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1

Sylvie Schamm-Chardon


712642   

Journal articles1 document

  • Anna Maria Beltrán, Sylvie Schamm-Chardon, Vincent Mortet, Matthieu Lefebvre, Eléna Bedel-Pereira, et al.. Nano-Analytical and Electrical Characterization of 4H-SiC MOSFETs. Materials Science Forum, Trans Tech Publications Inc., 2012, 711, pp.134-138. ⟨10.4028/www.scientific.net/MSF.711.134⟩. ⟨hal-01745014⟩