Sylvain Bourdel
Pr Sylvain BOURDEL, Grenoble-INP
10
Documents
Affiliations actuelles
- 1043043
- 1043329
- 1042703
Identifiants chercheurs
- sylvainbourdel
- 0000-0001-9930-9945
Présentation
**Sylvain Bourdel** received the Ph. D in microelectronics from the National Institute of Applied Science (INSA) of Toulouse in 2000. He was with the LAAS laboratory of Toulouse where he was involved on radiofrequency systems modelling and he was particularly focused on spread spectrum techniques applied to 2.45GHz transceivers. In 2002 he joined the IM2NP in Marseille where he headed with Pr H. Barthélemy the Integrated Circuit Design Team of the IM2NP. He joined in 2013 the IMEP-LaHC laboratory and Grenoble-INP as a full Professor. He currently leads the RFIC-Lab laboratory of Grenoble, France. He works on RF and MMW IC design and integration. He particularly focuses on low cost and low power applications. His area of interest also includes system level specifications, UWB and RFID. He is the author and co-author of more than 100 referenced IEEE publications.
Publications
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Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case StudyIEEE Transactions on Microwave Theory and Techniques, 2023, pp.1-19. ⟨10.1109/TMTT.2023.3322750⟩
Article dans une revue
hal-04253273v1
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A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated CircuitsIEEE Transactions on Microwave Theory and Techniques, 2020, pp.1-1. ⟨10.1109/TMTT.2020.2991412⟩
Article dans une revue
hal-02899927v1
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N-Path Mixer with Wide Rejection Including the 7 th Harmonic for Low Power Multi-standard Receivers20th IEEE Interregional NEWCAS Conference (NEWCAS 2022), IEEE, Jun 2022, Quebec City, Canada. pp.256-260, ⟨10.1109/NEWCAS52662.2022.9901392⟩
Communication dans un congrès
hal-03852364v1
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Feature selection techniques for indirect test and statistical calibration of mm-wave integrated circuits27th European Test Symposium (ETS 2022), May 2022, Barcelona, Spain
Communication dans un congrès
hal-03759492v1
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On the use of causal feature selection in the context of machine-learning indirect test2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2019, Florence, France. pp.276-279
Communication dans un congrès
hal-02231655v1
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Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical CalibrationIEEE International Symposium on Circuits and Systems (ISCAS 2019), May 2019, Sapporo, Japan. pp.1-5
Communication dans un congrès
hal-02128847v1
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On the use of causal feature selection in the context of machine-learning indirect testDesign, Automation & Test in Europe Conference & Exhibition (DATE 2019), Mar 2019, Florence, Italy. pp.276-279
Communication dans un congrès
hal-02137068v1
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Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuitsInternational Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20, ⟨10.1109/SMACD.2019.8795238⟩
Communication dans un congrès
hal-02166246v1
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Assisted test generation strategy for non-intrusive machine learning indirect test of millimeter-wave circuits23rd IEEE European Test Symposium (ETS'2018), May 2018, Bremen, Germany. pp.1-6, ⟨10.1109/ETS.2018.8400689⟩
Communication dans un congrès
hal-01922313v1
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Conception en vue du test d’un amplificateur de puissance à 60 GHzJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'17), Nov 2017, Strasbourg, France
Communication dans un congrès
hal-01649564v1
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