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Sylvain Tricot
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Documents
Identifiants chercheurs
- sylvain-tricot
- 0000-0002-8863-2162
- IdRef : 132073986
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Ballistic Electron Emission Microscopy (BEEM): Local probe of electronic properties at buried interfacesInternational Conference on Nanoscience and Technology (ICN+T 2012), Jul 2012, Paris, France
Communication dans un congrès
hal-00935580v1
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