- 1
- 1
ST
Sylvain Tricot
2
Documents
Identifiants chercheurs
- sylvain-tricot
- 0000-0002-8863-2162
- IdRef : 132073986
Présentation
Publications
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductor hybrid heterostructuresJournées Nanosciences et Nanotechnologies du Nord Ouest, Nov 2013, Rennes, France
Communication dans un congrès
hal-01126579v1
|
|
Using BEEM (Ballistic Electron Emission Microscopy) to probe buried interfaces in metal-organic monolayer-semiconductor hybrid heterostructuresInternational Conference on Nanoscience and Technology (ICN+T 2013), Sep 2013, Paris, France
Communication dans un congrès
hal-00881462v1
|