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	Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductor hybrid heterostructures Alexandra Junay , Sophie Guézo , Francine Solal , Soraya Ababou-Girard , Pascal Turban International Conference on Nanoscience and Technology (ICN+T 2013), Sep 2013, Paris, France Communication dans un congrès hal-00881462v1
	Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductor hybrid heterostructures Alexandra Junay , Sophie Guézo , Francine Solal , Soraya Ababou-Girard , Pascal Turban Journées Nanosciences et Nanotechnologies du Nord Ouest, Nov 2013, Rennes, France Communication dans un congrès hal-01126579v1

Sylvain Tricot