Mots-clés

Co-auteurs

Nom des revues

Nombre de documents

88

Vincent BEROULLE - Université de Grenoble Alpes, Grenoble INP - LCIS


Chapitre d'ouvrage3 documents

  • Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, et al.. Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC: Internet of Things Foundations, 2015, 978-3-319-25278-0. <10.1007/978-3-319-25279-7_12>. <emse-01227387>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Noise optimisation of a piezoresistive CMOS MEMS Magnetic Field Sensor. SOC DESIGN METHODOLOGIES, 90, Kluwer Academic Publishers, pp.496, 2002, Series: IFIP Advances in Information and Communication Technology, 1-4020-7148-5. <hal-01105261>
  • Laurent Latorre, Vincent Beroulle, Yves Bertrand, Pascal Nouet. MEMS monolithiques.: Application à la mesure du champ magnétique. Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422. <hal-01105274>

Article dans une revue16 documents

  • Dubeuf Jérémy, David Hely, Vincent Beroulle. ECDSA Passive Attacks, Leakage Sources, and Common Design Mistakes. ACM Transactions on Design Automation of Electronic Systems (TODAES), ACM, 2016, <10.1145/2820611>. <hal-01398724>
  • Athanasios Papadimitriou, David Hely, Vincent Beroulle, Paolo Maistri, Regis Leveugle. Analysis of laser-induced errors: RTL fault models versus layout locality characteristics. Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2016, <10.1016/j.micpro.2016.01.018>. <hal-01299277>
  • Jeremy Dubeuf, David Hely, Vincent Beroulle. ECDSA Passive Attacks, Leakage Sources, and Common Design Mistakes. ACM Transactions on Design Automation of Electronic Systems (TODAES), ACM, 2016, 21 (2), pp.25. <hal-01390997>
  • Béringuier-Boher Noemie, Vincent Beroulle, David Hély, Joël Damiens, Philippe Candelier. Clock generator behavioral modeling for supply voltage glitch attack effects analysis. Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2016. <hal-01390988>
  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, Minh Duc Nguyen, David Hely. RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate. Journal of Electronic Testing, Springer Verlag, 2010, pp.1. <10.1007/s10836-010-5191-6>. <hal-00575585>
  • Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach. Design-for-Test Approach of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and Application. IET Computers & Digital Techniques, Institution of Engineering and Technology, 2009, 3 (5), pp.487-500. <10.1049/iet-cdt.2008.0072>. <hal-01105280>
  • Yves Joannon, Vincent Beroulle, Jean-Louis Carbonero, Smail Tedjini, Chantal Robach. Choice of a high level fault model for the Optimization of Validation Test Set reused for Manufacturing Test. VLSI Design, Hindawi Publishing Corporation, 2008, vol. 2008 (Article ID 596146), pp.0. <hal-00331235>
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, J.L. Carbonero. Decreasing Test Qualification Time of AMS&RF Systems by using Normal Estimation. IEEE Design & Test of Computers, Institute of Electrical and Electronics Engineers, 2008, pp.0. <hal-00218160>
  • Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach. High-Speed Design-for-Test Architecture for Asynchronous NoC-based Systems-on-Chip. IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2008, 10, pp.12. <hal-01105282>
  • Rami Khouri, Vincent Beroulle, Tan-Phu Vuong, Smail Tedjini. UHF RFID tag-antenna matching optimization using VHDL-AMS behavioral modeling. Analog Integrated Circuits and Signal Processing, Springer Verlag, 2006, 50 (2), pp. 81-162, ISSN : 0925-1030. <hal-00218161>
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design of CMOS MEMS Based on Mechanical Resonators Using a RF Simulation Approach. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2004, 23 (6), pp.962-967. <lirmm-00108542>
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design of CMOS MEMS Based on Mechanical Resonators Using a RF Simulation Approach. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2004, 23 (6), pp.962-967. <hal-01105295>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Monotithic Piezoresistive CMOS Magnetic Field Sensors. Sensors and Actuators, Elsevier, 2003, A: Physical, Vol. 103 (1-2), pp. 23-32. <lirmm-00269696>
  • M. Dardalhon, Vincent Beroulle, Laurent Latorre, Pascal Nouet, G. Perez, et al.. Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. Microelectronics Reliability, Elsevier, 2002, 42 (9-11), pp.1777-1782. <10.1016/S0026-2714(02)00230-5>. <lirmm-00268582>
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design of CMOS MEMS Based on Mechanical Resonators Using a RF Simulation Approach. Sensors and Actuators A, 2002, pp.1-10. <hal-01105289>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. Journal of Electronic Testing, Springer Verlag, 2001, Volume 17 (Issue 5), pp.Pages: 439 - 450. <hal-00378525>

Communication dans un congrès64 documents

  • Charalampos Ananiadis, Athanasios Papadimitriou, David Hely, Vincent Beroulle, Regis Leveugle, et al.. On the development of a new countermeasure based on a laser attack RTL fault model Design. Design, Automation and Test in Europe Conference and Exhibition (DATE 2016), Mar 2016, Dresde, Germany. <hal-01391009>
  • Yassine Naija, Vincent Beroulle, David Hely, Mohsen Machhout. Design and Validation of a Secured Digital Ultralight 14443-Type A RFID tag with a FPGA Platform. 11th Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS 2016) , 2016, Istanbul, Turkey. <hal-01391006>
  • Arash Neija, David Hély, Vincent Beroulle. Reusing Logic Masking to Facilitate Path-Delay-Based Hardware Trojan Detection. 22nd IEEE international Symposium on On-Line Testing and Robust System Design (IOLTS 2016), Jul 2016, San Feliu de Guiwols, France. <hal-01391005>
  • Romain Champon, Vincent Beroulle, Athanasios Papadimitriou, David Hély, Gilles Grenevrier, et al.. Comparison of RTL Fault Models for the Robustness Evaluation of Aerospace FPGA devices. 22nd IEEE international Symposium on On-Line Testing and Robust System Design (IOLTS 2016), Jul 2016, San Feliu de Guiwols, Spain. <hal-01391000>
  • Arash Nejat, David Hely, Vincent Beroulle. Reusing logic masking to facilitate path-delay-based hardware Trojan detection. 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), Jul 2016, Sant Felliu, Spain. <10.1109/IOLTS.2016.7604696>. <hal-01412412>
  • Athanasios Papadimitriou, Marios Tampas, David Hély, Vincent Beroulle, Paolo Maistri, et al.. Validation of RTL laser fault injection model with respect to layout information. Hardware Oriented Security and Trust (HOST 2016), May 2015, Washington,, United States. <10.1109/HST.2015.7140241>. <hal-01392792>
  • Arash Nejat, David Hely, Vincent Beroulle. Facilitating side channel analysis by obfuscation for Hardware Trojan detection. IEEE Design & Test Symposium (IDT 2015), Dec 2015, Dead sea, Jordan. <10.1109/IDT.2015.7396749>. <hal-01391014>
  • Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, et al.. Laser-Induced Fault Effects in Security-Dedicated Circuits. Luc Claesen; Maria-Teresa Sanz-Pascual; Ricardo Reis; Arturo Sarmiento-Reyes. VLSI-SoC: Very Large Scale Integration - System on a Chip, Oct 2014, Playa del Carmen, Mexico. 22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration - System on a Chip, AICT-464, pp.220-240, 2015, IFIP Advances in Information and Communication Technology. <10.1007/978-3-319-25279-7_12>. <hal-01383737>
  • Omar Abdelmalek, David Hely, Vincent Beroulle. Emulation Based Fault Injection on UHF RFID Transponder. 17th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Varsaw, Poland. pp.1-4, 2014. <hal-01010294>
  • P. Vanhauwaert, P. Maistri, R. Leveugle, Athanasios Papadimitriou, David Hely, et al.. On error models for RTL security evaluations. 9th Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) 2014, May 2014, Santorini, Greece. pp.1-6, 2014. <hal-01010314>
  • Omar Abdelmalek, David Hely, Vincent Beroulle. Fault Tolerance Evaluation of RFID Tags. 15th IEEE Latin America Test Workshop, Mar 2014, Fortaleza, Brazil. pp.1-6, 2014. <hal-00958582>
  • Athanasios Papadimitriou, David Hely, Vincent Beroulle, P. Maistri, R. Leveugle. A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks. Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, Mar 2014, Germany. pp.1-4, 2014, <10.7873/DATE2014.219>. <hal-00981848>
  • Noémie Boher, Kamil Gomina, David Hely, Vincent Beroulle, Jean-Baptiste Rigaud, et al.. Voltage Glitch Attacks on Mixed Signal Systems. 17th Euromicro Conference on Digital Systems Design, Aug 2014, Verone, Italy. pp.1-6, 2014. <hal-01063664>
  • Regis Leveugle, Paolo Maistri, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, et al.. Laser-induced Fault Effects in Security-dedicated Circuits. International Conference on Very Large Scale Integration (VLSI-SoC), Oct 2014, Mexico, Mexico. <emse-01099022>
  • Noémie Boher, David Hely, Vincent Beroulle, Joël Damiens, Philippe Candelier. Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology.. Quality Electronic Design (ISQED), 2013 14th International Symposium on, Mar 2013, United States. pp.531-537, 2013, <10.1109/ISQED.2013.6523662>. <hal-00861556>
  • David Hely, Vincent Beroulle, Abdelmalek Omar. Triggering Hardware Trojans in EPC C1G2 RFID Tags. Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, TRUDEVICE 2013, May 2013, Avignon, France. <hal-00958199>
  • Omar Abdelmalek, David Hely, Vincent Beroulle. An UHF RFID Emulation Platform with Fault Injection and real time Monitoring capabilities. 8th IEEE International Design & Test Symposium 2013, Dec 2013, Marrakesh, Morocco. pp.1-2, 2013, <10.1109/IDT.2013.6727143>. <hal-00933386>
  • Noémie Boher, David Hely, Vincent Beroulle, Kamil Gomina, Joël Damiens, et al.. Evaluating and Enhancing the Security of Analog and Mixed IPs in Complex System On Chip. Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, TRUDEVICE 2013, May 2013, Avignon, France. <hal-01010298>
  • Omar Abdelmalek, David Hely, Vincent Beroulle. EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement. Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2013 8th International Conference on, Mar 2013, Marrakesh, Morocco. pp.20-24, 2013, <10.1109/DTIS.2013.6527771>. <hal-00950128>
  • Ibrahim Mezzah, Omar Kermia, Hamimi Chemali, Omar Abdelmalek, David Hely, et al.. Assertion based on-line fault detection applied on UHF RFID tag. 8th IEEE International Design & Test Symposium 2013, Dec 2013, Marrakesh, Morocco. pp.1-5, 2013, <10.1109/IDT.2013.6727091>. <hal-00950130>
  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hély. Evaluation of a new RFID system performance monitoring approach. Design Automation & Test in Europe, 2012, Dresden, Germany. <hal-01105361>
  • Minh Duc Nguyen, Gilles Fritz, Oum-El-Kheir Aktouf, Vincent Beroulle, David Hély. Towards middleware-based fault-tolerance in RFID systems. 13th European Workshop on Dependable Computing (EWDC 2011), May 2011, Pise, Italy. pp.49-52, 2011. <hal-00593732>
  • David Hely, Vincent Beroulle, Feng Lu, Jose Ramon Garcia Oya. Towards an unified IP verification and robustness analysis platform. 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011, Apr 2011, France. 2011. <hal-00593524>
  • Gilles Fritz, Boutheina Maaloul, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hely. Read rate profile monitoring for defect detection in RFID Systems. IEEE International Conference on RFID-Technologies and Applications (RFID-TA 2011), Sep 2011, Sitges (Barcelona), Spain. pp. 89-94, 2011, 978-1-4577-0026-2. <hal-00628783>
  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hely. SystemC Modeling of RFID Systems for Robustness Analysis. 19th International Conference on Software, Telecommunications and Computer Networks IEEE SoftCOM, Sep 2011, Hvar (Split), Croatia. CFP1187A-CDR, pp.ISBN : 978-953-290-027-9, 2011. <hal-00628789>
  • Minh Duc Nguyen, Gilles Fritz, Oum-El-Kheir Aktouf, Vincent Beroulle, David Hely. Towards middleware-based fault-tolerance in RFID systems. 13th European Workshop on Dependable Computing, EWDC 2011, May 2011, Pise, Italy. pp.5, 2011. <hal-00580368>
  • Gilles Fritz, Vincent Beroulle, Nguyen Minh Duc, Oum-El-Kheir Aktouf, Ioannis Parissis. Read-Error-Rate evaluation for RFID system on-line testing. 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), Jun 2010, La Grande Motte, France. pp.1, 2010. <hal-00491923>
  • Laurent Latorre, Vincent Beroulle, Pascal Nouet. Design & Simulation of a CMOS MEMS Using Standard Microelectronic CAD Environment. NANOTECH'03: Nanotechnology Conference and Trade Show, San Francisco, CA (USA), pp. 472-475, 2003. <lirmm-00269546>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal Conditioning. MEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259, 2002. <lirmm-00268486>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field Sensing. SoC Design Methodologies - International Conference on Very Large Scale Integration of Systems-on-Chip, Montpellier, France, Kluwer Academic Publishers, pp.461-472, 2002. <lirmm-00268487>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal Systems. DATE'02: Design Automation and Test in Europe, Paris, France, pp.1120, 2002. <lirmm-00268488>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Conception et Test d'une Micro-Boussole Electromécanique Intégrée. Colloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100, 2002. <lirmm-00269324>
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Software-Based Testing of Sequential VHDL Descriptions. ETW'03: IEEE European Test Workshop, Maastricht (The Netherlands), France. pp. 199-200, 2003. <lirmm-00269528>
  • M. Dardalhon, M.O. Dzeukou, Vincent Beroulle, Laurent Latorre, Pascal Nouet, et al.. Impact of Environmental Parameters on CMOS MEMS Structures. CANEUS'02, Montreal (Canada), France. pp.P nd., 2002. <lirmm-00269356>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test Methodology. LATW'02: 3rd IEEE Latin American Test Workshop, Montevideo (Uruguay), France. pp. 99-104, 2002. <lirmm-00269323>
  • Laurent Latorre, Vincent Beroulle, Yves Bertrand, Guy Cathébras, Pascal Nouet. On the Use of CMOS 0n-Chip Mechanical Devices for Spectral Analysis. EUROSENSORS'02: 16th European Conference on Solid-State Transducers, Prague, Czech Republic, pp.191-192, 2002. <lirmm-00268509>
  • Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems. VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444, 2002. <lirmm-00268484>
  • Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach. A Design-for-Test Implementation of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and Application. The 2nd ACM/IEEE International Symposium on Networks-on-Chip, Apr 2008, Newcastle, United Kingdom. pp. 149-158, 2008. <hal-00331239>
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. How to Implement an Asynchronous Test Wrapper for Network-on-Chip Nodes. The 12th IEEE European Test Symposium (ETS 2007), May 2007, Freiburg, Germany. pp.Tran07HTI, 2007. <hal-00166373>
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Qualification of Behavioral Level Design Validation for AMS&RF SoCs. VLSI SOC'07, Oct 2007, Atlanta, United States. pp.100 - 106, 2007. <hal-00250426>
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Choice of a high level fault model for the Optimization of Validation Test Set reused for Manufacturing Test. IMSTW'07, Jun 2007, Porto, Portugal. 2008, pp.66 - 71, 2007, <10.1155>. <hal-00250422>
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Using of Behavioral level AMS & RF Simulation for Validation Test Set Optimization. WTW'07, May 2007, Berkeley, United States. pp.62-67, 2007. <hal-00250420>
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Génération de vecteurs de test pour les systèmes analogiques mixtes et RF. Ecole d'hiver Francophone sur les Technologies de Conception des systèmes embarqués Hétérogènes (FETCH 2007), Jan 2007, Villard-de-Lans, France. pp.1, 2007. <hal-00250410>
  • Xuan-Tu Tran, Jean Durupt, Yvain Thonnard, François Bertrand, Chantal Robach, et al.. Implementation of a Design-for-Test Architecture for Asynchronous Networks-on-Chip. The 1st ACM/IEEE International Symposium on Networks-on-Chip (NOCS 2007), May 2007, Princeton, New Jersey, United States. pp.100, 2007. <hal-00187291>
  • Rami Khouri, Yvan Duroc, Vincent Beroulle, Smail Tedjini, O.F. Oliveira Gomes. VHDL-AMS modeling of an UWB link radio including antennas. IEEE International Conference on Electronics, Circuits and Systems (ICECS2007), Dec 2007, Morocco. pp. 570-573, 2007. <hal-00377834>
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. Functional Verification of RTL Designs driven by Mutation Testing metrics. 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 2007. DSD 2007., Aug 2007, Lubeck, Germany. pp.222-227, 2007, 978-0-7695-2978-3. <10.1109/DSD.2007.4341472>. <hal-00254470>
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. Impact of Hardware Emulation on the verification quality improvement. Very Large Scale Integration, 2007. VLSI - SoC 2007. IFIP International Conference on, Oct 2007, Atlanta, United States. pp.218-223, ISBN: 978-1-4244-1710-0, 2007. <hal-00218169>
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. A DfT Architecture for Asynchronous Networks-on-Chip. The 11th IEEE European Test Symposium, May 2006, Southampton, United Kingdom. IEEE Computer Society, pp.219-224, 2006, <10.1109/ETS.2006.3>. <hal-00142999>
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. IP Validation using Genetic Algorithms guided by Mutation Testing. Conference on Design of Circuit and Integrated Systems, Nov 2006, Barcelone, Spain. pp.CD, 2006, 978-84-690-4144-4. <hal-00254467>
  • Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonero. Qualification et génération de vecteurs pour la validation et le test de production de systèmes analogiques, mixtes et RF. GdR SoC-SiP, 2006, ¨Paris, France. pp.1, 2006. <hal-00250407>
  • Yves Joannon, Vincent Beroulle, Rami Khouri, Smail Tedjini, Chantal Robach, et al.. Modélisation comportementale d'un émetteur récepteur W-CDMA en VHDL-AMS. JNRDM'06, May 2006, Rennes, France. pp.1, 2006. <hal-00250399>
  • Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, et al.. Behavioral modeling of W-CDMA transceiver with VHDL-AMS language. DDECS'06, Apr 2006, Prague, Czech Republic. pp.113 - 118, 2006. <hal-00250397>
  • Youssef Serrestou, Chantal Robach, Vincent Beroulle. How to Improve a set of design validation data by using mutation-based test. 2006 IEEE Design and Diagnostics of Electronic Circuits and systems, Apr 2006, Prague, Czech Republic. pp.75-76, 2006, 1-4244-0184-4. <hal-00254378>
  • Xuan Tu Tran, Vincent Beroulle, Jean Durupt, Chantal Robach, François Bertrand. Design-for-Test of Asynchronous Networks-on-Chip. IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, Czech Republic. pp. 163-167, 2006. <hal-00218149>
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Mutation sampling technique for the generation of structural test data. 6th IEEE Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. 2005. <hal-00378490>
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Mutation Sampling Technique for the Generation of Structural Test Data. DATE: Design, Automation and Test in Europe, 2005, Munich, Germany. IEEE, pp.1022, 2005. <lirmm-00105978>
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Mutation Sampling Technique for the Generation of Structural Test Data. EDAA - European design and Automation Association. DATE: Design, Automation and Test in Europe, Mar 2005, Munich, Germany. 2, pp.1022-1023, 2005. <hal-00181680>
  • Luigi Dilillo, Vincent Beroulle, Norbert Dumas, Laurent Latorre, Pascal Nouet. An A/D Interface for Resonant Piezoresistive MEMS Sensor. ISIE'04: IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio (France), IEEE, pp.83-88, 2004. <lirmm-00108896>
  • Rami Khouri, Vincent Beroulle, Tan Phu Vuong, Smail Tedjini. Wireless System Validation using VHDL-AMS Behavioral Antenna Models : Radio-Frequency Identification case study. European Conference on Wireless Technology 2004, Amsterdam, Oct 2004, Amsterdam, France. pp.185-188, 2004. <hal-00259990>
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Software-Based Testing of Sequential VHDL Descriptions. ETW'03: IEEE European Test Workshop, Maastricht, Netherlands. pp.199-200, 2003. <lirmm-00269437>
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre. Software-Based Testing of Sequential VHDL Descriptions. ETW'03: IEEE European Test Workshop, Maastricht, Netherlands. pp. 199-200, 2003. <lirmm-00191917>
  • Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes. Software-based testing of sequential vhdl descriptions. IEEE European Test Workshop, May 2003, Maastrich, France. pp.199-200, 2003. <hal-00193680>
  • Rami Khouri, Vincent Beroulle, Tan-Phu Vuong, Smail Tedjini. Optimisation de la télé-alimentation des systèmes RFID UHF grâce à la modélisation comportementale du lien RF. 6ème journées d'études Faible Tension Faible Consommation, May 2003, Paris, France. 2003. <hal-00378617>
  • Vincent Beroulle, Laurent Latorre, M. Dardalhon, C. Oudea, G. Perez, et al.. Impact of Technology Spreading on MEMS Design Robustness. SoC Design Methodologies - International Conference on Very Large Scale Integration of Systems-on-Chip, Dec 2001, Montpellier, France. Kluwer Academic Publishers, PIFIP TC10 / WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on-Chip (VLSI-SOC’01) December 3–5, 2001, Montpellier, France, pp.241-251, 2002, <10.1007/978-0-387-35597-9_21>. <lirmm-00268485>

Autre publication5 documents

  • Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, Minh Duc Nguyen. Sûreté de fonctionnement des systèmes RFID – Evaluation et simulation des dysfonctionnements. Journées Nationales du Réseau Doctoral en Microélectronique. 2010. <hal-00509521>
  • Yvan Duroc, Tan-Phu Vuong, Rami Khouri, Vincent Beroulle, Smail Tedjini. Modélisation des antennes ULB et co-design. Séminaire à l'Ecole d'automne ULB, GdR Ondes. 2006. <hal-00377836>
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. Conception en vue de Test pour l'Architecture d'un Réseau sur Puce Asynchrone. Journées Nationales du Réseau Doctoral en Microélectronique. 2006. <hal-00381555>
  • Youssef Serrestou, Vincent Beroulle, Chantal Robach. Amélioration des Jeux de Test pour la Validation de Conception. Journées Nationales du Réseau Doctoral en Microélectronique. 2006. <hal-00381553>
  • Xuan Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach. Conception en vue du test pour l'architecture d'un réseau sur puce asynchrone. Journées Nationales du Réseau Doctoral en Microélectronique. 2006. <hal-00218157>