CV Accueil - Archive ouverte HAL

Publications

	A generic deep-learning based defect segmentation model for electron micrographs for automatic defect inspection Julien Baderot , Ali Hallal , Martin Jacob , Vincent Barra , Arnaud Guillin SPIE Advanced Lithography, Feb 2023, San José, California, United States Communication dans un congrès hal-03904731v1
	ML-Enhanced Generalized Langevin Equation for Transient Anomalous Diffusion in Polymer Dynamics Gian-Michele Cherchi , Alain Dequidt , Patrice Hauret , Arnaud Guillin , Vincent Barra NeurIPS 2023 Workshop: Machine Learning and the Physical Sciences, Dec 2023, NewOrleans, United States Communication dans un congrès hal-04274138v1