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Comportement dynamique de microscopie Kelvin en mode AM sous ultravide

 H. Diesinger , D. Deresmes , J.P. Nys , Thierry Melin
Forum des Microscopies à Sonde Locale, 2009, Hardelot, France
Communication dans un congrès hal-00575395v1

Hydrogen passivation and local electron-beam reactivation of silicon dopants in GaAs characterized by differential conductance and STM spectroscopy measurements

 Thierry Melin , S. Silvestre , J.P. Nys , B. Grandidier , D. Bernard-Loridant , et al.
11th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM 2001, 2001, Vancouver, Canada
Communication dans un congrès hal-00152579v1

Assemblage de nano-objets par diélectrophorèse

 H. Diesinger , M. Marczak , D. Luxembourg , Yannick Coffinier , D. Hourlier , et al.
Journées du GDR Nanofils Nanotubes Semiconducteurs, 2006, Villeneuve d'Ascq, France
Communication dans un congrès hal-00243975v1

Comportement d'un dérivé de l'azobenzène sur Au(111) exposé à la lumière ultraviolette

 Hugo Therssen , S. Godey , David Guérin , Thierry Melin , Stéphane Lenfant
Journées du GDR Nanosciences with near-field microscopy under ultra high vacuum 2021, Nov 2021, Toulouse, France
Communication dans un congrès hal-03606169v1

Kelvin probe force microscopy of charge transfer mechanisms from doped silicon nanocrystals

 Lukasz Borowik , Koku Kusiaku , D. Deresmes , Didier Theron , Heinrich Diesinger , et al.
Materials Research Society Fall Meeting, MRS Fall 2009, Symposium OO : Dynamic Scanning Probes - Imaging, Characterization, and Manipulation, Nov 2009, Boston, MA, United States
Communication dans un congrès hal-00575344v1

High-Resolution Kelvin Probe Force Microscopy Imaging of Interface Dipoles and Photogenerated Charges in Organic Donor–Acceptor Photovoltaic Blends

 Franz Fuchs , Florent Caffy , Renaud Demadrille , Thierry Melin , Benjamin Grevin
ACS Nano, 2016, 10 (1), pp.739-746. ⟨10.1021/acsnano.5b05810⟩
Article dans une revue hal-02196250v1
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Electron emission device made from planar nanowires

 Thomas Lerond , Yevheniia Chernukha , Maxime Berthe , Francois Vaurette , D. Deresmes , et al.
Journées du GDR Nanosciences with near-field microscopy under ultra high vacuum 2022, Nov 2022, Paris, France
Communication dans un congrès hal-03955837v1

Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin force microscopy

 David Brunel , D. Deresmes , Thierry Melin
Applied Physics Letters, 2009, 94, pp.223508-1-3. ⟨10.1063/1.3148364⟩
Article dans une revue hal-00473086v1
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A Comparative Investigation of Plasmonic Properties between Tunable Nanoobjects and Metallized Nanoprobes for Optical Spectroscopy

 Damien Eschimese , Patrick Hsia , Francois Vaurette , D. Deresmes , De Philippe Bettignies , et al.
Journal of Physical Chemistry C, 2019, 123 (46), pp.28392-28400. ⟨10.1021/acs.jpcc.9b09977⟩
Article dans une revue hal-02349635v1
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Spectroscopic characterization of lithographic metal nanostructures for tip-enhanced spectroscopic methods

 Damien Eschimese , Thomas Lerond , S. Arscott , Gaëtan Lévêque , Thierry Melin , et al.
8th Waves Conference, Oct 2019, Gif-sur-Yvette, France
Communication dans un congrès hal-03094832v1

Nanoflexitouch - Programme P2N edition 2012

 Nicolas Decorde , Neralagatta Sangeetha , Benoit Viallet , Jérémie Grisolia , G. Viau , et al.
Journées Nationales en Nanosciences et Nanotechnologies, J3N 2013, Nov 2013, Marseille, France
Communication dans un congrès hal-00940920v1

Doped semiconductor nanocrystal junctions studied by Kelvin probe and non-contact atomic force microscopy

 Lukasz Borowik , Thuat Nguyen-Tran , D. Deresmes , Heinrich Diesinger , Pere Roca I Cabarrocas , et al.
Materials Research Society Fall Meeting, MRS Fall 2013, Symposium LL : Advances in Scanning Probe Microscopy, 2013, Boston, MA, United States
Communication dans un congrès hal-00944018v1

Modification of Molecular Assemblies of Azobenzene Derivatives by Electrical Stimuli

 S. Godey , Hugo Therssen , David Guérin , Yannick Dappe , Thierry Melin , et al.
MRS Fall Meeting, Materials Research Society, Nov 2022, Boston (MA), United States
Communication dans un congrès hal-04086664v1

Un modèle analytique et quantitatif pour la microscopie à force électrique de nanoparticules chargées sur substrats conducteurs

 Thierry Melin , H. Diesinger , D. Deresmes , D. Stievenard
Forum des microscopies à sonde locale, 2003, Montpellier, France
Communication dans un congrès hal-00146642v1
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Localization and delocalization of charges injected in DNA

 Thomas Heim , Thierry Melin , D. Deresmes , Dominique Vuillaume
2004
Pré-publication, Document de travail hal-00002773v1

Charge injection and electrostatics of tailored graphene sheets and ribbons probed by Electric Force Microscope

 A. Mahmood , J.F. Dayen , D. Tondelier , Thierry Melin , D. Vuillaume , et al.
International Centre for Theoretical Physics Conference, Graphene Week 2008, 2008, Trieste, Italy
Communication dans un congrès hal-00376233v1

Raman spectroscopy of boron-doped silicon nanowires

 M. Marczak , E. Pichonat , W. Gebicki , Thierry Melin , D. Hourlier
European Materials Research Society Fall Meeting, E-MRS Fall 2008, Symposium J : New Opportunities and Challenges in Material Research using Phonon and Vibrational Spectra, 2008, Warsaw, Poland
Communication dans un congrès hal-00376240v1
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Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments

 Sophie Barbet , Thierry Melin , Heinrich Diesinger , D. Deresmes , Didier Stiévenard
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.045318. ⟨10.1103/PhysRevB.73.045318⟩
Article dans une revue hal-00127820v1
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Conductance switching at the nanoscale of diarylethene derivative self-assembled monolayers on La0.7Sr0.3MnO3

 Louis Thomas , David Guérin , Benoît Quinard , Eric Jacquet , Richard Mattana , et al.
Nanoscale, 2020, 12 (15), pp.8268-8276. ⟨10.1039/C9NR09928J⟩
Article dans une revue hal-02798245v1

Electrostatic properties of doped silicon nanocrystals probed by Kelvin force microscopy

 Lukasz Borowik , Koku Kusiaku , Didier Theron , Heinrich Diesinger , D. Deresmes , et al.
Forum des Microscopies à Sonde Locale, Mar 2009, Neufchâtel, France
Communication dans un congrès hal-00575340v1
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Calculating Kelvin force microscopy signals from static force fields

 Lukasz Borowik , Koku Kusiaku , Didier Theron , Thierry Melin
Applied Physics Letters, 2010, 96, pp.103119-1-3. ⟨10.1063/1.3323098⟩
Article dans une revue hal-00549047v1

Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy

 Thierry Melin , Sophie Barbet , Heinrich Diesinger , Didier Theron , D. Deresmes
Review of Scientific Instruments, 2011, 82, pp.036101-1-3. ⟨10.1063/1.3516046⟩
Article dans une revue hal-00579085v1

Kelvin force microscopy on GaN material and devices

 Sophie Barbet , Raphaël Aubry , D. Deresmes , Marie-Antoinette Di Forte-Poisson , F. Romero , et al.
16th European Workshop on Heterostructure Technology, HeTech'07, 2007, Fréjus, France
Communication dans un congrès hal-00285314v1

Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : an analytical model for quantitative charge imaging

 Thierry Melin , H. Diesinger , D. Deresmes , D. Stievenard
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2004, 69, pp.035321/1-8
Article dans une revue hal-00141248v1

Scanning tunneling microscopy based lithography in UHV

 J.P. Nys , Thierry Melin , B. Grandidier , D. Stievenard
5th MEL-ARI/NID Workshop, 2000, Pise, Italy
Communication dans un congrès hal-00158944v1

Etude de l'influence de la pointe sur les mesures KFM sur échantillon d'AlGaAs/GaAs

 Sylvain Pouch , Nicolas Chevalier , Denis Mariolle , François Triozon , Thierry Melin , et al.
17ème Forum des Microscopies à Sonde Locale, 2014, Montauban, France. session 11, papier P-30, 175-176
Communication dans un congrès hal-00974535v1

Electric force microscopy of individually charged semiconductor nanoparticles

 Thierry Melin , H. Diesinger , D. Deresmes , D. Stievenard
Materials Research Society Fall Meeting, 2003, Boston, MA, United States
Communication dans un congrès hal-00146615v1

KFM analysis of GaN surfaces

 Sophie Barbet , Raphaël Aubry , Marie-Antoinette Di Forte-Poisson , Thierry Melin , Didier Theron
15th European Workshop on Heterostructure Technology, HeTech'06, Oct 2006, Manchester, United Kingdom
Communication dans un congrès hal-00127894v1

Mesure du potentiel de surface d'un matériau

 Thierry Melin , Didier Theron , Sophie Barbet , D. Deresmes , Heinrich Diesinger
France, N° de brevet: FR2956484 (A1). 2011
Brevet hal-00616299v1

Electrostatic properties of carbon nanotubes and CNT-based devices using scanning force techniques

 Thierry Melin
Indo-French Workshop on Multifunctional Molecular and Hybride Devices, 2008, Saclay, France
Communication dans un congrès hal-00361977v1
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