ⟨hal-00381555⟩
  • Yvan Duroc, Tan-Phu Vuong, Rami Khouri, Vincent Beroulle, Smail Tedjini. Modélisation des antennes ULB et co-design. 2006. ⟨hal-00377836⟩
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. Conception en vue du test pour l'architecture d'un réseau sur puce asynchrone. 2006. ⟨hal-00218157⟩