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Sylvie Schamm-Chardon


712643   

Journal articles1 document

  • Anna Maria Beltrán, Sébastien Duguay, Christian Strenger, Anton J Bauer, Fuccio Cristiano, et al.. Atomic scale characterization of SiO2/4H-SiC interfaces in MOSFETs devices. Solid State Communications, Elsevier, 2015, 221, pp.28-32. ⟨10.1016/j.ssc.2015.08.017⟩. ⟨hal-01720451⟩